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Because of the complexity of relationship between surface tension and its decisive factors, such as temperature, concentration, electronic density, molar atomic volume and electro-negativity, a reasonable predicting model of surface tension of Sn-based solder alloys has not been developed yet. The paper aims to address the surface tension issue that has to be considered if the new lead free solder will be applied for electronics.

Using an artificial neural network (ANN) model with back-propagation (BP) algorithm, the surface tension for Sn-based binary solder alloys was simulated, and the comparison between the simulating results and data from experiments and literatures was analyzed as well. In addition, the relationship between surface tension and its decisive factors would be discussed based on the ANN and orthogonal design methods.

It is shown that the predicting model of surface tension of Sn-based solder alloys is constructed according to the BP–ANN theory, and the predicted value from the BP–ANN is in excellent agreement with the experimental results. The surface tension of Sn-based solders is determined by five factors, i.e. temperature, concentration, electronic density, molar atomic volume and electro-negativity. Among of the factors, molar atomic volume is major factor, and the order of degree of influence on surface tension is molar atomic volume > electro-negativity > electronic > density > concentration > temperature. Moreover, a simply reasonable equation is proposed to estimate the surface tension for Sn-based solders.

The five decisive factors of surface tension for Sn-based binary solder alloys have been analyzed theoretically, and a reasonable model of surface tension for Sn-based binary solder alloys is proposed as well. It is shown that ANN theory will be applied well to simulate the surface tension of Sn-based lead free solder.

This paper aims to derive a model of growth kinetics of the intermetallic compound (IMC) layer formed in the reaction between liquid Sn-based solders and Ni particle reinforcements and to compare with the experimental data to verify the effects of Sn concentration and alloying element.

A composite solder was manufactured by mechanically introducing Ni particle reinforcements into a solder matrix. The effect of the non-reactive alloying elements, Ag, Pb and Bi, on the growth kinetics of the IMC formed between liquid Sn-based eutectic solders and Ni particles, reacting this composite solder at 250°C–280°C was studied.

Experimental results showed that only the IMC Ni₃Sn₄ was present as a reaction product. Using the diffusion-controlled reaction mechanism, a kinetic equation quantifying both Sn concentration and alloying element effects was derived and verified by comparing the kinetic data obtained using four different solders with different concentrations of Sn and the alloying elements.

The similarity between the activation energies of these four solders confirms that the diffusion of Sn atoms through the IMC is the rate-controlling step. Besides, the kinetic values are independent of the geometry of Ni, whether spherical particle or flat substrate.

The purpose of this study is to delve into the mechanism of Si3N4 nanowires (NWs) in Sn-based solder, thereby furnishing a theoretical foundation for the expeditious design and practical implementation of innovative lead-free solder materials in the electronic packaging industry.

This study investigates the effect of adding Si₃N₄ NWs to Sn58Bi solder in various mass fractions (0, 0.1, 0.2, 0.4, 0.6 and 0.8 Wt.%) for modifying the solder and joining the Cu substrate. Meanwhile, the melting characteristics and wettability of solder, as well as the microstructure, interfacial intermetallic compound (IMC) and mechanical properties of joint were evaluated.

The crystal plane spacing and lattice constant of Sn and Bi phase increase slightly. A minor variation in the Sn58Bi solder melting point was caused, while it does not impact its functionality. An appropriate Si₃N₄ NWs content (0.2∼0.4 Wt.%) significantly improves its wettability, and modifies the microstructure and interfacial IMC layer. The shear strength increases by up to 10.74% when adding 0.4 Wt.% Si₃N₄ NWs, and the failure mode observed is brittle fracture mainly. However, excessive Si₃N₄ will cause aggregation at the junction between the solder matrix and IMC layer, this will be detrimental to the joint.

The Si₃N₄ NWs were first used for the modification of lead-free solder materials. The relative properties of composite solder and joints were evaluated from different aspects, and the optimal ratio was obtained.

Viscosity is an important basic physical property of liquid solders. However, because of the very complex nonlinear relationship between the viscosity of the liquid ternary Sn-based lead-free solder and its determinants, a theoretical model for the viscosity of the liquid Sn-based solder alloy has not been proposed. This paper aims to address the viscosity issues that must be considered when developing new lead-free solders.

A BP neural network model was established to predict the viscosity of the liquid alloy and the predicted values were compared with the corresponding experimental data in the literature data. At the same time, the BP neural network model is compared with the existing theoretical model. In addition, a mathematical model for estimating the melt viscosity of ternary tin-based lead-free solders was constructed using a polynomial fitting method.

A reasonable BP neural network model was established to predict the melt viscosity of ternary tin-based lead-free solders. The viscosity prediction of the BP neural network agrees well with the experimental results. Compared to the Seetharaman and the Moelwyn–Hughes models, the BP neural network model can predict the viscosity of liquid alloys without the need to calculate the relevant thermodynamic parameters. In addition, a simple equation for estimating the melt viscosity of a ternary tin-based lead-free solder has been proposed.

The study identified nine factors that affect the melt viscosity of ternary tin-based lead-free solders and used these factors as input parameters for BP neural network models. The BP neural network model is more convenient because it does not require the calculation of relevant thermodynamic parameters. In addition, a mathematical model for estimating the viscosity of a ternary Sn-based lead-free solder alloy has been proposed. The overall research shows that the BP neural network model can be well applied to the theoretical study of the viscosity of liquid solder alloys. Using a constructed BP neural network to predict the viscosity of a lead-free solder melt helps to study the liquid physical properties of lead-free solders that are widely used in electronic information.

The purpose of this paper is to enhance the understanding on the electrodeposition of various lead (Pb)‐free solder alloys, so that new studies can be carried out to solve processing issues.

The paper reviews the available reports on the electrodeposition of tin (Sn)‐based solder systems and identifies the challenges in this area.

Compositional control remains a major challenge in this area, where the achievement of desired composition for binary and ternary alloys is subjected to uncertainties. The use of chelating agents in the bath and optimization of parameters can assist the achievement of near‐desired alloy composition. Acidic plating baths are preferred due to their compatibility with photoresists but oxidation of stannous ions causes poor bath stability. Antioxidants, reducing agents and low oxygen overpotential anodes can suppress the oxidation rate and increase the lifespan of plating baths. Apart from chelating agents and antioxidants, various categories of additives can be added to improve quality of deposits. Surfactants, grain refiners and brighteners are routinely used to obtain smooth, fine‐grained and bright deposits with good thermo‐mechanical properties.

The paper provides information on the key issues in electrodeposition of Pb‐free solder alloys. Possible measures to alleviate the issues are suggested so that the electrodeposition technique can be established for mass production of a wider range of solder alloys.

As in real applications several alternating current (AC) currents may be injected to the electronic devices, this study aims to analyze their effects on the lifetime of the solder joints and, consequently, shed the light on these effects at the design phase for other researchers to consider.

In this paper, the authors investigated on current waveform shapes on the performance and reliability of the solder joints in electronic package. Three common and extensively used current shapes in several simulations and experiments were selected to study their effects on the solder joint performance.

The results demonstrate a sever thermal swing and stress fluctuation in the solder joint induced in the case of triangle current type because the critical states lack any relaxation time. In fact, the stress intensification in the solder under application of the triangle current type has been shown to contribute to increasing brittle intermetallic compounds. An accelerated increase of on-state voltage of power semiconductor was also observed in under application of the triangle current type.

The originality of this paper is confirmed.

The dissolution processes and subsequent intermetallic reactions between high tin solder bump alloys and Cu‐ or Ni‐based UBM‐metallisations were investigated both theoretically and experimentally. The results showed that when the Cu UBM layer is used together with eutectic or higher Sn‐based solder alloys the dissolution of Cu and the rate of the Cu₆Sn₅ formation is too high for reliable interconnections. On the contrary, Ni provides feasible solution for UBM/high tin solder applications. Although there is strong chemical interaction between nickel and high Sn solder bump alloys, the dissolution and subsequent Ni₃Sn₄ layer growth rates are very low. Thus, a thin Ni layer can sustain interactions with high Sn liquid as well as solid solders during high temperature use. On the basis of the results obtained flip chip bonding with Ni‐based UBM structures provides a viable interconnection solution for reliable fine‐pitch applications.

The purpose of this paper is to carry out a study of the evolution of the microstructure and the microhardness of Sn-Cu-Ag alloys from as-cast condition and under artificial isothermal aging at different temperatures (100ºC and 180ºC) for a treatment time up to 500 h. A comparison with Sn-37% Pb eutectic solder samples was also made.

Sn-3.5%Ag, Sn-0.7%Cu and Sn-3.5%Ag-0.9%Cu were poured in two different cooling rate conditions and then aged at 100ºC (373ºK) and 180 °C (453ºK) during 500 h. Microstructural changes were observed by optical microscopy, scanning electron micrograph and energy dispersive X-ray microanalysis. Differential scanning calorimetry technique (DSC) was also used to confirm the obtained results.

A decrease up to 20% in microhardness respect to the value of the as-cast alloy was observed for both aging temperatures. These changes can be explained considering the coarsening and recrystallization of Sn dendrites present in the microstructures of all the systems studied.

There is no evidence of dissolution or precipitation of new phases in the range of studied temperatures that could be detected by DSC calorimetry technique. The acting mechanisms must be the result of coarsening of Sn dendrites and the residual stresses relaxation during the first stages of the isothermal aging.

This paper aims to investigate the effect of solder composition and roughness on early wetting behavior and interfacial reaction under atmospheric conditions.

High-speed photography is used to observe the early wetting and spreading process of the solder on the substrate in real time. The morphology of intermetallic compounds (IMCs) was observed by scanning electron microscopy, and the composition of IMCs micro bumps was determined by energy dispersive spectroscopy.

With a roughness range of 0.320–0.539 µm, the solder is distributed in an elliptical trilinear pattern along the grinding direction. With a roughness range of 0.029–0.031 µm, the solder spreads in the direction of grinding and perpendicular, forming a perfect circle (except in the case of Sn63Pb37 solder). The effect of three types of solder on early wettability is Sn63Pb37 > Sn96.5Ag3Cu0.5 > Sn. The wetting behavior is consistent with the Rn∼t model. The rapid spreading stage (Stage I) is controlled by the interfacial reaction with n1 values between 2.4 and 4. The slow spreading stage (stage II) is controlled by diffusion with n2 values between 4 and 6.7. The size of Cu6Sn5 formed on a rough substrate is greater than that produced on a smooth substrate.

Investigating the effect of solder composition and roughness on early wettability. This will provide a powerful guide in the field of soft brazing.

The purpose of this research was to develop a new process to bond silicon (Si) chips to low carbon steel substrates using pure tin (Sn) without any flux.

Iron (Fe) substrates were first electroplated with a Sn layer, followed by a thin silver (Ag) layer that inhibits Sn oxidation thereafter. It is this Ag capping layer that makes the fluxless feature possible. Fluxless processes are more environmentally friendly and more likely to produce joints without voids. The Si chips were deposited with Cr/Au dual layer structure. The bonding process was performed at 240°C in vacuum. The Sn joint thickness was controlled by spacers during the bonding. Scanning electron microscopy images on cross sections exhibited quality joints without visible voids. Energy dispersive X-ray spectroscopy analysis was used to detect joint compositions.

It was revealed that the Sn layer was bonded to a Si chip at the Cr–Sn interface and to the Fe substrate by forming an FeSn₂ intermetallic compound (IMC). The IMC is only 1.1 to 1.5 µm in thickness. Thin IMC is highly preferred because IMC deforms a little in accommodating the coefficient of thermal expansion (CTE) mismatch between Si and Fe. Shear test results showed that the fracture forces of the samples passed the military criteria by a wide margin.

This new fluxless bonding process on Fe should make Fe or low carbon steel a more likely choice of materials in optical modules and electronic packages.