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This study aims to simulate molded printed circuit board (PCB) warpage behavior under reflow temperature distribution. Simulation models are used to estimate dynamic warpage behavior for different form factor sizes.

This study analyzes warpage during the reflow process. The shadow moiré experiment methodology is used to collect data on the dynamic warpage performance of a model with a form factor of 10mm × 10mm × 1mm. The temperature profile with heating from 25°C to 300°C at intervals of 50°C is used, and the sample is made to undergo a cooling process until it reaches the room temperature. Subsequently, ANSYS static structural simulation is performed on similar form factor models to ascertain the accuracy of the simulation results.

Results show that the deformation and total force induced by coefficient of thermal expansion (CTE) mismatch are examined based on the warpage performance of models with different sizes, that is, 45mm × 45mm × 1mm and 45mm × 15mm × 1mm. Compared with the experimental data, the simulated modeling accuracy yields a less than 5% deviation in the dynamic warpage prediction at a reflow temperature of 300°C. Results also reveal that the larger the model, the larger the warpage changes under the reflow temperature.

The simulated warpage is limited to the temperature and force induced by CTE mismatch between two materials. The form factor of the ball-grid array model is limited to only three different sizes. The model is assumed to be steady, isothermal and static. The simulation adopts homogenous materials, as it cannot accurately model nonhomogeneous multilayered composite materials.

This study can provide engineers and researchers with a profound understanding of molded PCB warpage, minimal resource utilization and the improved product development process.

The accurate prediction of molded PCB warpage can enable efficient product development and reduce resources and production time, thereby creating a sustainable environment.

The literature review points out that warpage in various types of PCBs was successfully examined, and that considerable efforts were exerted to investigate warpage reduction in PCB modules. However, PCB warpage studies are limited to bare PCBs. To the best of the authors’ knowledge, the examination of warpage in a molded PCB designed with a molded compound cover, as depicted in Figure 3, is yet to be conducted. A molded compound provides strong lattice support for PCBs to prevent deformation during the reflow process, which is a topic of considerable interest and should be explored.

The study examined the relationship between psychological contract breach and organizational commitment and whether leader-member exchange and job embeddedness mediate this relationship.

The study adopted a quantitative approach and is based on a sample of 298 teachers in basic schools in Accra, Ghana. Participants completed surveys with standardized measures on psychological contract breach, job embeddedness, leader-member exchange and organizational commitment. Hypothesized relationships were tested using structural equation modeling in AMOS 21.0.

Psychological contract breach had a direct negative relationship with affective and normative commitment but had no significant direct relationship with continuance commitment. Psychological contract breach was indirectly related to affective and normative commitment through both job embeddedness and leader-member exchange, and indirectly related to continuance commitment through only job embeddedness.

Findings from the study suggest that employers' failure to fulfill their obligations to employees has significant potential cost to the organization, and underscore the need for managers, particularly in educational institutions, to institute measures to eliminate or minimize the occurrence of psychological contract breach.

The study contributes to research examining antecedents of organizational commitment as well as the mechanisms linking psychological contract breach to organizational commitment in the educational context.

The purpose of this paper is to perform experimental tests on fatigue characteristics of chip scale package (CSP) assembly under vibration. Some suggestions for design to prolong fatigue life of CSP assembly are provided.

The CSP assembly which contains different package structure modes and chip positions was manufactured. The fatigue characteristics of CSP assembly under vibration were tested. The fatigue load spectrum of CSP assembly was developed under different excitation. The fatigue life of chips can be estimated by using the high-cycle fatigue life formula based on different stress conditions. The signal–noise curve shows the relationship between fatigue life and key factors. The design strategy for improving the fatigue life of CSP assembly was discussed.

The CSP chip has longer fatigue life than the ball grid array chip under high cyclic strain. The closer to fixed point the CSP chip, the longer fatigue life chips will have. The chip at the edge of the printed circuit board (PCB) has longer fatigue life than the one in the middle of the PCB. The greater the excitation imposed on the assembly, the shorter the fatigue life of chip.

It is very difficult to set up a numerical approach to illustrate the validity of the testing approach because of the complex loading modes and the complex structure of CSP assembly. The research on an accurate mathematical model of the CSP assembly prototype is a future work.

It builds a basis for high reliability design of high-density CSP assembly for engineering application. In addition, vibration fatigue life prediction method of chip-corner solder balls is deduced based on three-band technology and cumulative damage theory under random vibration so as to verify the accuracy of experimental data.

This paper fulfils useful information about the dynamic reliability of CSP assembly with different structural characteristics and material parameters.

The increasing level of integration in PCB technology demands from the designer a new level of sensitivity to high electrical field problems and to the degradation processes that may be involved. High electrical fields interacting with thermal and mechanical stresses could lead to the growth of ‘latent defects’, not easily identifiable during final stage acceptance tests, that could lead the PCB's failure during service. The paper discusses degradation mechanisms which can lead to dielectric failure, together with first results relevant to a wider research project regarding identification of latent defects in PCBs and the development of new test procedures.

The purpose of this paper is to evaluate the reliability of solder joints made on long FR-4 and metal core printed circuit boards using the accelerated thermal cycling.

Solder joints of diodes and resistors samples made on long FR-4 and aluminum (Al) core printed circuit boards were examined. Two kinds of solder pastes were used for the samples preparation. All samples were subjected to temperature aging cycles (−40°C – 3 hours/+85°C – 3 hours). Solder joints resistance, X-Ray inspection and metallographic cross-sections for samples as received and after 100, 500 and 1,000 hours of thermal cycles were utilized for solder joints assessment.

It was stated that 1,000 hours of thermal cycles were enough to show reliability problems in solder joints on long and/or AL core printed circuit board assembly (PCBA). The solder joints of R1206 components were the most sensitive reliability elements. The solder joints of LED diodes are more reliable than solder joints of R1206 resistors. Solder joints made on FR-4 substrate were about two times more reliable than ones on AL core substrate. Cracks in solder joints were the visible reason of solder joints failures.

The influence of thermal cycles on the reliability of solder joints on long, FR-4 and metal core printed circuit boards were presented. Findings from this paper can be used for planning of reliability trials during validation of reflow processes of products containing long or long metal core printed circuit boards (PCBs).

The purpose of this paper is to investigate the end point of the plasma cleaning process, in order to save valuable production time and also to prevent the destruction of expensive devices through overheating.

Post plasma cleaning analysis using dynamic contact angle (DCA) analysis and video microscope observations have been conducted on plasma treated Entec coated copper, hot air solder levelled (HASL) and electroless nickel immersion gold (ENIG) surfaces in order to determine the effect of surface finish on plasma process times. Post plasma cleaning and lead-free wave soldering analysis of the three surface finishes have been evaluated.

The DCA results indicate that the end-point for plasma cleaning of Entec coated copper is achieved within one to three minutes (indicated by a low contact angle hysteresis). Further cleaning after three minutes may lead to surface degradation and poor solder wettability. This is consistent with the results of the video microscope observations which show well soldered component leads and pads with good solder coverage for copper surface finish treated at a short plasma process time (one minute) and poorly soldered component leads and pads for a surface treated at a long process time (ten minutes). Similar work conducted on HASL and ENIG finishes show better results (well soldered component leads and solder pads) for longer plasma process times of five to ten minutes.

This paper indicates that plasma process time determines the wettability and solderability of the treated samples. It shows that the plasma conditions including the process time must be optimised and characterised for every application in order to avoid damage to expensive devices. The findings also give the confidence to implement plasma cleaning of lead-free (99.3Sn/0.7Cu) solder PCBs for fluxless soldering.

The driving forces behind recent significant improvements in organic packages for microelectronic applications are electrical performance, product weight, size and manufacturing cost. A very careful selection of optimum manufacturing processes, equipment and materials, and stringent control of critical manufacturing operations are prerequisites for success in this emerging market place. Major technical and business related challenges to a printed circuit board manufacturer who plans to enter this market are discussed.

With the ever increasing demands for high performance electronic devices there is a need for circuit board laminates that have enhanced properties when compared to conventional materials such as the widely used epoxide‐based FR4 laminates. Equipment manufacturers require boards with better mechanical stability and improved electrical characteristics. At the same time, new environmental legislation is set to drive electronics assembly temperatures much higher as manufacturers start to use lead‐free soldering processes. The legislation is also raising questions about the long‐term viability of brominated resins as the basis for imparting flame retardancy to laminates. Fortunately, laminate manufacturers have responded to these challenges by developing and introducing a wide range of new laminates that address these issues. This paper describes some of these challenges and gives an introduction to the new high performance laminates that are finding increasing use. It also highlights the need for chemical processes used in the manufacture of interconnects with laminates to be specifically optimised for the chosen substrate material.

A family of cavity‐down plastic ball grid array (PBGA) packages have been designed by split via connection (SVC) and split wrap around (SWA) methods. Because of the special designs, these packages consist of a single core of organic material and two‐metal layers of copper and are manufactured with the conventional printed circuit board (PCB) process at very low cost. The electrical performances of the packages are studied by both numerical simulations and experimental measurements. Parasitic parameters are extracted from time domain reflectometer (TDR) and time domain transmission (TDT) measurements. Cross‐talk and simultaneous switch output (SSO) noise of the packages are also investigated.

Both the need for the introduction of automated optical inspection (AOI) systems in the PCB manufacturing process and the requirements, technically and on economic grounds, placed on such equipment are discussed in detail. Furthermore, emphasis is placed on the description of commonly used AOI concepts. The paper ends with a check list containing the most important questions concerning any system's capabilities.