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Tin-Silver-Copper is widely accepted as the best alternative to replace Tin-Lead solders in microelectronics packaging due to their acceptable properties. However, to overcome some of the shortcomings related to its microstructure and in turn, its mechanical properties at high temperature, the addition of different elements into Tin-Silver-Copper is important for investigations. The purpose of this paper is to analyse the effect of lanthanum doping on the microstructure, microhardness and tensile properties of Tin-Silver-Copper as a function of thermal aging time for 60, 120 and 180 h at a high temperature of 150°C and at high strain rates of 25, 35 and 45/s.

The microstructure of un-doped and Lanthanum-doped Tin-Silver-Copper after different thermal aging time is examined using scanning electron microscopy followed by digital image analyses using ImageJ. Brinell hardness is used to find out the microhardness properties. The tensile tests are performed using the universal testing machine. All the investigations are done after the above selected thermal aging time at high temperature. The tensile tests of the thermally aged specimens are further investigated at high strain rates of 25, 35 and 45/s.

According to the microstructural examination, Tin-Silver-Copper with 0.4 Wt.% Lanthanum is found to be more sensitive at high temperature as the aging time increases which resulted in coarse microstructure due to the non-uniform distribution of intermetallic compounds. Similarly, lower values of microhardness, yield strength and ultimate tensile strength come in favours of 0.4 Wt.% Lanthanum added Tin-Silver-Copper. Furthermore, when the thermally aged tensile specimen is tested at high strains, two trends in tensile curves of both the solder alloys are noted. The trends showed that yield strength and ultimate tensile strength increase as the strain rate increase and decrease when there is an increase in thermal aging.

The addition of higher supplement (0.4 Wt.%) of Lanthanum into Tin-Silver-Copper showed a lower hardness value, yield strength, ultimate tensile strength, ductility, toughness and fatigue in comparison to un-doped Tin-Silver-Copper at high temperature and at high strain rates. Finally, simplified material property models with minimum error are developed which will help when the actual test data are not available.

The research on lead-free solder alloys has increased in past decades due to awareness of the environmental impact of lead contents in soldering alloys. This has led to the introduction and development of different grades of lead-free solder alloys in the global market. Tin-silver-copper is a lead-free alloy which has been acknowledged by different consortia as a good alternative to conventional tin-lead alloy. The purpose of this paper is to provide comprehensive knowledge about the tin-silver-copper series.

The approach of this study reviews the microstructure and some other properties of tin-silver-copper series after the addition of indium, titanium, iron, zinc, zirconium, bismuth, nickel, antimony, gallium, aluminium, cerium, lanthanum, yttrium, erbium, praseodymium, neodymium, ytterbium, nanoparticles of nickel, cobalt, silicon carbide, aluminium oxide, zinc oxide, titanium dioxide, cerium oxide, zirconium oxide and titanium diboride, as well as carbon nanotubes, nickel-coated carbon nanotubes, single-walled carbon nanotubes and graphene-nano-sheets.

The current paper presents a comprehensive review of the tin-silver-copper solder series with possible solutions for improving their microstructure, melting point, mechanical properties and wettability through the addition of different elements/nanoparticles and other materials.

This paper summarises the useful findings of the tin-silver-copper series comprehensively. This information will assist in future work for the design and development of novel lead-free solder alloys.

The purpose of this paper is to analyze the effect of lanthanum (La) doping on the microstructure and mechanical properties of tin-silver-copper (SAC) alloys and to find out an optimum La doping concentration upon which the best set of the desirable properties can be possible. SAC tertiary Pb-free solders are thought to be the best substitutes for Pb-based solders but have limitations due to their coarse microstructure.

Three samples with varied La concentrations were synthesized from pure metals. SAC with various concentrations of doped La were studied in detail. Scanning electron microscopy images were studied and were further analyzed by the ImageJ software to measure the average intermetallic compounds (IMCs) size. Optical microscopy was used to study the grains. MTS tensile machine was used determine out the mechanical properties. All the analysis was done before and after thermal aging. Finally, an optimum La doping concentration was found.

By doping a suitable concentration of La in SAC, the average IMCs size as well as grain size was greatly reduced. Yield stress and tensile strength were quite improved as a result. Unlike previous studies, ductility was not lowered. Impact toughness was seen to be significantly improved. Finally, an optimum La doping concentration was found to be 0.3 per cent by weight, as beyond this, ductility drops rapidly.

The optimum La doping concentration in SAC resulted in a much refined microstructure and a very good set of the desirable properties, including yield stress, tensile strength, ductility, impact toughness and expectedly creep and fatigue resistances, for the first time.

The goal of this work is to evaluate the feasibility of soldering tin‐silver‐copper balled BGAs using tin‐lead‐based solder and to investigate the influence of different production parameters on the microstructure of the solder joint.

The soldering of the BGAs was done with various temperature profiles and two conveyor speeds under a nitrogen atmosphere in a full convection oven. One specimen from each temperature/time combination was cross‐sectioned. The cross sections were analysed with optical microscopy, scanning electron microscopy with energy dispersive X‐ray spectroscopy (SEM/EDS) at 30 kV and focused ion beam microscopy (FIB).

The cross sections show a metallurgical bond between the solder and the tin‐silver‐copper balls of the BGA, even at a peak reflow temperature of 210°C. However, the balls alloy only partially with the solder, as the liquidus of tin‐silver‐copper balls is 217°C. As soon as the peak temperature exceeds the liquidus of the ball, the solder is totally dissolved in the material of the ball. A reflow profile with a peak temperature of about 230°C on the BGA gives a homogenous reaction of the solder with the ball with a minimum formation of voids.

The dependence of varying reflow parameters on reliability requires detailed study. Especially the effect of a partially melted ball on the degradation of the solder joint needs to be investigated.

From the findings, it can be said that soldering lead‐free balls with tin‐lead solder is possible. This is useful during the transitional period that the industry is in at the moment. More and more component manufacturers are changing their components to lead‐free, often without notice to the customer. If a production line is still running a tin‐lead process it is essential to know how to process these components with tin‐lead solder.

Over the last few years, the emergence of new European draft legislation has focussed electronics industry attention on the likely ultimate proscription of lead in electronics assembly. Much work has already been undertaken to identify the possible alternatives to conventional tin‐lead solders and to evaluate their performance benefits and limitations in comparison with the traditional materials. Although, some companies are already offering products manufactured using lead‐free products, there is still a widespread lack of activity in many areas. With this none‐too‐distant deadline rapidly approaching, Envirowise has sponsored this paper as part of its coordinated activities to assist the UK electronics industry and to promote environmental efficiency and best practice. This paper details the current situation with respect to the drivers towards the adoption of lead‐free assembly before giving an overview of the current situation. This paper concludes with details of sources of further information.

Though lead‐free replacements for SnPb eutectic alloys for reflow, wave, and hand soldering have been developed, relatively little has been reported on practical experience of lead‐free wave soldering processes. In wave soldering, the interaction between the PCB, flux, solder alloy and processing equipment makes it desirable to develop the consumables and the wave soldering machine concurrently. A crossfunctional project team was formed and a lead‐free wave soldering process developed and validated through nine months of industrial use in production of broad‐band communications technology products.

The aim is to present temperature fatigue model constants for lead‐free tin‐silver‐copper solder derived from test data and demonstrate the validity of the model using published experimental results.

Temperature cycle fatigue life data were collected from a controlled set of tests using ceramic leadless chip carriers. Using a regression algorithm, temperature cycle fatigue model constants were derived from fatigue life data. The model was then applied to a variety of package formats including ball grid arrays, quad flatpack and thin small outline packages to determine the validity of the model and constants.

The temperature cycle fatigue life experimental data were found to be in good agreement with the model with the derived model constants for various package types. Using this model, engineers can determine acceleration factors between test and field temperature cycle conditions.

The technology has been used to ensure inner layer designs with nominal dimensions after the lamination stage. Further, development work should be undertaken to collate measured data from other parts of the PCB manufacturing process and model the material movement around all registration critical processes.

The paper details a temperature cycle fatigue life model and constants that allow engineers to predict field life expectancy and determine the acceleration factor between temperature cycle testing and field use conditions.

There are several lead-free solder alloys available in the industry. Over the years, the most favorable solder composition of tin-silver-copper (Sn-Ag-Cu [SAC]) has been vastly used and accepted for joining the electronic components. It is strongly believed that the silver (Ag) content has a significant impact on the solder mechanical behavior and thus solder thermal reliability performance. This paper aims to assess the mechanical response, i.e. creep response, of the SAC solder alloys with various Ag contents.

A three-dimensional nonlinear finite element simulation is used to investigate the thermal cyclic behavior of several SAC solder alloys with various silver percentages, including 1%, 2%, 3% and 4%. The mechanical properties of the unleaded interconnects with various Ag amounts are collected from reliable literature resources and used in the analysis accordingly. Furthermore, the solder creep behavior is examined using the two famous creep laws, namely, Garofalo’s and Anand’s models.

The nonlinear computational analysis results showed that the silver content has a great influence on the solder behavior as well as on thermal fatigue life expectancy. Specifically, solders with relatively high Ag content are expected to have lower plastic deformations and strains and thus better fatigue performance due to their higher strengths and failure resistance characteristics. However, such solders would have contrary fatigue performance in drop and shock environments and the low-Ag content solders are presumed to perform significantly better because of their higher ductility.

Generally, this research recommends the use of SAC solder interconnects of high silver contents, e.g. 3% and 4%, for designing electronic assemblies continuously exposed to thermal loadings and solders with relatively low Ag-content, i.e. 1% and 2%, for electronic packages under impact and shock loadings.

This paper aims to analyze the effect of cerium addition on the microstructure and the mechanical properties of Tin-Silver-Copper (SAC) alloy. The mechanical properties and refined microstructure of a solder joint are vital for the reliability and performance of electronics. SAC305 alloys are potential choices to use as lead-free solders because of their good properties as compared to the conventional Tin-Lead solder alloys. However, the presence of bulk intermetallic compounds (IMCs) in the microstructure of SAC305 alloys affects their overall performance. Therefore, addition of cerium restrains the growth of IMCs and refines the microstructure, hence improving the mechanical performance.

SAC305 alloy is doped with various composition of xCerium (x = 0.15, 0.35, 0.55, 0.75, 0.95) % by weight. Pure elements in powdered form were melted in the presence of argon with periodic stirring to ensure a uniform melted alloy. The molten alloy is then poured into a pre-heated die to obtain a tensile specimen. The yield strength and universal tensile strength were determined using a fixed strain rate of 10 mm per minute or 0.1667 mm s^(−1). The IMCs are identified using X-ray diffraction, whereas the elemental phase composition and microstructure evolution are, respectively, examined by using electron dispersive spectroscopy and scanning electron microscopy.

Improvement in the microstructure and mechanical properties is observed with 0.15% of cerium additions. The tensile test also showed that SAC305-0.15% cerium exhibits more stress-bearing capacity than other compositions. The 0.75% cerium doped alloy indicated some improvement because of a decrease in fracture dislocation regions, but microstructure refinement and the arrangement of IMCs are not those of 0.15% Ce. Different phases of Cu_6 Sn_5, Ag_3 Sn and CeSn_3 and ß-Sn are identified. Therefore, the addition of cerium in lower concentrations and presence of Ce-Sn IMCs improved the grain boundary structure and resulted refinement in the microstructure of the alloy, as well as an enhancement in the mechanical properties.

Characterization of microstructure and evaluation of mechanical properties are carried out to investigate the different composition of SAC305-xCerium alloys. Finally, an optimized cerium composition is selected for solder joint in electronics.

Wafer-level stencil printing of a type-6 Pb-free SAC solder paste was statistically evaluated at 200 and 150 μm pitch using three different stencil manufacturing technologies: laser cutting, DC electroforming and micro-engineered electroforming. This investigation looks at stencil differences in printability, pitch resolution, maximum achievable bump height, print co-planarity, paste release efficiency, and cleaning frequency. The paper aims to discuss these issues.

In this paper, the authors present a statistical evaluation of the impact of stencil technology on type-6 tin-silver-copper paste printing. The authors concentrate on performances at 200 and 150 μm pitch of full array patterns. Key evaluated criteria include achievable reflowed bump heights, deposit co-planarity, paste release efficiency, and frequency of stencil cleaning. Box plots were used to graphically view print performance over a range of aperture sizes for the three stencil types.

Fabrication technologies significantly affect print performance where the micro-engineered electroformed stencil produced the highest bump deposits and the lowest bump height deviation. Second in performance was the conventional electroformed, followed by the laser-cut stencil. Comparisons between the first and fifth consecutive print demonstrated no need for stencil cleaning in the case for the micro-engineered stencil for all but the smallest spacings between apertures. High paste transfer efficiencies, i.e. above 85 per cent, were achieved with the micro-engineered stencil using low aperture area ratios of 0.5.

Stencil technology influences the maximum reflowed solder bump heights achievable, and bump co-planarity. To date, no statistical analysis comparing the impact of stencil technology for wafer-level bumping has been carried out for pitches of 200 μm and below. This paper gives new insight into how stencil technology impacts the print performance for fine pitch stencil printing. The volume of data collected for this investigation enabled detailed insight into the limitations of the printing process and as a result for suitable design guidelines to be developed. The finding also shows that the accepted industry guidelines on stencil design developed by the surface mount industry can be broken if the correct stencil technology is selected, thereby increasing the potential application areas of stencil printing.