Search results

The purpose of this paper is to describe a novel method for the manufacture of aluminum rigid‐flex circuit assemblies without the use of solder.

The approach involves the use of an aluminum base material and the embedding of components, while avoiding the use of solder in the assembly process.

The new methods and proposed structures address the key manufacturing problems that have vexed users for many years, while simultaneously addressing the challenge of thermal management. They also offer the advantage of enhanced reliability by avoiding the need for high temperatures used in soldering.

While examples of the process and its benefits have been demonstrated, further work is ongoing to expand applicability.

The paper begins with an overview of previous work in this area and then moves on to what is currently being implemented via the new technology. A novel method is described for the creation of potentially more cost‐effective and reliable rigid flex assemblies, which would be suitable for use in a wide range of products, from consumer to high‐reliability automotive, military and aerospace.

The purpose of this paper is to provide a historical perspective and framework for appreciating the evolution of 3D interconnection technologies from past to present.

A literature and patent search was performed to find the origins of 3D interconnections to find and credit work that was performed in the early electronics industry which presaged the development of the current generation 3D solutions.

The origins of 3D interconnections have roots that date to the beginnings of electronic interconnections if the earlier solutions are viewed in proper perspective. For example, early telegraphy and telephony interconnections strung from pole to pole across large expanses of terrain were clearly 3D interconnections on a very macro scale but those solutions scaled down are not that dissimilar to what is being done today in some advanced interconnection technologies.

The pioneers of the electronics industry broke a trail which has been widened, paved and branched by all who have followed them. Granted that the branches have led to new high‐worth discoveries but acknowledging the past and taking instruction from it is important, even necessary, to assure that future developments do not continually “reinvent the wheel”.

The paper traces, in brief fashion, the history of 3D interconnections providing examples of solutions which predate some of the current generation solutions which appear, in some cases, quite similar to those developed or proposed nearly half century ago. Knowing the past is vital to understanding and shaping the future.

Over the last few years, the emergence of new European draft legislation has focussed electronics industry attention on the likely ultimate proscription of lead in electronics assembly. Much work has already been undertaken to identify the possible alternatives to conventional tin‐lead solders and to evaluate their performance benefits and limitations in comparison with the traditional materials. Although, some companies are already offering products manufactured using lead‐free products, there is still a widespread lack of activity in many areas. With this none‐too‐distant deadline rapidly approaching, Envirowise has sponsored this paper as part of its coordinated activities to assist the UK electronics industry and to promote environmental efficiency and best practice. This paper details the current situation with respect to the drivers towards the adoption of lead‐free assembly before giving an overview of the current situation. This paper concludes with details of sources of further information.

The solder joint reliability of ceramic chip resistors assembled to laminate substrates has been a long time concern for systems exposed to harsh environments. In this work, the thermal cycling reliability of several 2512 chip resistor lead‐free solder joint configurations has been investigated. In an initial study, a comparison has been made between the solder joint reliabilities obtained with components fabricated with both tin‐lead and pure tin solder terminations. In the main portion of the reliability testing, two temperature ranges (−40‐125°C and −40‐150°C) and five different solder alloys have been examined. The investigated solders include the normal eutectic Sn‐Ag‐Cu (SAC) alloy recommended by earlier studies (95.5Sn‐3.8Ag‐0.7Cu), and three variations of the lead‐free ternary SAC alloy that include small quaternary additions of bismuth and indium to enhance fatigue resistance.

Results for reflow soldering are presented from a three‐year EC funded project “IDEALS” to develop lead‐free soldering solutions. On the basis of fundamental data from the literature, a shortlist of candidate lead‐free solders was selected, and results from tests on physical and soldering characteristics, and wetting balance testing, led to the choice of SnAg3.8Cu0.7, melting at 217°C. Implications for solder paste medium development are discussed. Differences in alloy density, melting point, and surface tension relative to conventional solders were found to give higher levels of internal voids, reduced spread on copper, and rougher, duller joints. Reflow process window studies showed that sound reliable joints could be obtained with a peak temperature as low as 225°C. Reliability was tested on soldered test boards using thermal shock cycling, power cycling, and vibration. Overall the SnAg3.8Cu0.7 gave results approximately equivalent to conventional solders, and different board finishes had no significant effect. The effects of Sb and Bi were also evaluated. No justification was found for minor additions of Sb, but 2‐5 per cent Bi was found to allow a reduction of the peak reflow temperature, though at the cost of reduced reliability if any Pb was present.

In recent years, efforts to develop alternatives to lead‐based solders have increased dramatically. These efforts began as a response to potential legislation and regulations restricting lead usage in the electronics industry. Lead is extremely toxic when inhaled or ingested. As researchers began to focus on Pb‐free solders, they recognized their value in high temperature applications (e.g. automotive manufacturing) where Sn/Pb solders do not meet the requirements. There are many factors to consider when developing lead‐free alloys: manufacturability, availability, reliability, cost and environmental safety. Of these, the most challenging and time consuming is the reliability of alternative solders. The lead‐free alloys available cannot be used as a drop‐in replacement for the SnPb or SnPbAg. The introduction of lead‐free solder alloys may mean having to use alternative component and PCB metallizations, PCB materials, solder fluxes, etc.

This paper will review the challenges brought by lead‐free soldering and some preliminary experimental evaluation results will be discussed. The initial results show that the lead‐free soldering process with 260°C reflow peak temperature does not directly cause failures for bismaleimide‐triazine (BT)‐based fine pitch ball grid array (FPBGA) packages. However, the strict lead‐free soldering condition could degrade the integrity of weak interface joints and potentially damage the package in subsequent unbiased highly accelerated stress test (unbiased HAST) evaluation. The impacts of lead‐free soldering with high reflow temperature on concurrent available electronics components could be more severe than previously believed. In the future, new materials and design concepts should be applied to enhance the package reliability under strict lead‐free soldering conditions.

Eliminating lead in electronics is an environmentally considerate approach that is made prior to manufacture. Recently enacted legislation encourages increased recycling of electrical and electronic products. However, recycling is typically an end‐of‐use action occurring just before final disposal. From an environmentally‐considerate perspective, lead elimination or replacement is a better approach. Short of having a definitive study to follow, industry, regulators, and consumers are proceeding with the change. Various lead‐free alloys have been tested and used for electronic components and assemblies. There are many replacements for eutectic tin‐lead solder, and alloys containing tin, silver, copper, and bismuth have been used successfully. Assessing how the electronics industry is addressing the change to lead‐free materials and processes requires answers to various questions. These questions regard the effects of changes to electronic products and their processes. What drives lead‐free migration, how processes can develop, and when products will be available are issues which define the assessment.

Historically, tin‐lead solder has been a commonly used joining material in electronics manufacturing. Environmental and health concerns, due to the leaching of lead from landfills into ground water, have necessitated legislation that restricts the use of lead in electronics. The transition from tin‐lead solder to a lead‐free solder composition is imminent. Several alternative solder alloys (and their fluxes) have been researched for electronics assembly in the last few years. The objective of this research was to develop a systematic selection process for choosing a “preferred” lead‐free solder paste, based on its print and reflow performance.

After a detailed study of industry preferences, published experimental data, and recommendations of various industrial consortia, a near eutectic tin‐silver‐copper (SAC) composition was selected as the preferred alloy for evaluation. Commercially available SAC solder pastes with a no‐clean chemistry were extensively investigated in a simulated manufacturing environment. A total of nine SAC pastes from seven manufacturers were evaluated in this investigation. A eutectic Sn/Pb solder paste was used as a baseline for comparison. While selecting the best lead‐free paste, it was noted that the selected paste has to perform as good as, if not better than, the current tin‐lead paste configuration used in electronics manufacturing for a particular application. The quality of the solder pastes was characterized by a series of analytical and assembly process tests consisting of, but not limited to, a printability test, a solder ball test, a slump test, and post reflow characteristics such as the tendency to form voids, self‐centring and wetting ability.

Each paste was evaluated for desirable and undesirable properties. The pastes were then scored relative to each other in each individual test. An aggregate of individual test scores determined the best paste.

This paper summarizes a systematic approach adopted to evaluate lead‐free solder pastes for extreme reflow profiles expected to be observed in reflow soldering lead‐free boards.

In the electronic assembly industry, low-temperature soldering holds great potential to be used in surface mounting technology. Tin–bismuth (Sn–Bi) eutectic alloys are lead-free solders applied in consumer electronics because of their low melting point, high strength and low cost. This paper aims to investigate how to address the problem of hot tear crack formation during Sn–Bi low-temperature solder (LTS) in the mass production of consumer electronics.

This paper explored the development of hot tear cracks during Sn–Bi soldering in the fabrication of flip chip ball grid arrays. Experiments were designed to simulate various conditions encountered in Sn–Bi soldering. Quantitative analysis was conducted on the number of hot tear cracks observed in different alloy compositions and solder volumes to explore the primary cause of hot tear cracks and possible methods to suppress crack formation.

Hot tear cracks existed in Sn–Bi solders with different bismuth (Bi) contents, but increasing the solder volume reduced the number of hot tear cracks. Experiments were designed to test the degree of chip transient thermal warpage with temperature change, and, according to the results, glue was dispensed in specific areas to reduce chip warpage deformation. Finally, the results of combined process experiments pointed to an effective method of low-temperature soldering to suppress hot tear cracks.

The study focuses on Sn–Bi solders only without other solder pastes such as SAC305 or Sn–Zn series.

With the growing popularity of smart electronics, especially in intelligent terminals, new energy vehicles electronics, solar photovoltaic and other field, there will be more and more demand for low- temperature, energy-saving, lead-free solders. Therefore, this study will help the industry to roll out LTS (Sn–Bi) solutions rapidly.

In the long term, lean and green manufacturing is expected to be essential for maintaining an advanced manufacturing industry across the world. Developing new LTSs and soldering processes is the most effective, direct solution for energy conservation and emission mitigation. With the growing popularity of smart electronics, especially in intelligent terminals, new energy vehicles and solar photovoltaics, there would be an increased demand for low-temperature, energy-saving, lead-free techniques.

Although there are many methods that can be used to suppress hot tear cracks, there is little research on how to control the hot tear cracks caused by the low-temperature soldering of Sn–Bi in laptop applications. The authors studied the hot tear cracks that developed during the world’s first mass production of 50 million personal laptops based on low-temperature Sn–Bi alloy solder pastes. By controlling the Bi content, redesigning the solder paste printing process (e.g. through a printer’s stencil) and adding dispensing processes, the authors obtained reliable and stable experimental data and conclusions.