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This paper aims to offer a convenient method to develop an oven recipe for a specific soldering profile in a reflow process. The method is devised to quickly achieve proper profile shape and heating factor Q_η, a measure of success for high reliability of the solder joints reflowed.

An in‐depth analysis of the heating mechanism and some experiments of the reflow soldering process are performed to research on how to realize a specific shape reflow profile were conducted.

Heating mechanism analysis and experiments demonstrate that the combinatorial parameters based method is feasible to do thermal profiling.

The mapping function among a particular configured PCBA, an oven used, a target reflow profile and an optimal range of the heating factor should be further established for fast and reliable production of reflow soldering.

Provides a methodology for designing an oven recipe for reflow soldering production.

An oven recipe can be quickly attained with the approach established in this paper, facilitating the formation of solder joints with high reliability during the reflow soldering process.

To investigate the relationship between intermetallic compound (IMC) formation and solderability for immersion tin deposit under different number of reflows.

Scanning Auger microscopy and X‐ray photoelectron spectrometer surface analysis techniques were used to study changes in immersion tin deposit layer when subjected to simulated solder reflow conditions.

Auger analysis also showed that no three discrete uniform layers of pure tin, Cu₆Sn₅η‐phase and Cu₃Sn ε‐phase can be observed after one reflow. Degradation in solderability performance after reflow was due to the formation of a Cu₆Sn₅ IMC at the surface. This IMC has inferior solder wetting properties compared to tin. As the number of reflow cycles increases the surface contains less tin rich regions and more IMC regions. Experiments showed that longer reflow times during the assembly process or use of a thicker tin layer can improve the solderability after three reflow cycles.

This work has shown that longer reflow times during the assembly process or use of a thicker tin layer can improve solderability after three reflow cycles. These two approaches are thus recommended when using immersion tin finishes on PCBs that require multiple lead‐free reflow cycles.

This paper provides valuable data that will assist PCB assemblers to optimise their solder reflow conditions when assembling boards that require multiple solder cycles.

The effects of varying reflow profiles on the tensile pull strength and structure of solder joints of components with tin plated and nickel‐palladium plated leads were studied. It was found that, in the case of tin plated leads, the structure and the tensile pull strength of the resultant solder joints were not significantly affected by varying the reflow conditions from Profile 1 (peak temperature range: 174°C to 195°C, reflow time 24 seconds) and Profile 2 (peak temperature range: 198°C to 218°C, reflow time 30 seconds). On the other hand, the mean pull strength of solder joints of nickel‐palladium plated lead was found to be significantly higher for joints reflowed with profile 2 than that of joints reflowed with Profile 1. Also, for both reflow profiles, the pull strengths of joints of nickel‐palladium plated leads were significantly higher than those of tin plated leads. This higher average pull strength may be due to the dissolution of palladium in the solder and/or the increased density of intermetallic precipitates in the solder fillet, and the increased intermetallic layer thickness at the lead/solder interface.

This study aims to investigate the possible defects and their root causes in a soft-termination multilayered ceramic capacitor (MLCC) when subjected to a thermal reflow process.

Specimens of the capacitor assembly were subjected to JEDEC level 1 preconditioning (85 °C/85%RH/168 h) with 5× reflow at 270°C peak temperature. Then, they were inspected using a 2 µm scanning electron microscope to investigate the evidence of defects. The reliability test was also numerically simulated and analyzed using the extended finite element method implemented in ABAQUS.

Excellent agreements were observed between the SEM inspections and the simulation results. The findings showed evidence of discontinuities along the Cu and the Cu-epoxy layers and interfacial delamination crack at the Cu/Cu-epoxy interface. The possible root causes are thermal mismatch between the Cu and Cu-epoxy layers, moisture contamination and weak Cu/Cu-epoxy interface. The maximum crack length observed in the experimentally reflowed capacitor was measured as 75 µm, a 2.59% difference compared to the numerical prediction of 77.2 µm.

This work's contribution is expected to reduce the additional manufacturing cost and lead time in investigating reliability issues in MLCCs.

Despite the significant number of works on the reliability assessment of surface mount capacitors, work on crack growth in soft-termination MLCC is limited. Also, the combined experimental and numerical investigation of reflow-induced reliability issues in soft-termination MLCC is limited. These cited gaps are the novelties of this study.

This paper aims to propose a method to quickly set the heating zone temperatures and conveyor speed of the reflow oven. This novel approach intensely eases the trial and error in reflow profiling and is especially helpful when reflowing thick printed circuit boards (PCBs) with bulky components. Machine learning (ML) models can reduce the time required for profiling from at least half a day of trial and error to just 1 h.

A highly compact computational fluid dynamics (CFD) model was used to simulate the reflow process, exhibiting an error rate of less than 1.5%. Validated models were used to generate data for training regression models. By leveraging a set of experiment results, the unknown input factors (i.e. the heat capacities of the bulkiest component and PCB) can be determined inversely. The trained Gaussian process regression models are then used to perform virtual reflow optimization while allowing a 4°C tolerance for peak temperatures. Upon ensuring that the profiles are inside the safe zone, the corresponding reflow recipes can be implemented to set up the reflow oven.

ML algorithms can be used to interpolate sparse data and provide speedy responses to simulate the reflow profile. This proposed approach can effectively address optimization problems involving multiple factors.

The methodology used in this study can considerably reduce labor costs and time consumption associated with reflow profiling, which presently relies heavily on individual experience and skill. With the user interface and regression models used in this approach, reflow profiles can be swiftly simulated, facilitating iterative experiments and numerical modeling with great effectiveness. Smart reflow profiling has the potential to enhance quality control and increase throughput.

In this study, the employment of the ultimate compact CFD model eliminates the constraint of components’ configuration, as effective heat capacities are able to determine the temperature profiles of the component and PCB. The temperature profiles generated by the regression models are time-sequenced and in the same format as the CFD results. This approach considerably reduces the cost associated with training data, which is often a major challenge in the development of ML models.

Laser soldering has attracted attention as an alternative soldering process for microsoldering due to its localized and noncontact heating, a rapid rise and fall in temperature, fluxless and easy automation compared to reflow soldering.

In this study, the metallurgical and mechanical properties of the Sn3.0Ag0.5Cu/Ni-P joints after laser and reflow soldering and isothermal aging were compared and analyzed.

In the as-soldered Sn3.0Ag0.5Cu/Ni-P joints, a small granular and loose (Cu,Ni)6Sn5 intermetallic compound (IMC) structure was formed by laser soldering regardless of the laser energy, and a long and needlelike (Cu,Ni)6Sn5 IMC structure was generated by reflow soldering. During aging at 150°C, the growth rate of the IMC layer was faster by laser soldering than by reflow soldering. The shear strength of as-soldered joints for reflow soldering was similar to that of laser soldering with 7.5 mJ, which sharply decreased from 0 to 100 h for both cases and then was maintained at a similar level with increasing aging time.

Laser soldering with certain energy is effective for reducing the thickness of IMCs, and ensuring the mechanical property of the joints was similar to reflow soldering.

This study aims to investigate crack propagation in a moisture-preconditioned soft-termination multi-layer ceramic capacitor (MLCC) during thermal reflow process.

Experimental and extended finite element method (X-FEM) numerical analyses were used to analyse the soft-termination MLCC during thermal reflow. A cross-sectional field emission scanning electron microscope image of an actual MLCC’s crack was used to validate the accuracy of the simulation results generated in the study.

At 270°C, micro-voids between the copper-electrode and copper-epoxy layers absorbed 284.2 mm/mg³ of moisture, which generated 6.29 MPa of vapour pressure and caused a crack to propagate. Moisture that rapidly vaporises during reflow can cause stresses that exceed the adhesive/substrate interface’s adhesion strength of 6 MPa. Higher vapour pressure reduces crack development resistance. Thus, the maximum crack propagation between the copper-electrode and copper-epoxy layers at high reflow temperature was 0.077 mm. The numerical model was well-validated, as the maximum crack propagation discrepancy was 2.6%.

This research holds significant implications for the industry by providing valuable insights into the moisture-induced crack propagation mechanisms in soft-termination MLCCs during the reflow process. The findings can be used to optimise the design, manufacturing and assembly processes, ultimately leading to enhanced product quality, improved performance and increased reliability in various electronic applications. Moreover, while the study focused on a specific type of soft-termination MLCC in the reflow process, the methodologies and principles used in this research can be extended to other types of MLCC packages. The fundamental understanding gained from this study can be extrapolated to similar structures, enabling manufacturers to implement effective strategies for crack reduction across a wider range of MLCC applications.

The moisture-induced crack propagation in the soft-termination MLCC during thermal reflow process has not been reported to date. X-FEM numerical analysis on crack propagation have never been researched on the soft-termination MLCC.

This paper aims to establish a method to optimize reflow profiles and achieve high reliability of solder joints on the basis of the heating factor, Q_η, a measure of the reflow profile related to reliability of reflow processed products.

The focus of the paper is on how to realize the optimal range of Q_η, since there is no need to pay particular attention to the shape of a reflow profile when performing a heating factor‐based optimization. The coldest point on the printed circuit board assembly (PCA), which experiences the minimum heating factor (Q_η^min) during the reflow process, was used to set the lower limit of the optimal range (Q_η^L). If Q_η^min approaches Q_η^L and the temperature difference across the PCA is minimized, then the solder joints on the PCA will all experience heating factors within the optimal range, ensuring high quality reflow soldering. Establishing an initial reflow profile may be performed using profiling software. The resultant oven recipe may then be used as the reference recipe by which to apply the heating factor‐based optimization. A combinatorial parameter, H_t, is defined to represent the temperature settings of all the top heating zones within the heating section of the reflow oven. The relative difference between H_t and each top heating zone temperature setting is derived from the reference recipe, and H_t is then adjusted to achieve Q_η^L for Q_η^min. This is achieved by using a least squares estimation method to build a regression model for Q_η^min versus H_t.

Experiments and regression analysis have demonstrated that Q_η^min varied linearly with H_t, with α denoting its slope. With a measured Q_η^min in response to the reference setup after the first run of a PCA, H_t should be increased by ((Q_η^L−Q_η^min)/α) to attain Q_η^L in the second run. Thereby, a suitable reflow process recipe can be obtained with only two reflow runs where Q_η^min is close to Q_η^L.

The optimal range of heating factor for lead‐free solder pastes is currently unknown, and the method to establish the required oven recipe for achieving a required reflow profile requires further exploration.

Provides a methodology for reducing the risk of process‐related reliability issues in lead‐free soldering.

Q_η^L can be fairly quickly achieved for Q_η^min with the approach established in this paper, facilitating the formation of solder joints with high reliability during the reflow soldering process.

This paper aims to provide the proper preset temperatures of the convection reflow oven when reflowing a printed circuit board (PCB) assembly with varied sizes of components simultaneously.

In this study, computational fluid dynamics modeling is used to simulate the reflow soldering process. The training data provided to the machine learning (ML) model is generated from a programmed system based on the physics model. Support vector regression and an artificial neural network are used to validate the accuracy of ML models.

Integrated physical and ML models synergistically can accurately predict reflow profiles of solder joints and alleviate the expense of repeated trials. Using this system, the reflow oven temperature settings to achieve the desired reflow profile can be obtained at substantially reduced computation cost.

The prediction of the reflow profile subjected to varied temperature settings of the reflow oven is beneficial to process engineers when reflowing bulky components. The study of reflowing a new PCB assembly can be started at the early stage of board design with no need for a physical profiling board prototype.

This study provides a smart solution to determine the optimal preset temperatures of the reflow oven, which is usually relied on experience. The hybrid physics–ML model providing accurate prediction with the significantly reduced expense is used in this application for the first time.

This paper aims to investigate the metallurgical reactions between two commercial AgPt thick films used as a solder land on a low temperature co‐fired ceramic (LTCC) module and solder materials (SnAgCu, SnInAgCu, and SnPbAg) in typical reflow conditions and to clarify the effect of excessive intermetallic compound (IMC) formation on the reliability of LTCC/printed wiring boards (PWB) assemblies.

Metallurgical reactions between liquid solders and AgPt metallizations of LTCC modules were investigated by increasing the number of reflow cycles with different peak temperatures. The microstructures of AgPt metallization/solder interfaces were analyzed using SEM/EDS investigation. In addition, a test LTCC module/PWB assembly with an excess IMC layer within the joints was fabricated and exposed to a temperature cycling test in a −40 to 125°C temperature range. The characteristic lifetime of the test assembly was determined using DC resistance measurements. The failure mechanism of the test assembly was verified using scanning acoustic microscopy and SEM investigation.

The results showed that the higher peak reflow temperature of common lead‐free solders had a significant effect on the consumption of the original AgPt metallization of LTCC modules. The results also suggested that the excess porosity of the metallization accelerated the degradation of the metallization layer. Finally, the impact of these adverse metallurgical effects on the actual failure mechanism in an LTCC/PWB assembly was demonstrated.

This paper proves how essential it is to know the actual LTCC metallization/solder interactions that occur during reflow soldering and to recognize their effect on solder joint reliability in LTCC module/PWB assemblies. Moreover, the adverse effect of using lead‐free solders on the degradation of Ag‐based metallizations and, consequently, on board level reliability is demonstrated. Finally, practical guidelines for selecting materials for second‐level solder interconnections of LTCC module are given.