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The paper aims to investigate on the mechanical properties of surface-mount device (SMD) interconnections made on flexible and rigid substrates.

The durability of joints to shear strength was measured with tensile machine. Investigations were carried out for 0402- and 0603-sized ceramic passives and integrated circuits in SOIC-8, TSSOP-8, XSON3 and XSON6 packages. Three types of flexible substrates (Kapton, Mylar and Pyralux) and two types of rigid substrates (LTCC and alumina) were used. SMD components were mounted with SAC solder or electrically conductive adhesive. Contact pads were made of Ag-based polymer paste on flexible substrates and PdAg-based cermet paste on ceramics. The shear strength was measured for as-made and long-term thermally aged test structures. The average durability and standard deviation were compared for different combination of materials. Moreover, mechanical properties of interconnections made of polymer thick-film pastes or electrically/thermally conductive adhesives between ceramic chips and flexible/ceramic substrates were investigated.

The mechanical properties of joints strongly depend on configuration of applied materials. Some of them exhibit high durability to shear strength, while other should not be recommended due to very weak connections. Additionally, long-term thermal ageing showed that exploitation of such connections at elevated temperature in some cases might increase their strength. However, for some materials, it leads to accelerated degradation of joints.

This paper provides practical information about SMD interconnections made with standard materials (lead-free solder, electrically/thermally conductive adhesives) and proposed non-standard procedures, e.g. assembling of ceramic chips with low temperature cermet or polymer thick-film conductive pastes.

Silicones have long been recognised as attractive materials for use in electronics applications because of their unique combination of properties. Now, technology which couples high electrical conductivity with silicone performance characteristics has been developed. The new silver‐filled silicone adhesives were processed and cured in a manner similar to that used in conventional heat cured silicone compositions. Resultant cured products were both highly flexible and highly conductive, exhibiting volume resistivities down to 2 × 10−4 ohm‐cm. Both flexibility and electrical conductivity were retained after extended periods at elevated temperature. The electrical performance obtained while the new adhesives were under strain (induced either mechanically or thermally) was attributed to changes in the spatial packing of the silver. Low temperature characterisation indicated that the materials remain soft and stress‐relieving even down to −60°C. Other physical characteristics of these compositions, such as high ionic purity, low moisture uptake and good adhesion, are typical of high performance electrically conductive adhesives. This combination of properties suggests that these new silicone adhesives should be attractive for the electrical interconnection of microelectronics substrates having a mismatch of thermal coefficients of expansion (TCE) which would normally lead to failure due to thermomechanical stresses, and for the manufacture of flexible circuitry.

Tape automated bonding (TAB) circuits were joined by hot compression bonding to copper or nickel conductors on glass with two anisotropic electrically conductive adhesives. One of the adhesives had a thermoplastic polystyrene‐polyester matrix which contained easily deforming metal‐coated polymer particles, while the other was a thermosetting bisphenol (A) based epoxy resin filled with nickel particles. The resistance values and the mechanical strengths of the joints were measured before and after the ageing treatments. The thermoplastic adhesive had the lowest resistance values with copper conductors and the joints produced with this adhesive showed increasing strength values during the ageing tests. The joints between the Ni conductors had smaller values of electrical conductivity irrespective of the adhesive used. The SEM/EPMA technique revealed that particles of the thermoplastic adhesive tended to agglomerate. This may cause problems when components with very fine lead pitch are joined, either by short circuiting or leaving some contacts without particles.

The purpose of this paper is to discuss the use of epoxy‐based conducting adhesives in z‐axis interconnections.

A variety of conductive adhesives with particle sizes ranging from 80 nm to 15 μm were laminated into printed wiring board substrates. SEM and optical microscopy were used to investigate the micro‐structures, conducting mechanism and path. The mechanical strength of the various adhesives was characterized by 90° peel test and measurement of tensile strength. Reliability of the adhesives was ascertained by IR‐reflow, thermal cycling, pressure cooker test (PCT), and solder shock. Change in tensile strength of adhesives was within 10 percent after 1,000 cycles of deep thermal cycling (DTC) between −55 and 125°C.

The volume resistivity of copper, silver and low‐melting point (LMP) alloy based paste were 5 × 10⁻⁴, 5 × 10⁻⁵ and 2 × 10⁻⁵ Ω cm, respectively. Volume resistivity decreased with increasing curing temperature. Adhesives exhibited peel strength with Gould's JTC‐treated Cu as high as 2.75 lbs/in. for silver, and as low as 1.00 lb/in. for LMP alloy. Similarly, tensile strength for silver, copper and LMP alloy were 3,370, 2,056 and 600 ψ, respectively. There was no delamination for silver, copper and LMP alloy samples after 3X IR‐reflow, PCT, and solder shock. Among all, silver‐based adhesives showed the lowest volume resistivity and highest mechanical strength. It was found that with increasing curing temperature, the volume resistivity of the silver‐filled paste decreased due to sintering of metal particles.

As a case study, an example of silver‐filled conductive adhesives as a z‐axis interconnect construction for a flip‐chip plastic ball grid array package with a 150 μm die pad pitch is given.

A high‐performance Z‐interconnect package can be provided which meets or exceeds JEDEC level requirements if specific materials, design, and manufacturing process requirements are met, resulting in an excellent package that can be used in single and multi‐chip applications. The processes and materials used to achieve smaller feature dimensions, satisfy stringent registration requirements, and achieve robust electrical interconnections are discussed.

This paper describes the results of an analysis carried out on thermally conductive and electrically conductive adhesives, in order to characterise their behaviour for electronics and telecommunications applications.

Polyester connector strips were joined to polyimide substrates with anisotropic electrically conductive adhesives. Copper conductors as well as Au/Ni‐coated copper conductors were used on flexible circuits. The adhesives were composite materials consisting of heat curing, one‐component epoxy resin and powdered ternary solder alloys: tin‐bismuth‐zinc, tin‐indium‐zinc and tin‐zinc‐aluminium. An adhesive filled with eutectic tin‐bismuth alloy powder was used as reference. The effect of bonding parameters (e.g., temperature, dwell time and pressure) on contact resistance values was evaluated. The contact resistance values were measured for evaluating the reliability of adhesive joints during a 60°C/95%RH test. Furthermore, the joint microstructures were examined with optical and scanning electron microscopy. The results showed that with the copper conductors the initial contact resistance values were lower than with the Au/Ni‐coated copper conductors. The most reliable joints were produced with low melting filler alloys (with respect to bonding temperature) on bare copper metallisation. The most likely reason for failure of the Au/Ni‐coated circuits was strong oxidation of locally exposed nickel in the presence of moisture.

In recent years, electronic devices have increasingly employed printed circuits produced using electrically conductive adhesives, commonly known as polymer thick films. This method is much more cost‐effective and efficient than other methods of wiring, including those using chemical etching or plating. In the past, the use of metal‐filled polymers as conductors in printed circuit fabrication has suffered from several limitations such as poor solderability, conductivity and adhesion. A new electrically conductive metal‐filled polymer formulation has been developed which overcomes these problems inherent in typical polymer thick film inks. This new product is based on transient liquid‐phase sintering wherein the metallic components of the formulation sinter at a relatively low temperature, resulting in a highly conductive continuous metal network. The sintering is achieved through the interaction of several metallic components with an adhesive‐flux component. The final product is highly conductive, solderable and exhibits excellent adhesion to a wide range of substrate materials. A new process for manufacturing fine‐line printed circuit boards using this ink technology is under investigation. It promises potentially simpler processing and lower cost than plating. In this new process, traces (in the form of troughs in the dielectric) are imaged using conventional photoimageable dielectrics. Exposure and developing conditions depend upon the polymer system used. The transient liquid phase sinterable conductive ink is applied to fill the photo‐exposed conductor pattern. Next, another layer of photoimageable dielectric is applied over the traces and imaged with vias for interconnections with subsequent layers. The dielectric is then cured and the ink applied to fill the vias. These steps may be repeated several times to produce low‐profile fine‐line multilayer printed circuits. This process for producing multilayer circuits using conductive inks simplifies the manufacturing of printed circuits, reduces profile, eliminates most waste in manufacturing, and reduces cost compared with plating.

Electrically conductive adhesives are considered to be strong candidates for replacing toxic lead‐based solders. The present work has focused on thermal fatigue cracking of isotropic conductive adhesive (ICA) joints. The initiation and propagation of cracks in the ICA joints were investigated with scanning electron microscopy. A linear elastic finite element analysis has been performed to analyse the stress distribution in the ICA joint and correlate the critical stress concentrations with the observed crack initiation sites. The effect of joint configurations on thermal stresses was also evaluated with numerical calculations.