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Low relative humidity (RH) effect surface mount devices in numerous ways. The smaller size (0201) capacitor and resistor start wasting when RH is low. Due to low RH, electrostatic charges built-up on the surface of surface mount devices (SMDs) and component’s reel. The positive charged SMDs stick with the negatively charged reel tape and are wasted. This paper comprehensively explores the environmental effects on 0201 size surface mount devices during mounting process. Different type and size of surface mount devices are tested in low and desired RH to validate the effectiveness of the proposed approach. This paper will also highlight high electrostatic discharge (ESD) due to low RH which can be detrimental for small size surface mount devices. The experimental and graphical illustrations will stipulate the results of success rate for mounting components. The effect on ESD, subsequently varying temperature and humidity will also be analyzed.

In this paper, 0201 SDMs will be considered for analysis. The surface mount technology (SMT) plant temperature and humidity has been varied to examine the properties of small size SMDs. Total 5 hours production data are collected from Laptop motherboard production environment. This approach is applicable to all SMT environment.

The authors reduced the wastage of 0201 chip size resistor and capacitor. Total 11 components are selected of this size, and there success rate is observed during mounting. These components are first observed in harsh environment where the temperature is first set to 20ºC and RH is set to 25 per cent. The success rate of these components is very low due to component’s wastage. When the plant temperature is set to 25ºC and RH is set to 45 per cent, the success rate of mounting increased up to 100 per cent. A single component placement success rate with respect to RH is observed for one month. The results are shown in Table IV. It can be seen that the success rate is near 100 per cent when RH and temperature is maintained in production environment. To eliminate the ESD build-up in material and equipment in manufacturing environment humidification is a very effective way. When the RH is kept to 45 per cent, the moisture content of the air is a natural conductor and earths any ESD in environment.

Experimental data have been obtained from Laptop motherboard manufacturing process to validate the effectiveness of proposed approach.

The purpose of this paper is to propose a solution procedure to minimize/eliminate voiding and spattering defects in the assembly of 0201 chip components with micro via‐in pads and 95 wt.%Sn‐5 wt.%Sb solder alloy.

In total, four different micro via‐in pad designs were compared (via‐hole opening size): ultra small via‐in pads (d: 10 μm), small via‐in pads (d: 20 μm), and large via‐in pads (d: 60 μm), as well as designs with no via‐in pads and capped via‐in pads. Two process variables were also evaluated for the goal of achieving a high‐yield assembly solution in micro via‐in pad and lead‐free solder systems. Potential factors, such as the preheat conditions of the reflow profile and stencil aperture size, which might affect voiding and spattering in solder joints with micro via‐in pad, were investigated. Solder voiding frequency and size were also determined from X‐ray inspection and sample cross‐section analysis.

The results indicated that larger via‐holes were seen to create bigger voiding than smaller via‐holes. For smaller via‐holes, spattering is a greater problem than voiding in solder joints. Ultra small via‐in pads generated higher spattering compared to no via‐in pads and capped via‐in pads. Capped via‐in pads exhibited the best results in preventing voiding and flux spattering, and provided a wide process window for the selection of process parameters. It is also indicated that spattering was found to rapidly reduced with both increasing stencil opening size and use of reflow profile with long‐preheat conditions.

The findings provide certain process guidelines for surface‐mount assembly with via‐in pad substrate design. The strategy is to prevent voiding and spattering by adopting capped via‐in pads, if possible, when applying micro via with the 95 wt.%Sn‐5 wt.%Sb solder alloy system.

The purpose of this paper is to study the effect of the electropolishing time of stencil manufacturing parameters and solder‐mask definition methods of PCB pad design parameters on the performance of solder paste stencil printing process for the assembly of 01005 chip components.

During the study, two types of stencils were manufactured for the evaluations: electroformed stencils and electropolished laser‐cut stencils. The electroformed stencils were manufactured using the standard electroforming process and their use in the paste printing process was compared against the use of an electropolished laser‐cut stencil. The electropolishing performance of the laser‐cut stencil was evaluated twice at the following intervals: 100 s and 200 s. The performance of the laser‐cut stencil was also evaluated without electropolishing. An optimized process was established after the polished stencil apertures of the laser‐cut stencil were inspected. The performance evaluations were made by visually inspecting the quality of the post‐surface finishing for the aperture wall and the quality of that post‐surface finishing was further checked using a scanning electron microscope. A test board was used in a series of designed experiments to evaluate the solder paste printing process.

The results demonstrated that the length of the electropolishing time had a significant effect on the small stencil's aperture quality and the solder paste's stencil printing performance. In this study, the most effective electropolishing time was 100 s for a stencil thickness of 0.08 mm. The deposited solder paste thickness was significantly better for the enhanced laser‐cut stencil with electropolishing compared to the conventional electroformed stencils. In this printing‐focused work, print paste thickness measurements were also found to vary across different solder‐mask definition methods of printed circuit board pad designs with no change in the size of the stencil aperture. The highest paste value transfer consistently occurred with solder‐mask‐defined pads, when an electropolished laser‐cut stencil was used.

Due to important improvements in the quality of the electropolished laser‐cut stencil, and based on the results of this experiment, the electropolished laser‐cut stencil is strongly recommended for the solder paste printing of fine‐pitch and miniature components, especially in comparison to the typical laser‐cut stencil. The advantages of implementing a 01005 chip component mass production assembly process include excellent solder paste release, increased solder volume, good manufacture‐ability, fast turnaround time, and greater cost saving opportunities.

The purpose of this paper is to present a novel approach on investigating critical current densities in the solder joints of chip-size surface mounted device (SMD) components. The investigation involves a numerical approach and a physical validation with selected track-to-pad connections and high current loads (CXs).

During the investigations, shape of solder fillets was calculated in Surface Evolver, and then the current densities were calculated accordingly in the given geometry. For the verification, CX tests were performed on joints at elevated temperatures. The joints were qualified with X-ray microscopy, cross-section analysis and shear tests.

This study ascertained that the inhomogeneity in current density depends on the track-to-pad structure of the joint. Also this study found that the heavy CX decreases the mechanical strength, but the degradation does not reach the level of electromigration (EM)-induced voiding.

The heavy CX significantly affects joint reliability and the results point out to EM-induced failure-limitations on printed circuit board (PCB)-based assemblies due to the thermomechanical weakness of the FR4 material.

The experiments investigate current density from a novel aspect on more frequently used small-scale components with different track-to-pad configurations – pointing out possible failure sources.

In surface mount assembly (SMA) process, small components are subjected to high temperature variations, which result in components’ deformation and cracking. Because of this phenomenon, cracks are formed in the body of carbonyl powder ceramic inductor (CPCI) in the preheat and cooling stages of the reflow oven. These cracks become the main cause of board failure in the ageing process. The purpose of this paper is to ascertain the thermal stress, thermal expansion of carbonyl iron ceramics and its effects on crack commencement and proliferation in the preheat stage of reflow oven. Moreover, this paper also categorized and suggested important parameters of reflow profile that could be used to eliminate these thermal shock failures.

In this paper, two different reflow profiles were studied that evaluate the thermal shock of CPCI during varying ΔT at the preheat zone of the reflow oven. In the first profile, the change in temperature ΔT at preheat zone was set to 3.26°C/s, which has resulted in a number of device failures because of migration of micro cracks through the CPCI. In the second profile, this ΔT at preheat stage is minimized to 2.06°C/s that eliminated the thermal stresses; hence, the failure rates were significantly reduced.

TMPC0618H series lead (Pb)-free CPCI is selected for this study and its thermal expansion and thermal shock are observed in the reflow process. It is inferred from the results that high ΔT at preheat zone generates cracks in the carbonyl powder-type ceramics that cause device failure in the board ageing process. Comparing materials, carbonyl powder ceramic components are less resistant to thermal shock and a lower rate of temperature change is desirable.

The proposed study presents an experimental analysis for mitigating the thermal shock defects. The realization of the proposed approach is validated with experimental data from the printed circuit boards manufacturing process.

This paper aims to present a novel approach on investigating critical current densities in the solder joints of chip-size surface-mounted components or device (SMD) components and ball grid array (BGA) lead-free solder joints with the focus of via-in-pad geometries. The investigation involves a numerical approach and a physical validation with selected geometry configurations and high current loads to reveal possible failure sources. The work is a continuation of a previous study.

Current density was investigated using finite element modeling on BGA joints. Dummy BGA components, 0402 and 0603 zero ohm jumper resistors, were used, both in daisy chain setups on standard FR4 printed circuit boards (PCBs). Respective physical loading experiments were set to find effects of elevated current density at hot zones of the joints. Cross-section analysis, scanning electron microscopy and shear force tests were used to analyze the joints.

The findings reveal alterations in the joints, while the current loading is not directly affecting the structure. The modeling reveals the current density map in the selected formations with increased current crowding zones. Overall, the degradation does not reach the level of electromigration (EM)-induced voiding due to the limiting factor of the FR4 substrate.

The heavy current load affects joint reliability, but there are limitations of EM-induced failures on PCB-based assemblies due to the thermomechanical weakness of the FR4 material.

The experiments investigate current density from a novel aspect on frequently used BGA surface mounted components with modeling configurations focusing on possible effects of via-in-pad structure.