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Aims to show that with careful modelling, the fatigue life of solder joints of identical geometry and microstructure can be predicted very accurately (through empirical correlations) under different environmental test or field use conditions. Here, on the TI 144 chip ‐scale package, the empirical correlation for fatigue life developed under thermal cycling conditions is used to predict the life under power cycling. This accurate model has served as the physical basis which in to demonstrate quantitatively the equivalence of thermal cycling and power cycling as valid accelerated life tests. Describes the great importance of spatial refinement, temporal refinement, and accurate boundary conditions, including the often ignored natural convection boundary conditions, and their effect on predicted life.

This paper gives a bibliographical review of the finite element methods (FEMs) applied to the analysis of ceramics and glass materials. The bibliography at the end of the paper contains references to papers, conference proceedings and theses/dissertations on the subject that were published between 1977‐1998. The following topics are included: ceramics – material and mechanical properties in general, ceramic coatings and joining problems, ceramic composites, ferrites, piezoceramics, ceramic tools and machining, material processing simulations, fracture mechanics and damage, applications of ceramic/composites in engineering; glass – material and mechanical properties in general, glass fiber composites, material processing simulations, fracture mechanics and damage, and applications of glasses in engineering.

This paper aims to present a robust prediction method for estimating the quality of electronic products assembled with pin-in-paste soldering technology. A specific board quality factor was also defined which describes the expected yield of the board assembly.

Experiments were performed to obtain the required input data for developing a prediction method based on decision tree learning techniques. A Type 4 lead-free solder paste (particle size 20–38 µm) was deposited by stencil printing with different printing speeds (from 20 mm/s to 70 mm/s) into the through-holes (0.8 mm, 1 mm, 1.1 mm, 1.4 mm) of an FR4 board. Hole-filling was investigated with X-ray analyses. Three test cases were evaluated.

The optimal parameters of the algorithm were determined as: subsample is 0.5, learning rate is 0.001, maximum tree depth is 6 and boosting iteration is 10,000. The mean absolute error, root mean square error and mean absolute percentage error resulted in 0.024, 0.03 and 3.5, respectively, on average for the prediction of the hole-filling value, based on the printing speed and hole-diameter after optimisation. Our method is able to predict the hole-filling in pin-in-paste technology for different through-hole diameters.

No research works are available in current literature regarding machine learning techniques for pin-in-paste technology. Therefore, we decided to develop a method using decision tree learning techniques for supporting the design of the stencil printing process for through-hole components and pin-in-paste technology. The first pass yield of the assembly can be enhanced, and the reflow soldering failures of pin-in-paste technology can be significantly reduced.

This paper aims to present a design methodology to enable product design for ease of assembly. It is corroborated by means of a case study. The methodology is based on standard time data. This enables quick computation of assembly time as well as comparing different design options for ease of assembly.

Component design that is easy to assemble is likely to take less time and vice versa. Assembly time is a function of product design attributes such as geometric shape, weight, center of gravity, type of material, number of fasteners and types of fasteners. The methodology uses standard data to achieve its objective. Numeric scores are developed for each design feature based on the aforementioned design attributes. This enables not only computation of assembly time for a brand new product but also comparison of two or more alternative design configurations from the point of view of ease of assembly.

The value of the system is corroborated by means of case studies of actual product designs. It is demonstrated that changing any of the underlying design attributes (such as type of fastener used, number of fasteners used, material of the component and component shape) is likely to result in changing the amount of time taken to assemble the product. The scoring system facilitates the quick computation of assembly time

The amount of time to assemble a product before the product is ever designed is facilitated by this system. Assembly time is a direct function of product design attributes. Process time is calculated using standard data, specifically, the Methods Time Measurement (MTM) system. This is accomplished by converting design features into time measurement units (TMUs). Assembly cost can then be easily computed by using assembly time as the basis. The computation of assembly time and cost is important inasmuch as its role in influencing productivity. This is of obvious value not only to the designer but the company as a whole.

The purpose of this paper is to describe the behavior of different lead-free solders (95.5Sn3.8Ag0.7Cu, i.e. SAC387 and Sn7In4.1Ag0.5Cu, i.e. SAC-In) in thermomechanically loaded non-collapsible ball grid array (BGA) joints of a low-temperature co-fired ceramic (LTCC) module. The validity of a modified Engelmaier’s model was tested to verify its capability to predict the characteristic lifetime of an LTCC module assembly implementable in field applications.

Five printed wiring board (PWB) assemblies, each carrying eight LTCC modules, were fabricated and exposed to a temperature cycling test over a −40 to 125°C temperature range to determine the characteristic lifetimes of interconnections in the LTCC module/PWB assemblies. The failure mechanisms of the test assemblies were verified using scanning acoustic microscopy, scanning electron microscopy (SEM) and field emission SEM investigation. A stress-dependent Engelmaier’s model, adjusted for plastic-core solder ball (PCSB) BGA structures, was used to predict the characteristic lifetimes of the assemblies.

Depending on the joint configuration, characteristic lifetimes of up to 1,920 cycles were achieved in the thermal cycling testing. The results showed that intergranular (creep) failures occurred primarily only in the joints containing Sn7In4.1Ag0.5Cu solder. Other primary failure mechanisms (mixed transgranular/intergranular, separation of the intermetallic compound/solder interface and cracking in the interface between the ceramic and metallization) were observed in the other joint configurations. The modified Engelmaier’s model was found to predict the lifetime of interconnections with good accuracy. The results confirmed the superiority of SAC-In solder over SAC in terms of reliability, and also proved that an air cavity structure of the module, which enhances its radio frequency (RF) performance, did not degrade the reliability of the second-level interconnections of the test assemblies.

This paper shows the superiority of SAC-In solder over SAC387 solder in terms of reliability and verifies the applicability of the modified Engelmaier’s model as an accurate lifetime prediction method for PCSB BGA structures for the presented LTCC packages for RF/microwave telecommunication applications.

All deep‐groove ball bearings have similar features in geometry, mechanism, and structure. Stiffness of this type of bearings is related to geometry, dimensions, and operating conditions by a very complex, high‐order and coupled‐variable function. This paper has verified that the stiffness function for all deep‐groove ball bearings can be replaced by a back‐propagation neural network (BPNN) which is trained by using some (not all) samples.

In today's electronic package development cycle, activities are managed by multiple participants in the supply chain, which might have different quality and reliability impacts to the end product. As a result, the reliability risk is much higher for companies who do not have insight into and/or control over the products received. The purpose of this paper is to show how design‐for‐reliability (DFR) approaches will come into play to manage the risk.

In this paper, DFR approaches for package development will be discussed from the perspective of the original equipment manufacturers (OEMs). DFR practices through the package development cycle will be described based on key development modules. A case study for flip chip ball gris array package development using an advanced Cu/Low‐k silicon technology will be presented. Key measures to help control the quality and improve the reliability will be presented.

The proposed methodology significantly improves component and package reliability through the engagement in design, manufacturing, assessment and system evaluation.

The paper discusses the research results and the proposed DFR methodology will be helpful for fabless design houses, electronics manufacturing service (EMS) partners in the supply chain, and OEMs to manage the reliability of the products.

The purpose of the present study was to review the thermo-mechanical challenges of reflowed lead-free solder joints in surface mount components (SMCs). The topics of the review include challenges in modelling of the reflow soldering process, optimization and the future challenges in the reflow soldering process. Besides, the numerical approach of lead-free solder reliability is also discussed.

Lead-free reflow soldering is one of the most significant processes in the development of surface mount technology, especially toward the miniaturization of the advanced SMCs package. The challenges lead to more complex thermal responses when the PCB assembly passes through the reflow oven. The virtual modelling tools facilitate the modelling and simulation of the lead-free reflow process, which provide more data and clear visualization on the particular process.

With the growing trend of computer power and software capability, the multidisciplinary simulation, such as the temperature and thermal stress of lead-free SMCs, under the influenced of a specific process atmosphere can be provided. A simulation modelling technique for the thermal response and flow field prediction of a reflow process is cost-effective and has greatly helped the engineer to eliminate guesswork. Besides, simulated-based optimization methods of the reflow process have gained popularity because of them being economical and have reduced time-consumption, and these provide more information compared to the experimental hardware. The advantages and disadvantages of the simulation modelling in the reflow soldering process are also briefly discussed.

This literature review provides the engineers and researchers with a profound understanding of the thermo-mechanical challenges of reflowed lead-free solder joints in SMCs and the challenges of simulation modelling in the reflow process.

The unique challenges in solder joint reliability, and direction of future research in reflow process were identified to clarify the solutions to solve lead-free reliability issues in the electronics manufacturing industry.

The purpose of this paper is to describe a novel methodology for predicting reliability for consumer electronics or any other hardware systems that experience a complex lifecycle environmental profile.

This Physics-of-Failure–based three-step methodology can be used to predict the degradation rate of a population using a Monte Carlo approach. The three steps include: using an empirical equation describing the degradation of a performance metric, a degradation consistency condition and a technique to account for cumulative degradation across multiple life-cycle stress conditions (e.g. temperature, voltage, mechanical load, etc.).

Two case studies are provided to illustrate the methodology including one related to repeated touch-load induced artifacts for displays.

This novel methodology can be applied to a wide range of applications from mechanical systems to electrical circuits. The results can be fed into the several stages of engineering validation to speed up product qualification.

The purpose of this paper is to study the thermal warpage of a plastic ball grid array (PBGA) mounted on a printed circuit board (PCB) during the reflow process.

A thermal-mechanical coupling method that used finite-element method software (ANSYS 13.1) was performed. Meanwhile, a shadow moiré apparatus (TherMoiré PS200) combined with a heating platform was used for the experimental measurement of the warpage of PBGA according to the JEDEC Standard.

The authors found that the temperature profiles taken from the simulated results and experimental measurement are consistent with each other, only with a little and acceptable difference in the maximum temperatures. Furthermore, the maximum warpage measurements during the reflow process are 0.157 mm and 0.149 mm for simulation and experimental measurements, respectively, with a small 5.37 per cent difference. The experimental measurement and simulated results are well correlated. Based on the validated finite element model, two factors, namely, the thickness and dimension of PCB, are explored about their effect on the thermal warpage of PBGA mounted on PCB during the reflow process.

The paper provides a thorough parametrical study of the thermal warpage of PBGA mounted on PCB during the reflow process.

The findings in this paper illustrate methods of warpage study by combination of thermal-mechanical finite element simulation and experimental measurement, which can provide good guidelines of the PCB design in the perspective of thermal warpage during the reflow process.