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This paper describes the tests performed to evaluate the solder capillary action which occurs within a gap between two solderable surfaces during soldering. The goal was to determine the optimal gap distance for maximum capillary flow in the attainment of hermetic solder joints capable of withstanding extreme temperature cycles and various mechanical shocks. One of the test conditions was arranged so that the gap thicknesses would vary while the width of the gaps remained constant. In a second condition, the gap thicknesses remained constant while the gap widths varied. Three plating designs were evaluated. They were nickel plating; nickel overplated with gold; and nickel, copper intermediate, with tin overplate. The capillary action of all three plating combinations deposited onto aluminium specimens, with the gap configurations previously described, was evaluated. The capillary results were measured with X‐ray and microstructural data. End use solder joint designs were determined from the capillary results. These designs are shown and they include the best plating design for the application. In addition, an unexpected result was obtained that is useful for testing the solderability of all finishes—the Configured Capillary Solderability Test.

The purpose of this paper is to investigate the effect of typical morphologies of Au-Sn IMCs (intermetallic compounds) at the interfaces of solder and pads on shear properties of laser reflowed micro-solder joints.

Sn-2.0Ag-0.75Cu-3.0Bi (SnAgCuBi) solder balls (120 μm in diameter), pads with 0.1, 0.5, 0.9 or 4.0 μm thickness of Au surface finish, and different laser input energies were utilized to fabricate micro-solder joints with Au-Sn IMCs having different typical morphologies. The joints were performed by a shear test through a DAGE bond test system. Fracture surfaces of the joints were analyzed by scanning electron microscopy and energy-dispersive X-ray spectrometry to identify fracture modes and locations.

Morphologies of Au-Sn IMCs would affect shear properties of the joints remarkably. When needle-like AuSn4 IMCs formed at the interfaces of solder and pads, almost entire surfaces presented the manner of ductile fracture. Moreover, shear forces of this kind of solder joints were higher than those of joints without Au-Sn IMCs or with a nearly continuous/continuous Au-Sn IMCs layer. The reason was that the shear performance of the solder joints with needle-like AuSn4 IMCs was enhanced by an interlocking effect between solder and needle-like AuSn4 IMCs. As a nearly continuous or continuous Au-Sn IMCs layer formed, the fracture surfaces presented more character of brittle than ductile fracture. However, if an Au layer still remained under Au-Sn IMCs, the shear performance of the joints would be enhanced.

The results in this study can be used to optimize microstructures and shear properties of laser reflowed micro-solder joints.

The purpose of this paper is to investigate oxidation and the Au‐Sn reaction of laser reflowed (LR) micro‐solder joints when different protective atmospheres were applied.

A N2 atmosphere at room temperature, 60°C, 100°C and 130°C, or an air atmosphere at room temperature were utilized in this study. The solder balls were composed of Sn‐2.0Ag‐0.75Cu‐3.0Bi, and 120 μm in diameter. The surface finish of one pad of the joints was 4.0 μm Au/0.1 μm NiFe/0.01 μm Ta, another pad was made of Cu plated with 3.0 μm Au. The laser reflow process time was controlled to within 10 ms. Auger Electron Spectroscopy (AES) was used to identify the oxidation condition of LR solder joints with or without protection from a N2 atmosphere at room temperature. The appearance and cross‐sections of the joints protected by a N2 atmosphere at different temperatures were evaluated using SEM analysis.

Oxidation of LR solder joints from an air atmosphere was extremely severe, and the surfaces of solder were rough as compared with joints protected by a N2 atmosphere. Au‐rich phases and needle‐like AuSn4 intermetallic compounds (IMCs) formed at the interfaces of the solder and the pads. As the temperature of the N2 atmosphere was increased above 100°C, almost all of the Au‐rich phases disappeared. More needle‐like AuSn4 IMCs formed at the interfaces, as compared with that in joints protected by a N2 atmosphere at room temperature and 60°C. In addition, the orientation of the IMCs had clearly changed.

The results may provide a guide for controlling oxidation and the Au‐Sn reaction of micro‐solder joints during the LR process, and improving the properties of joints between solder and pads with Au surface finishes, by regulating the protective atmosphere.

The effect of gold (Au) on the reliability of 0.65 mm pitch surface mount solder joints between plastic quad flat packs and Cu‐Ni‐Au FR‐4 printed circuit boards was investigated. Cu‐Ni‐Au is a desirable printed circuit board finish for multi‐chip modules or printed circuit boards that would otherwise require a selective Au finish, for example for edge connectors or wire bondable parts. However, Au is known to embrittle solder when it is present in sufficiently high concentrations, creating a concern that solder joint fatigue life in service will also be adversely affected. This paper reports the results of mechanical shock, mechanical vibration and thermal cycling testing of fine pitch solder joints containing varying amounts of Au. Tests were performed on as‐soldered joints and on joints that had been heat‐treated to evolve the microstructure towards equilibrium. The tests were designed to accelerate in‐service conditions in a typical industrial environment. Under these conditions, the Au concentrations tested did not promote solder joint failures. Microstructural characterisation of the distribution and morphology of the Au‐, Ni‐ and Cu‐Sn intermetallics in the joint before and after accelerated testing was also performed. On the basis of these observations it is recommended that the Au concentration in solder joints between plastic quad flat packs and Cu‐Ni‐Au FR‐4 printed circuit boards not exceed 3.0 wt.%.

Some special characteristics of solder joints made between surface mounted electronic components and circuit boards as compared with conventional wave soldered lead‐through joints are discussed, and the types of defects to be expected are listed. Following a description of metallographic methods suitable for examining surface soldered joints, some metallographic features, both normal and defective, of solder joints between chip carriers and substrates are illustrated and discussed. The features include porosity, intermetallic phases, solder microstructure, and low cycle fatigue cracking resulting from temperature cycling.

When implementing chip‐on‐board (COB), the surface finish on the printed wiring board needs to be chosen with several key considerations in mind. The choice of bonding technology dominates the selection of finishes. Wire bonding, tape automated bonding and flip chip assembly all have their own special requirements for effective assembly. The considerations must also examine the presence of intermetallics in the solder joints. These issues are discussed along with several advanced techniques for applying solder coating and organic solderability preservatives on bare copper PWBs.

Tape automated bonding (TAB) is a suitable technology for assembling ICs with a high number of l/Os. The gang bonding process usually applied requires increasing thermode forces for chips with high lead counts and narrow tolerances regarding thermode parallelism and planarity. Due to the high bonding pressure, TC bonding of Au bumps to Au‐plated tapes becomes critical for these applications. In order to avoid damage to the pad structure an inner lead bonding (ILB) process with reduced pressure is required. A tape metallisation of 0.5–1.0 µm Sn is not sufficient for a significant reduction of thermode pressure. As an alternative, the application of an eutectic Au‐Sn cushion which is deposited on top of the bumps is presented. A modified bumping process was developed for the deposition of the solder bumps. Soldering of the Au‐Sn bumps to a Au‐plated tape was performed successfully by two techniques: thermode gang bonding and laser soldering. Bond parameters and tin layer thickness were optimised. Reliability investigations by thermal ageing were performed. The special metallurgical aspects of the system were investigated with a microprobe.

Tape Automated Bonding (TAB) is a modern technology which meets the requirements for micro‐connecting VLSI circuits. The limitations for gang bonding chips with high lead counts and reduced pitches are increased bond forces and induced mechanical stress. Laser soldering is an alternative for such contacts. Because microjoining of surfaces occurs via thermal energy from the laser beam, no mechanical pressure is necessary. Due to the optical properties of the laser beam and the possibility to reduce the laser spot, soldering of small pitches is possible. The results of TAB inner lead bonding with a pulsed Nd:YAG laser are presented. Tapes with three metallisations (Sn, Ni‐Sn and Au) were laser soldered to bumps consisting of gold and gold‐tin. The pull strength of laser soldered TAB‐contacts was optimised by variation of laser power and reliability investigations were performed. The metallurgy of laser soldering is different and more critical to long term reliability than that of gang bonded ILB‐contacts, even if identical tape and bump materials are applied. An accumulation of eutectic 80/20 Au‐Sn solder in the bonded interface results in a strong degradation due to Kirkendall pore formation in the ternary Cu‐Sn‐Au system. The application of a tape with a diffusion barrier of Ni inhibits this effect. But during thermal ageing these contacts show a strong degradation of pull forces which is attributed to the formation of brittle intermetallic compounds of the elements Ni, Sn and Au in the contact area. Laser soldering of Au‐plated tapes to Au‐Sn solder bumps is possible. The contacts show optimal pull forces and a minimal degradation after thermal ageing. This is attributed to the formation of an intermetallic compound with a high stability. The Zeta phase acts as a diffusion barrier between the copper lead and the eutectic Au‐Sn solder.

The purpose of this paper is to investigate the morphology evolution and the composition transformation of Au-Sn intermetallic compounds (IMCs) of the new Au/Sn-5Sb-1Cu-0.1Ni-0.1Ag/(Au)Ni solder joint during the high temperature aging.

Sn-5Sb-1Cu-0.1Ni-0.1Ag solder balls (500 µm in diameter), heat sink with structure of 7.4 µm Au layer on 5 µm Ni-plated Cu alloy and Si chip with 5.16 µm plated Au were used to fabricate micro-solder joints. The joints were performed in a furnace at 150°C for 150, 250 and 350 h aging. The samples were polished and deep etched before analyzed by metallographic microscope and scanning electron microscopy, respectively. Energy dispersive x-ray spectroscopy was used to identify the composition of the IMCs.

ß-(Au,Ni,Cu)₁₀Sn phase is formed during the soldering process. The IMCs evolution has two periods during the aging. The first is the ξ-(Au,Ni,Cu)₅Sn, ξ-(Au,Cu)₅Sn and δ-AuSn were formed and grew to form a full-compound joint after about 150 h aging. The second is the conversion of the full-compound joint. The IMCs converted to ξ′ phase when the aging time extends to 250 h, and transformed to ε-(Au,Ni,Cu)Sn₂ and η-(Au,Ni,Cu)Sn₄ after 350 h aging. The thicker gold layer and thinner solder joint can promote the growth of the IMCs. ß-(Au,Ni,Cu)₁₀Sn emerged in Au/SnSb-CuNiAg/(Au)Ni in this research, which is not usually found.

The results in this study have a significant meaning for the application of the new Sn-5Sb-1Cu-0.1Ni-0.1Ag in harsh conditions.

Metallographic sections are an indispensable tool in the assessment and failure analysis of solder joints, as surface appearance is an unreliable guide to their internal state. This paper outlines methods for the preparation of sections through solder joints, and gives some guidelines for their interpretation. Finally, some typical features and defects are discussed.