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The purpose of this paper is to investigate the effect of typical morphologies of Au-Sn IMCs (intermetallic compounds) at the interfaces of solder and pads on shear properties of laser reflowed micro-solder joints.

Sn-2.0Ag-0.75Cu-3.0Bi (SnAgCuBi) solder balls (120 μm in diameter), pads with 0.1, 0.5, 0.9 or 4.0 μm thickness of Au surface finish, and different laser input energies were utilized to fabricate micro-solder joints with Au-Sn IMCs having different typical morphologies. The joints were performed by a shear test through a DAGE bond test system. Fracture surfaces of the joints were analyzed by scanning electron microscopy and energy-dispersive X-ray spectrometry to identify fracture modes and locations.

Morphologies of Au-Sn IMCs would affect shear properties of the joints remarkably. When needle-like AuSn4 IMCs formed at the interfaces of solder and pads, almost entire surfaces presented the manner of ductile fracture. Moreover, shear forces of this kind of solder joints were higher than those of joints without Au-Sn IMCs or with a nearly continuous/continuous Au-Sn IMCs layer. The reason was that the shear performance of the solder joints with needle-like AuSn4 IMCs was enhanced by an interlocking effect between solder and needle-like AuSn4 IMCs. As a nearly continuous or continuous Au-Sn IMCs layer formed, the fracture surfaces presented more character of brittle than ductile fracture. However, if an Au layer still remained under Au-Sn IMCs, the shear performance of the joints would be enhanced.

The results in this study can be used to optimize microstructures and shear properties of laser reflowed micro-solder joints.

The purpose of this paper is to investigate the morphology evolution and the composition transformation of Au-Sn intermetallic compounds (IMCs) of the new Au/Sn-5Sb-1Cu-0.1Ni-0.1Ag/(Au)Ni solder joint during the high temperature aging.

Sn-5Sb-1Cu-0.1Ni-0.1Ag solder balls (500 µm in diameter), heat sink with structure of 7.4 µm Au layer on 5 µm Ni-plated Cu alloy and Si chip with 5.16 µm plated Au were used to fabricate micro-solder joints. The joints were performed in a furnace at 150°C for 150, 250 and 350 h aging. The samples were polished and deep etched before analyzed by metallographic microscope and scanning electron microscopy, respectively. Energy dispersive x-ray spectroscopy was used to identify the composition of the IMCs.

ß-(Au,Ni,Cu)₁₀Sn phase is formed during the soldering process. The IMCs evolution has two periods during the aging. The first is the ξ-(Au,Ni,Cu)₅Sn, ξ-(Au,Cu)₅Sn and δ-AuSn were formed and grew to form a full-compound joint after about 150 h aging. The second is the conversion of the full-compound joint. The IMCs converted to ξ′ phase when the aging time extends to 250 h, and transformed to ε-(Au,Ni,Cu)Sn₂ and η-(Au,Ni,Cu)Sn₄ after 350 h aging. The thicker gold layer and thinner solder joint can promote the growth of the IMCs. ß-(Au,Ni,Cu)₁₀Sn emerged in Au/SnSb-CuNiAg/(Au)Ni in this research, which is not usually found.

The results in this study have a significant meaning for the application of the new Sn-5Sb-1Cu-0.1Ni-0.1Ag in harsh conditions.

The purpose of this paper is to investigate oxidation and the Au‐Sn reaction of laser reflowed (LR) micro‐solder joints when different protective atmospheres were applied.

A N2 atmosphere at room temperature, 60°C, 100°C and 130°C, or an air atmosphere at room temperature were utilized in this study. The solder balls were composed of Sn‐2.0Ag‐0.75Cu‐3.0Bi, and 120 μm in diameter. The surface finish of one pad of the joints was 4.0 μm Au/0.1 μm NiFe/0.01 μm Ta, another pad was made of Cu plated with 3.0 μm Au. The laser reflow process time was controlled to within 10 ms. Auger Electron Spectroscopy (AES) was used to identify the oxidation condition of LR solder joints with or without protection from a N2 atmosphere at room temperature. The appearance and cross‐sections of the joints protected by a N2 atmosphere at different temperatures were evaluated using SEM analysis.

Oxidation of LR solder joints from an air atmosphere was extremely severe, and the surfaces of solder were rough as compared with joints protected by a N2 atmosphere. Au‐rich phases and needle‐like AuSn4 intermetallic compounds (IMCs) formed at the interfaces of the solder and the pads. As the temperature of the N2 atmosphere was increased above 100°C, almost all of the Au‐rich phases disappeared. More needle‐like AuSn4 IMCs formed at the interfaces, as compared with that in joints protected by a N2 atmosphere at room temperature and 60°C. In addition, the orientation of the IMCs had clearly changed.

The results may provide a guide for controlling oxidation and the Au‐Sn reaction of micro‐solder joints during the LR process, and improving the properties of joints between solder and pads with Au surface finishes, by regulating the protective atmosphere.

This study aims to investigate the thermal fracture mechanism of moisture-preconditioned SAC305 ball grid array (BGA) solder joints subjected to multiple reflow and thermal cycling.

The BGA package samples are subjected to JEDEC Level 1 accelerated moisture treatment (85 °C/85%RH/168 h) with five times reflow at 270 °C. This is followed by multiple thermal cycling from 0 °C to 100 °C for 40 min per cycle, per IPC-7351B standards. For fracture investigation, the cross-sections of the samples are examined and analysed using the dye-and-pry technique and backscattered scanning electron microscopy. The packages' microstructures are characterized using an energy-dispersive X-ray spectroscopy approach. Also, the package assembly is investigated using the Darveaux numerical simulation method.

The study found that critical strain density is exhibited at the component pad/solder interface of the solder joint located at the most distant point from the axes of symmetry of the package assembly. The fracture mechanism is a crack fracture formed at the solder's exterior edges and grows across the joint's transverse section. It was established that Au content in the formed intermetallic compound greatly impacts fracture growth in the solder joint interface, with a composition above 5 Wt.% Au regarded as an unsafe level for reliability. The elongation of the crack is aided by the brittle nature of the Au-Sn interface through which the crack propagates. It is inferred that refining the solder matrix elemental compound can strengthen and improve the reliability of solder joints.

Inspection lead time and additional manufacturing expenses spent on investigating reliability issues in BGA solder joints can be reduced using the study's findings on understanding the solder joint fracture mechanism.

Limited studies exist on the thermal fracture mechanism of moisture-preconditioned BGA solder joints exposed to both multiple reflow and thermal cycling. This study applied both numerical and experimental techniques to examine the reliability issue.

Laser soldering has attracted attention as an alternative soldering process for microsoldering due to its localized and noncontact heating, a rapid rise and fall in temperature, fluxless and easy automation compared to reflow soldering.

In this study, the metallurgical and mechanical properties of the Sn3.0Ag0.5Cu/Ni-P joints after laser and reflow soldering and isothermal aging were compared and analyzed.

In the as-soldered Sn3.0Ag0.5Cu/Ni-P joints, a small granular and loose (Cu,Ni)6Sn5 intermetallic compound (IMC) structure was formed by laser soldering regardless of the laser energy, and a long and needlelike (Cu,Ni)6Sn5 IMC structure was generated by reflow soldering. During aging at 150°C, the growth rate of the IMC layer was faster by laser soldering than by reflow soldering. The shear strength of as-soldered joints for reflow soldering was similar to that of laser soldering with 7.5 mJ, which sharply decreased from 0 to 100 h for both cases and then was maintained at a similar level with increasing aging time.

Laser soldering with certain energy is effective for reducing the thickness of IMCs, and ensuring the mechanical property of the joints was similar to reflow soldering.

This paper aims to investigate the effect of solder alloying with a small amount of La and Y on bond formation with the Si and Cu substrates.

Bi₂La and Bi₂Y solders were studied. Soldering was performed using a fluxless method in air and with ultrasonic activation.

It was found that in the process of ultrasonic soldering, the La and Y were distributed at the interface with Si and Cu substrates, which enhanced the bond formation. Addition of La or Y elements in a Bi-based solder also ensured wetting of non-metallic materials such as Si, Al₂O₃ and SiC ceramics.

The addition of lanthanides offers a method for ensuring wetting of non-metallic materials. The bond with Si was of an adhesive character without the formation of a new contact interlayer. This resulted in lower shear strength of the bond with Si (8-10 MPa). The shear strength of the bond with a Cu substrate was 22-30 MPa.

The mechanical properties of Sn/Ag/Cu solder joints in combination with different component lead coating materials (Ni/Pd/Au, Sn/15 per cent Pb, Sn/2 per cent Bi, and Sn) are studied in this work using a lead pull test and free fall drop test. The results of this study show that the Sn/2 per cent Bi coated components provide the best performance under the drop impact loading followed by the Sn/15 per cent Pb, Sn and Ni/Pd/Au coated components. Failure modes and the structure of the coating surfaces were examined from cross‐sectioned samples using a scanning electron microscope. Furthermore, the wetting of the leads by the solder and thickness of the IMC layers were studied.

During the last few years an increasing number of flip‐chip (FC) interconnection technologies have emerged. While flip‐chip assembly offers many advantages compared with conventional packaging techniques, several aspects prevent this technology from entering the high volume market. Among these are the availability of bumped chips and the costs of the substrates, i.e., ceramic substrates with closely matching coefficient of thermal expansion (CTE) to the chip, in order to maintain high reliability. Only recently, with the possibility of filling the gap between chip and organic substrate with an encapsulant, was the reliability of flip‐chips mounted on organic substrates significantly enhanced. This paper presents two approaches to a fluxless process, one based on soldering techniques using Au‐Sn metallurgy and the other on adhesive joining techniques. Soldering is performed with a thermode and with a laser based system. For both of these FC‐joining processes, alternative bump mettallurgies based on electroplated gold, electroplated gold‐tin, mechanical gold and electroless nickel gold bumps are applied.

This paper aims to identify a variety of binary system solders by alloying, and relevantly derive multiple system Pb-free solders from the former, attempting to replace the high temperature Sn-Pb solder.

The basis of the paper is the synthesis of previous studies. In terms of some binary high temperature solder alloys, such as Au-20Sn, Bi-2.5Ag, Sn-5Sb, Au-12.5Ge, Zn-6Al and Zn-Sn, taking the alloy phase diagram as the starting point, the melting characteristics, microstructure, mechanical properties, wetting ability and reliability of solder joint are analysed and the prospect is consequently indicated.

Based on the analysis of the six groups of Pb-free solders, the present binary system solder alloys, from the perspective of melting properties, mechanical properties, soldering or reliability of solder joint, rarely meet the comprehensive requirements of replacing the high-temperature Sn-Pb solder. It is assumed to be a solution that multiple-system Pb-free solders derive from a variety of binary system solders by means of alloying. The future development of high temperature Pb-free solder may focus on some factors such as physical properties, mechanical properties, processing, reliability of solder joint, environmental performance and expense.

The paper concentrates on the issue of Pb-free solders at high temperature. From a specific perspective of binary system solders, the presently available Pb-free solders are suggested from the starting point of the alloy phase diagram and the prospect of alternatives of Sn-Pb solders at high temperature are indicated.

This paper aims to demonstrate low-temperature bonding for piezoelectric materials at temperatures well below the relevant Curie temperatures so as to avoid depolarization of the piezoelectric material during bonding.

Au-coated test samples of lead zirconate titanate (PZT) are bonded to a WC-based resonant backing layer with In–Bi eutectic material in which the In–Bi metal system is a preform or thin, evaporated layers. The bonded samples are characterized using electrical impedance spectroscopy and cross-section microscopy. The first technique verifies the integrity of polarization and reveals the quality of the bondline in a non-destructive manner, particularly looking for voids and delaminations. The latter technique is destructive but gives more precise information and an overview of the structure.

Successful low-temperature (115°C) bonding with intact PZT polarization was demonstrated. The bondlines show a layered structure of Au/Au–In intermetallic compounds (with Bi inclusions)/Au, capable of withstanding temperatures as high as 271°C before remelting occurs. For bonded samples using In–Bi preform, repeatable bonds of high quality (very little voiding) were obtained, but the bonding time is long (1 h or more). For bonded samples using evaporated thin films of In–Bi, bonding can be performed in 30 min, but the process needs further optimization to be repeatable.

Low-temperature solid-liquid interdiffusion (SLID) bonding is a novel technique, merging the fields of low-temperature solder bonding with the SLID/transient liquid phase (TLP) approach, which is normally used for much higher temperatures.