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The electronics industry will implement lead‐free soldering in the near future. Lead‐free implementation steps are divided into lead‐free process and lead‐free product. The eutectic Sn/Ag/Cu alloy seems to have become the most widely used alloy in the implementation of lead‐free processes. In this study, the requirements for component placement are discussed from the lead‐free process point of view. Experiments concerning the self‐alignment capability and tack strength of both tin‐lead and lead‐free solder pastes are presented. According to the results, a bigger variation in self‐alignment capabilities can be expected when using a lead‐free paste. The paste properties affecting the self‐alignment mechanism and tack strength are also discussed.

Over the last few years, the emergence of new European draft legislation has focussed electronics industry attention on the likely ultimate proscription of lead in electronics assembly. Much work has already been undertaken to identify the possible alternatives to conventional tin‐lead solders and to evaluate their performance benefits and limitations in comparison with the traditional materials. Although, some companies are already offering products manufactured using lead‐free products, there is still a widespread lack of activity in many areas. With this none‐too‐distant deadline rapidly approaching, Envirowise has sponsored this paper as part of its coordinated activities to assist the UK electronics industry and to promote environmental efficiency and best practice. This paper details the current situation with respect to the drivers towards the adoption of lead‐free assembly before giving an overview of the current situation. This paper concludes with details of sources of further information.

This paper will describe tests of the interconnect reliability of BGA components with tin‐lead bumps soldered with lead‐free solder paste during temperature cycling. Tin‐lead BGA components soldered with tin‐lead solder paste and lead‐free BGA components soldered with lead‐free solder paste were used as a reference. The lead‐free solder used was eutectic tin‐silver‐copper. Two kinds of surface finishes were used on the printed circuit boards (PCB), an immersion gold over electroless nickel and an organic solderability preservative. The test PCBs were temperature‐cycled for 2500 cycles in the range of −40°C to +125°C and they were continuously electrically monitored during the cycling. The results of the temperature cycling test showed that lead‐ containing BGA components soldered with lead‐free solder paste don't show any serious reliability risks and can actually withstand temperature cycling stresses better than entirely lead‐free BGA assemblies.

This paper will review the challenges brought by lead‐free soldering and some preliminary experimental evaluation results will be discussed. The initial results show that the lead‐free soldering process with 260°C reflow peak temperature does not directly cause failures for bismaleimide‐triazine (BT)‐based fine pitch ball grid array (FPBGA) packages. However, the strict lead‐free soldering condition could degrade the integrity of weak interface joints and potentially damage the package in subsequent unbiased highly accelerated stress test (unbiased HAST) evaluation. The impacts of lead‐free soldering with high reflow temperature on concurrent available electronics components could be more severe than previously believed. In the future, new materials and design concepts should be applied to enhance the package reliability under strict lead‐free soldering conditions.

To give an overview of the issues encountered, and changes that need to be made in the various types of soldering process when converting them from conventional to lead‐free assembly.

This paper has been written to provide a review of the lead‐free reflow, wave and hand soldering processes. Problem areas highlighted and methods for adjusting and optimising each type of soldering process for compatibility with lead‐free solders are described.

The move to lead‐free soldering in electronics assembly can lead to a number of issues that affect process performance, yields and reliability. Problems that are sometimes encountered with conventional lead‐bearing solders can exacerbated when moving to lead‐free. Many of the issues are associated with the higher melting points of the recommended lead‐free solders. Fortunately, these issues are now well known and, with care and attention to process optimisation, they can largely be avoided.

The value of the paper lies in its ability to provide information on the types of problems and issues encountered when moving to lead‐free solders and the advice it gives on how to avoid them. It also describes how to convert the various lead‐free soldering processes used in PCB assembly using a range of measures that can minimise defects, avoid common problems and optimise yields. Sources of additional assistance are also identified.

The lead‐free soldering process has been confounding the PWB fabricators when they set out to select the right materials for lead‐free soldering. This paper discusses the compatibility of currently available laminate materials for lead‐free assembly.

This paper has been written to provide a review of material characteristics. Problem areas are highlighted and methods for choosing each type of material for compatibility with lead‐free soldering process are described.

When lead is banned and taken out of the traditional tin‐lead solder, there are other metal alternatives to alloy with tin such as silver, bismuth, copper, and zinc, etc. The melting point of these lead‐free alloys is higher than the conventional tin‐lead solder. Consequently, the reflow temperature of the lead‐free solder can now reach 240‐250°C. As the reflow temperature is elevated, it will pose a severe reliability challenge to the laminate materials. The compatibility of currently available commercial laminate materials for lead‐free assembly are discussed in this paper.

The value of this paper is that it provides information and solutions relating to the selection of the most appropriate materials for use in lead‐free soldering and assembly.

The purpose of this paper is to describe the board level reliability test results of four IC packages with lead‐free balls/platings, soldered with lead‐free solder paste, during thermal cycling. The board level reliability test results of tin‐lead balled/plated packages soldered with lead‐free solder paste have also been included for comparison.

Four different packages, i.e. ball grid array (BGA), chip scale package (CSP), quad flat package (QFP) and thin small outline package (TSOP), were assembled on a test printed circuit board (PCB) as the test vehicle. Lead‐free and tin‐lead BGA/CSP packages were equipped with Sn‐3.0Ag‐0.5Cu and Sn‐37Pb solder balls, respectively. The lead‐frames of lead‐free QFP/TSOP leaded‐packages were plated with Sn‐58Bi and those of tin‐lead QFP/TSOP leaded‐packages, Sn‐37Pb. The lead‐free solder paste used in this study was Sn‐3.0Ag‐0.5Cu. Two kinds of surface finishes, immersion gold over electroless nickel (Au/Ni) and organic solderability preservative, were used on the PCBs. The test PCBs were thermal cycled 5,000 times within the temperature range of −40 to 125°C and electrically monitored during the thermal cycling.

It was found that the tin‐lead balled/plated BGAs, CSPs, QFPs and TSOPs soldered with lead‐free solder paste showed serious board level reliability risks as their abilities to withstand thermal cycling stresses are much weaker than those of entirely lead‐free assemblies. Neither package nor surface finish was found to have any effects on the board level reliability of test vehicles with lead‐free balled/plated BGAs, CSPs, QFPs and TSOPs. Metallographic examinations were conducted to investigate the effect of thermal cycling on the failure modes of solder joints.

The paper is of value by contributing to research in the use of lead‐free solder paste with lead‐containing packages in the industry. Currently, there is a deficiency of knowledge in this area.

Eliminating lead in electronics is an environmentally considerate approach that is made prior to manufacture. Recently enacted legislation encourages increased recycling of electrical and electronic products. However, recycling is typically an end‐of‐use action occurring just before final disposal. From an environmentally‐considerate perspective, lead elimination or replacement is a better approach. Short of having a definitive study to follow, industry, regulators, and consumers are proceeding with the change. Various lead‐free alloys have been tested and used for electronic components and assemblies. There are many replacements for eutectic tin‐lead solder, and alloys containing tin, silver, copper, and bismuth have been used successfully. Assessing how the electronics industry is addressing the change to lead‐free materials and processes requires answers to various questions. These questions regard the effects of changes to electronic products and their processes. What drives lead‐free migration, how processes can develop, and when products will be available are issues which define the assessment.

The High Density Packaging Users Group conducted a substantial study of the solder joint reliability of high‐density packages using lead‐free solder. The design, material, and assembly process aspects of the project are addressed in this paper. The components studied include many surface mount technology package types, various lead, and printed circuit board finishes and paste‐in‐hole assembly.

This paper presents the analysis of information collected from numerous patent searches on lead‐free alloys. The significance of claim structure and content is discussed in view of the growing number of lead‐free patents. Patent analysis software was developed to effectively compare over 350 lead‐free alloy patents. A case study was conducted to assess Sn‐Ag‐Cu and special purpose lead‐free candidate alloy intellectual property. The results show that there are a number of patents and patent applications that may affect the use of “popular” Sn‐Ag‐Cu formulations.