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1 – 10 of 77

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Article

Publication date: 1 December 2001

IMEC and LUC license in-situ test methodology to XPEQT

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39

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Microelectronics International, vol. 18 no. 3

Type: Research Article

DOI:

ISSN: 1356-5362

Keywords

IMEC

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Article

Publication date: 1 August 2001

Hitachi joins IMEC's high-k industrial affiliation program

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37

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Microelectronics International, vol. 18 no. 2

Type: Research Article

DOI:

ISSN: 1356-5362

Keywords

Hitachi
IMEC

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Article

Publication date: 1 August 2001

Infineon Technologies extends its wide-ranging research collaboration with IMEC on basic technologies for next semiconductor generations

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47

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Microelectronics International, vol. 18 no. 2

Type: Research Article

DOI:

ISSN: 1356-5362

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Article

Publication date: 1 April 2002

IMEC opens business development office in China

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43

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Microelectronics International, vol. 19 no. 1

Type: Research Article

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ISSN: 1356-5362

Keywords

IMEC
China

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Article

Publication date: 1 April 2001

IMEC announces MEMS design and technology agreement with INTI-CITEI, Argentina

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39

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Microelectronics International, vol. 18 no. 1

Type: Research Article

DOI:

ISSN: 1356-5362

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Article

Publication date: 1 August 2003

IMEC begins construction of 300 mm research lab

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38

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Microelectronics International, vol. 20 no. 2

Type: Research Article

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ISSN: 1356-5362

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Article

Publication date: 1 December 2000

SEMATECH forges partnership with IMEC

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49

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Microelectronics International, vol. 17 no. 3

Type: Research Article

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ISSN: 1356-5362

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Article

Publication date: 26 April 2013

Imec and Synopsys expand FinFET collaboration to 10 nm geometry

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66

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Microelectronics International, vol. 30 no. 2

Type: Research Article

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ISSN: 1356-5362

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Article

Publication date: 1 August 2001

IMEC and Sony sign research collaboration programs on fundamental technologies for next-generation semiconductor systems and devices

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148

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Microelectronics International, vol. 18 no. 2

Type: Research Article

DOI:

ISSN: 1356-5362

Keywords

IMEC
Sony

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Article

Publication date: 1 December 2000

IMEC develops innovative fast-drying methods for single-wafer wet cleaning

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160

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Microelectronics International, vol. 17 no. 3

Type: Research Article

DOI:

ISSN: 1356-5362

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