IMEC and LUC license in-situ test methodology to XPEQT

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 December 2001




(2001), "IMEC and LUC license in-situ test methodology to XPEQT", Microelectronics International, Vol. 18 No. 3.



Emerald Group Publishing Limited

Copyright © 2001, MCB UP Limited

IMEC and LUC license in-situ test methodology to XPEQT

IMEC and LUC license in-situ test methodology to XPEQT

Keyword: IMEC

IMEC, and ICT R&D, and LUC, Limburgs Universitair Centrum, have signed an exclusive license agreement with XPEQT AG, a Swiss based equipment manufacturer with subsidiaries in Belgium and Bulgaria, on its in-situ test methodology for reliability testing and for use during burn-in.

XPEQT will produce and commercialize the reliability test equipment for testing the lifetime, lifetime modeling and measuring degradation kinetics of electronic components, which was jointly developed by IMEC and LUC. The equipment employs electromigration, hot carrier degradation and time dependent dielectric breakdown mechanisms and also allows performing lifetime tests during burn-in.

As part of the agreement, XPEQT obtained also a license for the use of FAILURE, an IMEC and LUC co-owned software package for analyzing failure times coming from reliability tests using statistically well-founded methods. The software can either be incorporated in the test equipment or sold separately.

The test equipment achieves a high measurement resolution whereby lifetime measurements can be performed within a shorter test time at a higher accuracy. The licensed technology is protected by six patents in several countries worldwide.

XPEQT will continue to perform research in the field of reliability and burn-in electronics in close collaboration with IMEC and LUC to further extend the capabilities of the technology.

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