Books and journals Case studies Expert Briefings Open Access
Advanced search

Search results

1 – 10 of over 19000
To view the access options for this content please click here
Article
Publication date: 12 October 2015

Fatigue reliability theory-based optimal design of wire ropes on test platforms for FAST actuators

Ming Zhu, QiMing Wang, Lei Yang, Zheng Lei, Yong Wang and Mingchang Wu

Three test platforms for long-term continuous loading are adopted to test the actuator prototypes of the 500-meter aperture spherical radio telescope (FAST). However, the…

HTML
PDF (432 KB)

Abstract

Purpose

Three test platforms for long-term continuous loading are adopted to test the actuator prototypes of the 500-meter aperture spherical radio telescope (FAST). However, the wire ropes that are the key components of these platforms often break during testing. The purpose of this paper is to present an effective dimension design method for these wire ropes. This method is based on fatigue reliability theory.

Design/methodology/approach

Three types of stresses are introduced into the total stress model of the wire rope according to the complicated stress conditions. The fatigue strength of the ropes is also discussed in this paper. Then, the total stress model and the results of fatigue strength analysis are applied to set the optimization function for these wire ropes. Subsequently, this optimization function is used to calculate the reliability of previously developed wire ropes in relation to the actuator test platform.

Findings

The wire rope is unreliable, which is a finding that corresponds to those of previous tests. Upon drawing the optimal curve from the optimization function (whose optimal objective is the wire diameter), a wire rope is optimized for the FAST actuator test platforms. Finally, this optimized rope is used on the new actuator test platform. No fracture phenomenon has been detected in tests conducted over the past six months.

Originality/value

The fatigue reliability theory-based optimization function for wire ropes can be adopted for the universal dimension design of other wire ropes.

Details

Multidiscipline Modeling in Materials and Structures, vol. 11 no. 3
Type: Research Article
DOI: https://doi.org/10.1108/MMMS-02-2015-0007
ISSN: 1573-6105

Keywords

  • FAST
  • Actuator
  • Fatigue reliability
  • Optimal function
  • Wire rope
  • Dimension design method

To view the access options for this content please click here
Article
Publication date: 1 February 1987

Thermosonic Wire Bonding on Single‐layer Polymer Hybrid Integrated Circuits (POLYHICs)

R.L. Shook

A study was undertaken to evaluate the thermosonic gold‐wire bonding capability to Ti‐Pd‐Cu‐Ni‐Au thin film metallisation on newly developed polymer hybrid integrated…

HTML
PDF (563 KB)

Abstract

A study was undertaken to evaluate the thermosonic gold‐wire bonding capability to Ti‐Pd‐Cu‐Ni‐Au thin film metallisation on newly developed polymer hybrid integrated circuits (POLYHICs). (The POLYHIC technology incorporates alternating layers of polymer and metal added to conventional Hybrid Integrated Circuits which provide for increased interconnection density.) Destructive wire‐pull strengths were measured as a function of varying wire‐bonding machine operating parameters of wedge bond force, wedge bond time, temperature, and ultrasonic energy. All data were evaluated and compared with wire bonding under similar conditions to thin film circuits on Al2O3 ceramic. The results for wedge‐bond associated failures indicated that machine operating parameters of wedge bond force, time and ultrasonic energy similarly affected the average wire‐pull strength for both the ceramic and POLYHIC circuits. Pull strengths for equivalent metallisation schemes and bonding parameters were generally slightly higher and more tightly distributed for bonds made to metal films on ceramic. A strong correlation was found to exist between wire‐pull strengths and surface topography (as measured by a profilometer technique) of the thin film metallisation for the POLYHICs which had both smooth and rough metallisation surfaces for metal films on top of the polymer. The results indicated that rough metallisation bonded more easily and yielded much higher wire‐pull strengths. Also, rougher films were shown to effectively increase the parameter‐operating windows for producing reliable wire bonds. A semi‐quantitative analysis was developed to help explain this correlation. Surface topography effects were also found to be a key factor when evaluating wire bondability as a function of substrate bonding temperature. Wedge‐bond strength was essentially independent of temperature for bonds made to rougher metallisation while a strong temperature dependency was found when wire bonds were made to smoother films.

Details

Microelectronics International, vol. 4 no. 2
Type: Research Article
DOI: https://doi.org/10.1108/eb044275
ISSN: 1356-5362

To view the access options for this content please click here
Article
Publication date: 1 April 1998

Thermodynamic aspect of the wire‐bonding process

J. Falk

The influence of process heat, with regard to wire‐ and substrate‐materials, on the adhesion of wire‐bonds was investigated. Temperature increases up to 200°C were…

HTML
PDF (132 KB)

Abstract

The influence of process heat, with regard to wire‐ and substrate‐materials, on the adhesion of wire‐bonds was investigated. Temperature increases up to 200°C were measured on the interface between surface and wire. This temperature is the basis for demonstrating the important influence of dissipated process heat on the cold welding process of wire‐bonding. Complementary calculations to evaluate the equation of thermal conductivity were carried out using the finite element (FE) method. Bonding tests were able to verify the calculations. These thermodynamical considerations give us a new method to optimize the construction and the choice of materials within the wire‐bond process.

Details

Microelectronics International, vol. 15 no. 1
Type: Research Article
DOI: https://doi.org/10.1108/13565369810199086
ISSN: 1356-5362

Keywords

  • Adhesion
  • Finite element method
  • Lift‐off
  • Thermodynamics
  • Wire bonding

To view the access options for this content please click here
Article
Publication date: 18 April 2008

Reliability of wirebonds in micro‐electronic packages

W.D. van Driel, R.B.R. van Silfhout and G.Q. Zhang

At present, over 95 percent of the manufactured packages are still being wire bonded. Owing to the ongoing trend of miniaturization, material changes, and cost reduction…

HTML
PDF (286 KB)

Abstract

Purpose

At present, over 95 percent of the manufactured packages are still being wire bonded. Owing to the ongoing trend of miniaturization, material changes, and cost reduction, wire bond‐related failures are becoming increasingly important. This paper aims to understand these kinds of failures.

Design/methodology/approach

Different finite element (FE) techniques are explored to their ability to describe the thermo‐mechanical behavior of the wire embedded in the electronic package. The developed nonlinear and parametric FE models are able to predict the strong nonlinear behavior of wire failures and multi‐failure mode interaction accurately and efficiently.

Findings

It is found that both processing and testing environments as well as the occurrence of delamination strongly increase the risk for wire failures. The results indicate that processing and testing influences are much less than those of the delamination.

Practical implications

Package designers should focus on limiting the occurrence of delamination around wire bond and/or stitch areas.

Originality/value

Combining the strengths of predictive modeling with simulation‐based optimization methods, the optimal wire shape is obtained.

Details

Microelectronics International, vol. 25 no. 2
Type: Research Article
DOI: https://doi.org/10.1108/13565360810875967
ISSN: 1356-5362

Keywords

  • Optimization techniques
  • Bonding
  • Wires
  • Finite element analysis
  • Electronic engineering

To view the access options for this content please click here
Article
Publication date: 1 March 1987

Wire Bonding to GaAs Electronic Devices

S.T. Riches and G.L. White

GaAs electronic devices are becoming increasingly used in the microelectronics industry especially in solid state microwave, ultra high speed digital processing and…

HTML
PDF (448 KB)

Abstract

GaAs electronic devices are becoming increasingly used in the microelectronics industry especially in solid state microwave, ultra high speed digital processing and optoelectronic applications. However, in the manufacture of the GaAs devices, problems due to the inherent brittleness of the GaAs and batch to batch variability of the bond pad metallisation have commonly been experienced. This has resulted in some difficulties in wire bonding to GaAs devices with ultrasonic and thermocompression wire bonding techniques. This paper describes a programme undertaken to investigate Au wire bonding techniques to GaAs devices. Specifically, bonding trials have been performed on a range of GaAs substrates using pulse tip and continuously heated thermocompression bonding and ultrasonic bonding. The results of this work have shown that thermocompression and ultrasonic wire bonding techniques are cabable of producing acceptable bonds to GaAs devices, although some of the advantages and limitations of each technique have been demonstrated. Thermocompression bonding with a continuously heated capillary gave the most tolerant envelope of bonding conditions and highest bond strengths. Pulse tip thermocompression bonding gave a less tolerant envelope of acceptable bonding conditions, required a longer bonding time and the wire was weakened above the ball bond. Ultrasonic bonding did not require any substrate heating to give acceptable bonds. However, the choice of equipment can be critical if damage to the device is to be avoided.

Details

Microelectronics International, vol. 4 no. 3
Type: Research Article
DOI: https://doi.org/10.1108/eb044295
ISSN: 1356-5362

To view the access options for this content please click here
Article
Publication date: 1 March 1996

Mine rope‐wires under distress

D. Mukheijee

Discusses the distress of mine rope‐wires, under the diverse states of stresses and strains of physical, chemical and mechanical origin. Mine rope‐wires undergo…

HTML
PDF (560 KB)

Abstract

Discusses the distress of mine rope‐wires, under the diverse states of stresses and strains of physical, chemical and mechanical origin. Mine rope‐wires undergo complicated cycles of stresses and strains inside the depth of coal and metal mines. This assumes special significance during summer inside the deeper mines. Summarizes recent studies in this field and compares their results.

Details

Anti-Corrosion Methods and Materials, vol. 43 no. 3
Type: Research Article
DOI: https://doi.org/10.1108/eb007390
ISSN: 0003-5599

To view the access options for this content please click here
Article
Publication date: 1 January 1983

A robotic wire harnessing system

Wire harness fabrication is extremely labour intensive. Previous attempts to automate the process have used X‐Y tables and have only been partially successful due to…

HTML
PDF (740 KB)

Abstract

Wire harness fabrication is extremely labour intensive. Previous attempts to automate the process have used X‐Y tables and have only been partially successful due to limited degrees of freedom. Unimation has demonstrated the feasibility of using a robot to integrate the wire termination, insertion, routing and testing operations into a single manufacturing system.

Details

Assembly Automation, vol. 3 no. 1
Type: Research Article
DOI: https://doi.org/10.1108/eb004187
ISSN: 0144-5154

To view the access options for this content please click here
Article
Publication date: 1 July 2006

Applicability of the FSEM for analyzing wire flat rolling process

M. Kazeminezhad and A. Karimi Taheri

The purpose of this paper is to present an assessment of the ability of combined finite and slab element method (FSEM) for analyzing the wire flat rolling process.

HTML
PDF (244 KB)

Abstract

Purpose

The purpose of this paper is to present an assessment of the ability of combined finite and slab element method (FSEM) for analyzing the wire flat rolling process.

Design/methodology/approach

Using the FSEM, the effective strain field of flat rolled wire is predicted for different reductions in height and frictional conditions. The validity of the method is assessed by performing the Vickers microhardness measurements on the flattened wire cross section. Also, the creation of macroscopic shear bands in cross section of the flat rolled wire is investigated and confirmed by microhardness and metallographic examinations. Moreover, the lateral spread and width of contact area are predicted by the FSEM for different reductions in height and frictional conditions.

Findings

The FSEM and microhardness results show the minimum and the maximum effective strains at the round edge and center of the flattened wire, respectively. Also, the results show the bands of maximum effective strain at cross section of the flattened wire, i.e. macroscopic shear bands.

Practical implications

This paper can be useful in rolling industries to produce electronic parts, various springs, trolley cables, piston rings, and guide rails.

Originality/value

The paper shows the applicability of the FSEM for calculating the effective strain field and geometry of wire after wire flat rolling process.

Details

Engineering Computations, vol. 23 no. 5
Type: Research Article
DOI: https://doi.org/10.1108/02644400610671117
ISSN: 0264-4401

Keywords

  • Metallurgy
  • Numerical analysis
  • Stress (materials)

To view the access options for this content please click here
Article
Publication date: 1 May 1955

Lubricants for Wiredrawing

A.L.H. PERRY

The PROCESS OF MAKING WIRE by drawing operations through dies, as distinct from hammering, though believed to be several thousand years old, until the last century was…

HTML
PDF (564 KB)

Abstract

The PROCESS OF MAKING WIRE by drawing operations through dies, as distinct from hammering, though believed to be several thousand years old, until the last century was performed only by man‐, horse‐ or water‐power, so that production was slow and small. These old methods could not meet the greatly increased demand that then arose for wire of all kinds, such as copper wire for electrical purposes, and consequently power‐driven multi‐die benches were developed. Drawing speeds were still limited to several hundreds of feet per minute because of the rapid wear of the chilled iron and steel dies then used; but with the introduction of tungsten carbide dies and diamond dies, speeds were again increased, and now figures of 2,000 ft. per minute for steel wire, and 5,000 ft. per minute or more for copper and aluminium, are commonplace. These advances have required improved drawing lubricants, and future increases in drawing speeds likewise largely depend on improving lubricants still further. The general problem is to provide adequate lubrication for long die life, coupled with the intensive cooling that higher drawing speeds compel.

Details

Industrial Lubrication and Tribology, vol. 7 no. 5
Type: Research Article
DOI: https://doi.org/10.1108/eb052335
ISSN: 0036-8792

To view the access options for this content please click here
Article
Publication date: 5 January 2015

Effect of wire diameter and hook location on second bond failure modes

Fuaida Harun, Roslina Ismail, Azman Jalar and Shahrum Abdullah

– This paper aims to analyze the effect of Au wire size and location of hook during wire pulling test to identify the variation of results obtained.

HTML
PDF (182 KB)

Abstract

Purpose

This paper aims to analyze the effect of Au wire size and location of hook during wire pulling test to identify the variation of results obtained.

Design/methodology/approach

Two hook locations, namely, location A and location B were used to analyze the effect of hook location. Location A was the same as the hook location required by MIL-STD-883E standard, whereas location B was located near to the second bond. The correlation between new purposed failure modes and MIL-STD-883E standard was developed to reflect on the pull strength with the physical failure.

Findings

It was observed that fine pitch Au wire has higher variation and lower process capability of pull strength. Au wire pulled by the hook at location B provides a more representative result compared to that at location A. Fifty per cent or more of Au remnant is required to be considered as a good and reliable Au wedge bond based on the new purposed failure modes.

Originality/value

The evaluation of gold (Au) wedge bond requires a new proper wire pulling test method. This is due to the large variation obtained from the application of current practice of wire pulling test.

Details

Microelectronics International, vol. 32 no. 1
Type: Research Article
DOI: https://doi.org/10.1108/MI-03-2014-0011
ISSN: 1356-5362

Keywords

  • Wire bonding
  • Wire pulling test
  • Second bond
  • Microelectronics packaging

Access
Only content I have access to
Only Open Access
Year
  • Last week (23)
  • Last month (69)
  • Last 3 months (231)
  • Last 6 months (434)
  • Last 12 months (917)
  • All dates (19805)
Content type
  • Article (17760)
  • Book part (1470)
  • Earlycite article (278)
  • Case study (207)
  • Expert briefing (65)
  • Executive summary (25)
1 – 10 of over 19000
Emerald Publishing
  • Opens in new window
  • Opens in new window
  • Opens in new window
  • Opens in new window
© 2021 Emerald Publishing Limited

Services

  • Authors Opens in new window
  • Editors Opens in new window
  • Librarians Opens in new window
  • Researchers Opens in new window
  • Reviewers Opens in new window

About

  • About Emerald Opens in new window
  • Working for Emerald Opens in new window
  • Contact us Opens in new window
  • Publication sitemap

Policies and information

  • Privacy notice
  • Site policies
  • Modern Slavery Act Opens in new window
  • Chair of Trustees governance statement Opens in new window
  • COVID-19 policy Opens in new window
Manage cookies

We’re listening — tell us what you think

  • Something didn’t work…

    Report bugs here

  • All feedback is valuable

    Please share your general feedback

  • Member of Emerald Engage?

    You can join in the discussion by joining the community or logging in here.
    You can also find out more about Emerald Engage.

Join us on our journey

  • Platform update page

    Visit emeraldpublishing.com/platformupdate to discover the latest news and updates

  • Questions & More Information

    Answers to the most commonly asked questions here