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This paper aims to develop high-pass (HP) negative group delay (NGD) investigation based on three-port lumped circuit. The main particularity of the proposed three-port passive topology is the consideration of only a single circuit element represented by a capacitor.

The methodology of the paper is to consider the S-matrix equivalent model derived from admittance matrix approach. So, an S-matrix equivalent model of a three-port circuit topology is established from admittance matrix approach. The frequency-dependent basic expressions are explored to perform the HP-NGD analysis. Then, the existence condition of HP-NGD function type is analytically demonstrated. The specific characteristics and synthesis equations of HP-NGD circuit with respect to the desired optimal NGD value are established.

After computing the frequency expressions to perform the HP-NGD analysis, this study demonstrated the existence condition of HP-NGD function type analytically. The validity of the HP-NGD theory is verified by a prototype of three-port circuit. The proof-of-concept (POC) single capacitor three-port circuit presents an NGD response and characteristics from analytical calculation and simulation is in very good correlation.

An innovative theory of HP-NGD three-port circuit is studied. The proposed HP-NGD topology is constituted by only a single capacitor. After the topological description, the S-matrix model is established from the Y-matrix by means of Kirchhoff voltage law and Kirchhoff current law equations. A POC of single capacitor three-port circuit was designed and simulated with a commercial tool. Then, a prototype with a surface-mounted device component was fabricated and tested. As expected, simulation and measurement results in very good agreement with the calculated model show the feasibility of the HP-NGD behavior. This work is compared to other NGD-type function with diverse number of ports and components.