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High-pass negative group delay analysis of single capacitor three-port circuit

Nour Mohammad Murad (PIMENT, Network and Telecom Lab, Institut Universitaire de Technologie, Université de la Réunion, Saint Pierre, La Réunion)
Antonio Jaomiary (Ecole Normale Supérieure pour l’Enseignement Technique (ENSET), University of Antsiranana, Antsiranana, Madagascar)
Samar Yazdani (Software Engineering Department, Bahria University Karachi Campus, Karachi, Pakistan)
Fayrouz Haddad (IM2NP – UMR 7334, Aix-Marseille-University, Aix en Provence, France)
Mathieu Guerin (IM2NP – UMR 7334, Aix-Marseille-University, Aix en Provence, France)
George Chan (ASMPT Hong Kong Ltd., Tsing Yi, Hong Kong)
Wenceslas Rahajandraibe (IM2NP – UMR 7334, Aix-Marseille-University, Aix en Provence, France)
Sahbi Baccar (IRSEEM Lab.-ESIGELEC, University of Rouen, Rouen, France)

COMPEL - The international journal for computation and mathematics in electrical and electronic engineering

ISSN: 0332-1649

Article publication date: 7 March 2023

Issue publication date: 23 November 2023

35

Abstract

Purpose

This paper aims to develop high-pass (HP) negative group delay (NGD) investigation based on three-port lumped circuit. The main particularity of the proposed three-port passive topology is the consideration of only a single circuit element represented by a capacitor.

Design/methodology/approach

The methodology of the paper is to consider the S-matrix equivalent model derived from admittance matrix approach. So, an S-matrix equivalent model of a three-port circuit topology is established from admittance matrix approach. The frequency-dependent basic expressions are explored to perform the HP-NGD analysis. Then, the existence condition of HP-NGD function type is analytically demonstrated. The specific characteristics and synthesis equations of HP-NGD circuit with respect to the desired optimal NGD value are established.

Findings

After computing the frequency expressions to perform the HP-NGD analysis, this study demonstrated the existence condition of HP-NGD function type analytically. The validity of the HP-NGD theory is verified by a prototype of three-port circuit. The proof-of-concept (POC) single capacitor three-port circuit presents an NGD response and characteristics from analytical calculation and simulation is in very good correlation.

Originality/value

An innovative theory of HP-NGD three-port circuit is studied. The proposed HP-NGD topology is constituted by only a single capacitor. After the topological description, the S-matrix model is established from the Y-matrix by means of Kirchhoff voltage law and Kirchhoff current law equations. A POC of single capacitor three-port circuit was designed and simulated with a commercial tool. Then, a prototype with a surface-mounted device component was fabricated and tested. As expected, simulation and measurement results in very good agreement with the calculated model show the feasibility of the HP-NGD behavior. This work is compared to other NGD-type function with diverse number of ports and components.

Keywords

Acknowledgements

The authors address a grateful thank to Dr Eric Jean Roy Sambatra and Prof Blaise Ravelo for his scientific help about the NGD analysis and development.

Citation

Murad, N.M., Jaomiary, A., Yazdani, S., Haddad, F., Guerin, M., Chan, G., Rahajandraibe, W. and Baccar, S. (2023), "High-pass negative group delay analysis of single capacitor three-port circuit", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 42 No. 6, pp. 1311-1334. https://doi.org/10.1108/COMPEL-12-2021-0486

Publisher

:

Emerald Publishing Limited

Copyright © 2023, Emerald Publishing Limited

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