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The purpose of this paper is to evaluate the relationship between the Cu trace and epoxy resin and to check the validity of surface and interfacial cutting analysis system (SAICAS) by comparing its results to those of the 90° peel test.

In this study, the effects of surface morphology on the adhesion strength were studied for a Cu/epoxy resin system using a SAICAS. In order to evaluate the peel strength of the sample, the curing degree and surface morphology of the epoxy resin were varied in the Cu/epoxy resin system.

The results indicated that the peel strength is strongly affected by the curing degree and the surface morphology of the epoxy layer. As the pre-cure time increased, the interactions between the epoxy resin and permanganate during the adhesion promotion process decreased, which decreased the surface roughness (Ra) of the resin. Therefore, the surface roughness of the epoxy resin decreased with increasing pre-cure time. The curing degree was calculated with the FTIR absorption peak (910 cm−1) of the epoxy groups. The high curing degree for the epoxy resin results in a coral-like morphology that provides a better anchoring effect for the Cu trace and a higher interfacial strength.

It is necessary to study the further adhesion strength, i.e. the friction energy, the plastic deformation energy, and the interfacial fracture energy, in micro- and nanoscale areas using SAICAS owing to insufficient data regarding the effects of size and electroplating materials.

From findings, it is found that measuring the peel strength using SAICAS is particularly useful because it makes the assessment of the peel strength in the Cu/epoxy resin system of electronic packages possible.

The purpose of this study is that the effects of surface mount technology (SMT) assembly process on the product lifetime of fine-pitch printed circuit boards (PCBs) were investigated under biased highly accelerated stress testing (HAST).

SMT assembly from a semiconductor SMT assembly process was replicated to test PCBs under the same conditions as SMT-assembled PCBs. The median lives µ and standard deviation s of the test PCBs were calculated from the log-normal distribution. The failure analysis of current leakages was conducted by the focused ion beam, scanning electron microscopy and energy-dispersive X-ray spectroscopy. Using the inverse power law and modified Peck-H’s relationship, the PCB lives at accelerated (by SMT assembly stress) and user conditions were calculated.

The failure analysis demonstrated that SiO₂ and BaSO₄ fillers added for stiffening organic materials promote current leakage failure. Therefore, the hydrophobicity of these fillers is believed to be necessary to suppress the current leakage failure under biased HAST. The inverse power law model indicates that the acceleration life model with SMT assembly stress can be given as follows: L(V) = 271.9(S)^−0.5031. From modified Peck-H’s relationship, after the third SMT assembly, the time required to attain 0.96 per cent failures at 35°C/60 per cent RH/1.9 V and 130°C/85 per cent RH/3.5 V are 129 y and 69.5 h, respectively. The biased HAST at 130°C/85 per cent/3.5 V after the third SMT assembly for 69.5 h on 238 samples could be recommended as an early quality-monitoring procedure.

In the future, the failure modes in an early stage of a bathtub should be analyzed and the life prediction model should be studied accordingly.

Through this study, the lifetime prediction model and early quality-monitoring procedure for organic substrates because of SMT assembly stress were obtained.

This study aims to investigate crack propagation in a moisture-preconditioned soft-termination multi-layer ceramic capacitor (MLCC) during thermal reflow process.

Experimental and extended finite element method (X-FEM) numerical analyses were used to analyse the soft-termination MLCC during thermal reflow. A cross-sectional field emission scanning electron microscope image of an actual MLCC’s crack was used to validate the accuracy of the simulation results generated in the study.

At 270°C, micro-voids between the copper-electrode and copper-epoxy layers absorbed 284.2 mm/mg³ of moisture, which generated 6.29 MPa of vapour pressure and caused a crack to propagate. Moisture that rapidly vaporises during reflow can cause stresses that exceed the adhesive/substrate interface’s adhesion strength of 6 MPa. Higher vapour pressure reduces crack development resistance. Thus, the maximum crack propagation between the copper-electrode and copper-epoxy layers at high reflow temperature was 0.077 mm. The numerical model was well-validated, as the maximum crack propagation discrepancy was 2.6%.

This research holds significant implications for the industry by providing valuable insights into the moisture-induced crack propagation mechanisms in soft-termination MLCCs during the reflow process. The findings can be used to optimise the design, manufacturing and assembly processes, ultimately leading to enhanced product quality, improved performance and increased reliability in various electronic applications. Moreover, while the study focused on a specific type of soft-termination MLCC in the reflow process, the methodologies and principles used in this research can be extended to other types of MLCC packages. The fundamental understanding gained from this study can be extrapolated to similar structures, enabling manufacturers to implement effective strategies for crack reduction across a wider range of MLCC applications.

The moisture-induced crack propagation in the soft-termination MLCC during thermal reflow process has not been reported to date. X-FEM numerical analysis on crack propagation have never been researched on the soft-termination MLCC.

This paper focuses on the fluid-structure interaction (FSI) analysis of moisture induced stress for the flip chip ball grid array (FCBGA) package with hydrophobic and hydrophilic materials during the reflow soldering process. The purpose of this paper is to analyze the influence of moisture concentration and FCBGA with hydrophobic material on induced pressure and stress in the package at varies times.

The present study analyzed the warpage deformation during the reflow process via visual inspection machine (complied to Joint Electron Device Engineering Council standard) and FSI simulation by using ANSYS/FLUENT package. The direct concentration approach is used to model moisture diffusion and ANSYS is used to predict the Von-Misses stress. Models of Test Vehicle 1 (similar to Xie et al., 2009b) and Test Vehicle 2 (FCBGA package) with the combination of hydrophobic and hydrophilic materials are performed. The simulation for different moisture concentrations with reflows process time has been conducted.

The results from the mechanical reliability study indicate that the FSI analysis is found to be in good agreement with the published study and acceptable agreement with the experimental result. The maximum Von-Misses stress induced by the moisture significantly increased on FCBGA with hydrophobic material compared to FCBGA with a hydrophilic material. The presence of hydrophobic material that hinders the moisture desorption process. The analysis also illustrated the moisture could very possibly reside in electronic packaging and developed beyond saturated vapor into superheated vapor or compressed liquid, which exposed electronic packaging to higher stresses.

The findings provide valuable guidelines and references to engineers and packaging designers during the reflow soldering process in the microelectronics industry.

Studies on the influence of moisture concentration and hydrophobic material are still limited and studies on FCBGA package warpage under reflow process involving the effect of hydrophobic and hydrophilic materials are rarely reported. Thus, this study is important to effectively bridge the research gap and yield appropriate guidelines in the microelectronics industry.