The exponentiated Weibull software reliability growth model with various testing‐efforts and optimal release policy

Nesar Ahmad (School of Computing, Information and Mathematical Sciences, The University of the South Pacific, Suva, Fiji Islands)
M.U. Bokhari (Department of Computer Science, Aligarh Muslim University, Aligarh, India)
S.M.K. Quadri (Department of Computer Science, University of Kashmir, Srinagar, India)
M.G.M. Khan (School of Computing, Information and Mathematical Sciences, The University of the South Pacific, Suva, Fiji Islands)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Publication date: 25 January 2008

Abstract

Purpose

The purpose of this research is to incorporate the exponentiated Weibull testing‐effort functions into software reliability modeling and to estimate the optimal software release time.

Design/methodology/approach

This paper suggests a software reliability growth model based on the non‐homogeneous Poisson process (NHPP) which incorporates the exponentiated Weibull (EW) testing‐efforts.

Findings

Experimental results on actual data from three software projects are compared with other existing models which reveal that the proposed software reliability growth model with EW testing‐effort is wider and effective SRGM.

Research limitations/implications

This paper presents a SRGM using a constant error detection rate per unit testing‐effort.

Practical implications

Software reliability growth model is one of the fundamental techniques to assess software reliability quantitatively. The results obtained in this paper will be useful during the software testing process.

Originality/value

The present scheme has a flexible structure and may cover many of the earlier results on software reliability growth modeling. In general, this paper also provides a framework in which many software reliability growth models can be described.

Keywords

Citation

Ahmad, N., Bokhari, M., Quadri, S. and Khan, M. (2008), "The exponentiated Weibull software reliability growth model with various testing‐efforts and optimal release policy", International Journal of Quality & Reliability Management, Vol. 25 No. 2, pp. 211-235. https://doi.org/10.1108/02656710810846952

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Publisher

:

Emerald Group Publishing Limited

Copyright © 2008, Emerald Group Publishing Limited

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