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Modeling of the Degradation Electromigrational Processes in Structures with Intercrystallite Potential Barriers

A.V. Ivanchenko (Department of Computer Engineering and Computing Mathematics, Ukrainian State, Chemical Technology University, Gagarina 8, Dnepropetrovsk, Ukraine, 49005)
A.S. Tonkoshkur (Department of Radiophysical, National University of Dnepropetrovsk, Nauchnaya 13, Dnepropetrovsk, Ukraine, 49050)

Multidiscipline Modeling in Materials and Structures

ISSN: 1573-6105

Article publication date: 1 April 2007

69

Abstract

The electromigration degradation model of nonlinear electrical properties of non‐uniform structures with intercrystallite potential barriers is developed. It allows connecting the increasing of near surfaces concentration of volume donors by their migration in electrical field at heating up structures by means of electrical current in the process of degradation. It results in experimentally observed deterioration varistoral properties, deterioration and asymmetrical deformation of currentvoltage characteristics during their exploitation.

Keywords

Citation

Ivanchenko, A.V. and Tonkoshkur, A.S. (2007), "Modeling of the Degradation Electromigrational Processes in Structures with Intercrystallite Potential Barriers", Multidiscipline Modeling in Materials and Structures, Vol. 3 No. 4, pp. 477-490. https://doi.org/10.1163/157361107782106375

Publisher

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Emerald Group Publishing Limited

Copyright © 2007, Emerald Group Publishing Limited

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