Keywords
Citation
(1999), "ECT introduces expanded line of IC test probes", Microelectronics International, Vol. 16 No. 2. https://doi.org/10.1108/mi.1999.21816bad.016
Publisher
:Emerald Group Publishing Limited
Copyright © 1999, MCB UP Limited
ECT introduces expanded line of IC test probes
ECT introduces expanded line of IC test probes
Keywords ECT, Probes
Everett Charles Technologies showcased an expanded line of IC test probes at Electronica '98. The probe line was designed for use in applications that include BGA, double ended, test socket, pogo tower, DUT ring and interface test.
These probes provide the reliability and performance required for testing today's high lead count, high speed microprocessors and other ICs. The IC probes feature unmatched electrical performance, short probe lengths for high speed circuit testing, and a wide selection of probe and tip styles.