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Characterisation of Thin Film Superconductors by Magnetically Modulated Resistance

B.F. Kim (The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)
J. Bohandy (The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)
F.J. Adrian (The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)
T.E. Phillips (The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)
K. Moorjani (The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 January 1991

Abstract

It is of practical importance to measure and control the morphological state of thin film superconductors. Properties such as critical current, magnetic response and high frequency response are significantly affected by the microstructure of granular thin film specimens. A simple and functional method, magnetically modulated resistance, is described for assessing the granularity of superconductors.

Citation

Kim, B.F., Bohandy, J., Adrian, F.J., Phillips, T.E. and Moorjani, K. (1991), "Characterisation of Thin Film Superconductors by Magnetically Modulated Resistance", Microelectronics International, Vol. 8 No. 1, pp. 16-19. https://doi.org/10.1108/eb044433

Publisher

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MCB UP Ltd

Copyright © 1991, MCB UP Limited