Characterisation of Thin Film Superconductors by Magnetically Modulated Resistance
B.F. Kim
(The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)
J. Bohandy
(The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)
F.J. Adrian
(The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)
T.E. Phillips
(The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)
K. Moorjani
(The Johns Hopkins University Applied Physics Laboratory, Laurel, Maryland, USA)
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Abstract
It is of practical importance to measure and control the morphological state of thin film superconductors. Properties such as critical current, magnetic response and high frequency response are significantly affected by the microstructure of granular thin film specimens. A simple and functional method, magnetically modulated resistance, is described for assessing the granularity of superconductors.
Citation
Kim, B.F., Bohandy, J., Adrian, F.J., Phillips, T.E. and Moorjani, K. (1991), "Characterisation of Thin Film Superconductors by Magnetically Modulated Resistance", Microelectronics International, Vol. 8 No. 1, pp. 16-19. https://doi.org/10.1108/eb044433
Publisher
:MCB UP Ltd
Copyright © 1991, MCB UP Limited