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Surface Mounted Joints on Different Substrate Materials

R.H. Rautioaho (Materials Engineering Laboratory, University of Oulu, Oulu, Finland)
L.P. Karjalainen (Materials Engineering Laboratory, University of Oulu, Oulu, Finland)
M.K. Lahdenperä (Electronics Laboratory, Technical Research Centre of Finland, Oulu, Finland)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 January 1991

Abstract

The deterioration of surface mounted solder and adhesive joints on different substrate materials under thermal cycling was investigated metallographically. Ceramic chip resistors and leadless chip carriers were soft‐soldered or glued onto alumina, FR‐4, aluminium or steel boards and the various cracking modes were observed. Fatigue cracking in the solder under the component (mode A) took place in the case of resistors on an Al substrate and carriers on all boards except alumina. Cracking on the outward surface near the upper and lower corners (mode B) occurred on all boards, but most notably on alumina. Adhesive joints seemed to offer the highest fatigue strength, but their electrical properties suffered continuously in the course of cycling even though cracking was not observed at all in many cases.

Citation

Rautioaho, R.H., Karjalainen, L.P. and Lahdenperä, M.K. (1991), "Surface Mounted Joints on Different Substrate Materials", Microelectronics International, Vol. 8 No. 1, pp. 6-10. https://doi.org/10.1108/eb044431

Publisher

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MCB UP Ltd

Copyright © 1991, MCB UP Limited