Techniques for the Inspection of Flip Chip Solder Bonded Devices
Article publication date: 1 February 1989
After a brief introduction to the advantages and method of construction of flip chip solder bond devices, this paper looks at different techniques that can be used to inspect these devices at various stages in their construction. These techniques include optical, infra‐red, acoustic and electron microscopy, radiograph, electrical and tensile testing. The advantages and limitations of each of the techniques are discussed and an outline inspection schedule is suggested.
Burdett, P.A., Lodge, K.J. and Pedder, D.J. (1989), "Techniques for the Inspection of Flip Chip Solder Bonded Devices", Microelectronics International, Vol. 6 No. 2, pp. 44-48. https://doi.org/10.1108/eb044374
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