The Properties of Thick Film Resistors Fabricated on Various Dielectric Layers
B. Rzasa
(Technical University of Rzeszów, Rzeszów, Poland)
J. Potencki
(Technical University of Rzeszów, Rzeszów, Poland)
26
Abstract
The paper presents a comparative analysis of the properties of ruthenate resistor layers produced on alumina substrates and on dielectric layers previously deposited on them. The effect of dielectric type and the peak firing temperature of ruthenate layers upon the value of their resistance and TCR (temperature coefficient of resistance) has been investigated. The reproducibility and stability of these parameters have been evaluated.
Citation
Rzasa, B. and Potencki, J. (1984), "The Properties of Thick Film Resistors Fabricated on Various Dielectric Layers", Microelectronics International, Vol. 2 No. 1, pp. 25-28. https://doi.org/10.1108/eb044158
Publisher
:MCB UP Ltd
Copyright © 1984, MCB UP Limited