Effect of mechanical stress on different iron loss components up to high frequencies and magnetic flux densities

Abstract

Purpose

The purpose of this paper is to study the variation of the specific iron loss components of electrical steel sheets when applying a tensile mechanical load below the yield strength of the material. The results provide an insight into the iron loss behaviour of the laminated core of electrical machines which are exposed to mechanical stresses of diverse origins.

Design/methodology/approach

The specific iron losses of electrical steel sheets are measured using a standardised single-sheet tester equipped with a hydraulic pressure cylinder which enables application of a force to the specimen under test. Based on the measured data and a semi-physical description of specific iron losses, the stress-dependency of the iron loss components can be studied.

Findings

The results show a dependency of iron loss components on the applied mechanical stress. Especially for the non-linear loss component and high frequencies, a large variation is observed, while the excess loss component is not as sensitive to high mechanical stresses. Besides, it is shown that the stress-dependent iron loss prediction approximates the measured specific iron losses in an adequate way.

Originality/value

New applications such as high-speed traction drives in electric vehicles require a suitable design of the electrical machine. These applications require particular attention to the interaction between mechanical influences and magnetic behaviour of the machine. In this regard, knowledge about the relation between mechanical stress and magnetic properties of soft magnetic material is essential for an exact estimation of the machine’s behaviour.

Citation

Karthaus, J., Steentjes, S., Leuning, N. and Hameyer, K. (2017), "Effect of mechanical stress on different iron loss components up to high frequencies and magnetic flux densities", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 36 No. 3, pp. 580-592. https://doi.org/10.1108/COMPEL-09-2016-0416