Current noise of trimmed thick‐film resistors: measurement and simulation

Achim Raab (Ruhr‐Universität Bochum, Lehrstuhl für Elektronische Meß‐ und Schaltungstechnik, Bochum, Germany)
Christian Jung (Ruhr‐Universität Bochum, Lehrstuhl für Elektronische Meß‐ und Schaltungstechnik, Bochum, Germany)
Peter Dullenkopf (Ruhr‐Universität Bochum, Lehrstuhl für Elektronische Meß‐ und Schaltungstechnik, Bochum, Germany)

Microelectronics International

ISSN: 1356-5362

Publication date: 1 April 1998

Abstract

An investigation of laser‐trimmed thick‐film resistors’ current noise was carried out. A large number of samples from two pastes with different P‐ and L‐cuts were prepared. The noise spectrum of the trimmed resistors was measured to obtain a relationship between the current noise and the cut parameters. A simple but comprehensive electrical model for the simulation of the current noise of trimmed resistors is also presented. The results from the noise simulation agree with the measured data.

Keywords

Citation

Raab, A., Jung, C. and Dullenkopf, P. (1998), "Current noise of trimmed thick‐film resistors: measurement and simulation", Microelectronics International, Vol. 15 No. 1, pp. 15-22. https://doi.org/10.1108/13565369810199077

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MCB UP Ltd

Copyright © 1998, MCB UP Limited

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