The aim of this paper is to present a new and original method for on‐chip measurements of very high frequency parasitic signals where a sampling circuit is directly included in the test chip. The paper describes the usefulness of this sensor for measuring signal propagation and cross‐talk glitch on integrated circuit interconnects and also gives the results obtained experimentally.
Delmas‐Bendhia, S., Caignet, F. and Sicard, E. (2000), "A new method for measuring signal integrity in CMOS ICs", Microelectronics International, Vol. 17 No. 1, pp. 17-21. https://doi.org/10.1108/13565360010305886
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