A new method for measuring signal integrity in CMOS ICs
Sonia Delmas‐Bendhia
(INSA – Department of Electrical and Computer Engineering, Toulouse, France)
Fabrice Caignet
(INSA – Department of Electrical and Computer Engineering, Toulouse, France)
Etienne Sicard
(INSA – Department of Electrical and Computer Engineering, Toulouse, France)
197
Abstract
The aim of this paper is to present a new and original method for on‐chip measurements of very high frequency parasitic signals where a sampling circuit is directly included in the test chip. The paper describes the usefulness of this sensor for measuring signal propagation and cross‐talk glitch on integrated circuit interconnects and also gives the results obtained experimentally.
Keywords
Citation
Delmas‐Bendhia, S., Caignet, F. and Sicard, E. (2000), "A new method for measuring signal integrity in CMOS ICs", Microelectronics International, Vol. 17 No. 1, pp. 17-21. https://doi.org/10.1108/13565360010305886
Publisher
:MCB UP Ltd
Copyright © 2000, MCB UP Limited