Fast computation of R, L parameters of high frequency multi‐winding magnetic components

Abstract

Purpose

The purpose of this paper is to propose a numerical procedure for the extraction of RL equivalent circuits of high frequency multi‐winding transformers with a low computational time.

Design/methodology/approach

Rigorous RL equivalent circuits of multi‐winding transformers can be obtained by performing open and short‐circuit tests. In this work, the finite element method (FEM) is employed as a virtual laboratory in order to derive such circuits. However, an accurate modeling of skin and proximity effects in the windings requires extremely dense meshes at high frequencies. Therefore, a 2D frequency‐domain homogenization of the windings, which conducts to coarser meshes, is applied in order to decrease the computational burden. The fine and homogenized models are compared in terms of simulation time as well as accuracy.

Findings

A significant decrease in simulation times is observed with the homogenized model (one order of magnitude at high frequencies for 2D models), while keeping acceptable relative error values (below 8 percent in the worst case, taking the fine model as reference). Furthermore, it is shown that the skin effect could contribute in a significant way to the total values of the circuit parameters, especially for high frequencies and for small fill factors. It should therefore not be neglected compared to the proximity effect when gathering such conditions, as commonly assumed in the literature.

Originality/value

Equivalent circuits which capture the skin and proximity effects are obtained at an acceptable computational cost, thanks to the use of homogenization techniques in FE simulations. To the best of the authors knowledge, such a procedure has not yet been published.

Citation

De Grève, Z., Deblecker, O. and Lobry, J. (2011), "Fast computation of R, L parameters of high frequency multi‐winding magnetic components", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 30 No. 6, pp. 1914-1926. https://doi.org/10.1108/03321641111168192