Reconfiguration of impulse‐voltage generator for conducting standard lightning tests: A comparative investigation

Abstract

Purpose

Loading the impulse‐voltage generator by test object can affect the generated voltage waveform. It is well known that reconfiguring these generators by changing the high‐voltage resistors and capacitors, and even the connecting leads in the laboratory is too bulky and time consuming, especially for large test objects. The objective of this paper is to introduce a new computerized method to reconfigure the impulse‐voltage generator in order to conduct the standard tests on any type of objects.

Design/methodology/approach

A modified algorithm is introduced for solving the generalized equivalent circuit of impulse‐voltage generators under any loading condition.

Findings

The high efficiency of this algorithm has been verified by experimental investigations on different reduced‐ and full‐scale loads, namely, resistive, inductive, capacitive or mixed. For reduced‐scale loads up to a few kV, a single‐stage impulse‐voltage generator is used. While for full‐scale loads, a multi‐stage impulse‐voltage generator is reconfigured to test a 33 kV neutral earthing reactor. The experimental responses are compared with the numerical results of the proposed program and checked out by the PSCAD simulation. Good agreement has been found between all of them.

Practical implications

Knowing the exact value of the test object, some of the generator components and the connecting lead inductances is a must to apply this method.

Originality/value

Reconfiguring of impulse‐voltage generators by changing the high‐voltage resistors and capacitors, and even the connecting leads in the laboratory is too bulky and time consuming, especially for large test objects. This work will certainly save time and efforts if it is applied correctly in high‐voltage laboratories.

Citation

El‐Adawy Khalil, M. and Metwally, I.A. (2008), "Reconfiguration of impulse‐voltage generator for conducting standard lightning tests: A comparative investigation", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 27 No. 2, pp. 520-533. https://doi.org/10.1108/03321640810847805