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A quality control and improvement system based on the total control methodology (TCM)

Ka Yin Kwok (Manufacturing Engineering Department, City University of Hong Kong, Kowloon, Hong Kong)
V.M. Rao Tummala (Manufacturing Engineering Department, City University of Hong Kong, Kowloon, Hong Kong)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 1 February 1998

3588

Abstract

Reviews and evaluates different quality tools that are commonly available in manufacturing and service industries and integrates them into an effective quality control and improvement system based on their characteristics and appropriateness when applying these tools. The study is based on the enhancement of the basic total control methodology (TCM) model which was originally developed and implemented by Motorola Semiconductors Hong Kong Ltd (MSHKL). During the implementation, several opportunities can be identified in terms of classification methods of quality tools, extent of quality tools covered, and interrelationships among the quality tools. Therefore, a study was carried out to enhance the basic model by integrating over 40 quality tools into a three‐tiered model in order to make it more comprehensive in terms of application from a practical point of view. Demonstrates the effectiveness achieved after the implementation of the TCM model.

Keywords

Citation

Yin Kwok, K. and Rao Tummala, V.M. (1998), "A quality control and improvement system based on the total control methodology (TCM)", International Journal of Quality & Reliability Management, Vol. 15 No. 1, pp. 13-48. https://doi.org/10.1108/02656719810197288

Publisher

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MCB UP Ltd

Copyright © 1998, MCB UP Limited

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