Twin metric control ‐ CUSUM simplified in a Shewhart framework

Abstract

“Twin metric” control preserves the simple, intuitive graphical features of Shewhart control charts, while incorporating the much improved performance of CUSUM. Two metrics are plotted on the twin metric control chart at each sample interval; the Shewhart value and a simplified CUSUM value. The action limits for the two metrics are numerically identical. The name twin metric emphasizes this identity. Twin metric responsiveness, measured in terms of the average run length (ARL) curve, is several times better than Shewhart control, with or without runs rules to supplement the Shewhart chart. Twin metric enables substantially better response to real process shifts and substantially fewer false alarms compared to Shewhart charts. Discusses the conceptual framework, the arithmetic formulas, and the operational aspects, including estimation of the process standard deviation, estimation of the current process average after a twin metric signal, and monitoring process variability using twin metric control. Provides a table of ARLs for six twin metric options. Gives quantitative performance comparisons comparing twin metric to Shewhart and to combined Shewhart‐CUSUM.

Citation

Marquardt, D.W. (1997), "Twin metric control ‐ CUSUM simplified in a Shewhart framework", International Journal of Quality & Reliability Management, Vol. 14 No. 3, pp. 220-233. https://doi.org/10.1108/02656719710165464