Analysis of reliability using masked system life data

Abstract

Purpose

The purpose of this paper is to provide maintenance personnel with a methodology for using masked field reliability data to determine the probability of each subassembly failure.

Design/methodology/approach

The paper compares an iterative maximum likelihood estimation method and a Bayesian methodology for handling masked data collected from 227 identical radar power supplies. The power supply consists of several subassemblies hereafter referred to as shop replaceable assemblies (SRAs).

Findings

The study examined two approaches for dealing with masking, an iterative maximum likelihood estimate procedure, IMLEP, and a Bayesian approach implemented with the application WinBUGS. It indicates that the performances of IMLEP and WinBUGS in estimating the parameters of the SRA distribution under no masking conditions are similar. IMLEP and WinBUGS also provide similar results under masking conditions. However, the study indicates that WinBUGS may perform better than IMLEP when the competing risk responsible for a failure represents a smaller total percentage of the total failures. Future study to confirm this conclusion by expanding the number of SRAs into which the item under study is organized is required.

Research limitations/implications

If an item is considered to be comprised of various subassemblies and the failure of the first subassembly causes the item to fail, then the item is referred to as a series system in the literature. If the probability of a each subassembly failure is statistically independent then the item can be represented by a competing risk model and the probability distributions of the subassemblies can be ascertained from the item's failure data. When the item's cause of failure is not known, the data are referred to in the literature as being masked. Since competing risk theory requires a cause of failure and a time of failure, any masked data must be addressed in the competing risk model.

Practical implications

This study indicates that competing risk theory can be applied to the equipment field failure data to determine a SRA's probability of failure and thereby provide an efficient sequence of replacing suspect failed SRAs.

Originality/value

The analysis of masked failure data is an important area that has had only limited study in the literature due to the availability of failure data. This paper contributes to the research by providing the complete historical equipment usage data for the item under study gathered over a time frame of approximately seven years.

Citation

Hutto, D.E., Mazzuchi, T. and Sarkani, S. (2009), "Analysis of reliability using masked system life data", International Journal of Quality & Reliability Management, Vol. 26 No. 7, pp. 723-739. https://doi.org/10.1108/02656710910975787