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1 – 2 of 2In this paper, it can be seen from AFM images of the as-deposited ZnO and CZO films, and the particle size and shape are not clear, while by increasing annealing temperature, they…
Abstract
Purpose
In this paper, it can be seen from AFM images of the as-deposited ZnO and CZO films, and the particle size and shape are not clear, while by increasing annealing temperature, they become distinguishable. By increasing temperature to 600°C, ZnO and CZO, CAZO and aluminum-doped zinc oxide (AZO) films particles became almost spherical. Due to high content of Cu in CZO target, and of Al in AZO target which was 5% weight ratio, doping plays a great role in the subject. Therefore, the annealing processing strongly affect the size and the shape of nanoparticles.
Design/methodology/approach
In this paper, the authors tried to study, in detail, nobel optical characterizations of ZnO films doped by transition metals in different annealing temperature. The authors found that the values of skin depth, optical density, electron–phonon interaction, steepness parameter, band tail width, direct and indirect carriers transitions and the dissipation factor, free carriers density and roughness of films affect the optical properties, especially the optical absorptions of ZnO films doped by transition metals. Also these properties were affected by annealing temperatures. The authors also found that topography characterizations strongly were affected by these parameters.
Findings
The CZO films have maximum value of coordination number ß, with considering NC = 4, Za = 2, Ne = 8. The CZO films annealed at 500 °C have maximum value of optical density. The as-deposited CAZO films have maximum value of steepness parameters in about of 0.13 eV. The as-deposited AZO films have maximum value of dispersion energy Ed in about of 5.75 eV. Optical gap and disordering energy plots of films can be fitted by linear relationships Eg = 0.49 + 0.2 EU and Eg = 0.52 + 0.5 EU, respectively.
Originality/value
With considering Nc = 4, Za = 2, Ne = 8 for ZnO films, coordination number ß has maximum value of 0.198. CZO nanocomposites films annealed at 500°C have maximum value of optical density. Different linear fitting of ln (α) for films were obtained as y = Ax + B where 5<A < 17 and 5<B < 12. As-deposited CAZO nanocomposites films have minimum value of electron phonon interaction in about of 4.91 eV. Optical gap and disordering energy plots can be fitted by linear relationships Eg = 0.49 + 0.2 EU and Eg = 0.52 + 0.5 EU for as-deposited films and films annealed at 500°C, respectively. Steepness parameters of as-deposited CAZO nanocomposites films have maximum value of 0.13 eV. Dispersion energy Ed for as-deposited AZO nanocomposites films has maximum value of 5.75 eV.
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The purpose of this paper is to study the correlation between the thicknesses of the C–Ni films that have been prepared by RF-magnetron sputtering on quartz substrates and their…
Abstract
Purpose
The purpose of this paper is to study the correlation between the thicknesses of the C–Ni films that have been prepared by RF-magnetron sputtering on quartz substrates and their three-dimensional (3D) micro morphology. In this work by AFM images, this paper studied stereo metric analysis of these films.
Design/methodology/approach
The C–Ni films have been prepared by RF-magnetron sputtering on quartz substrates using a mosaic target consisting of pure graphite and strips of pure nickel approximately 2 cm2 attached to the graphite race track. The field emission scanning electronic microscopy (FESEM) images were used for the morphological characterization.
Findings
The histogram peaks are zero for all samples and the histograms are almost symmetric around zero. Temperature did not have much effect on the degree of isolation, so all four diagrams have similar results. The qualitative observations through statistical parameters of the 3D surface texture revealed that the smoothest surface has been obtained for C-Ni films annealed at 500 °C (Sa, Sq, Sz and Sv have the lower values), while the most irregular topography has been found for C-Ni films annealed at 300 °C (the fractal dimension D = 2.01 ± 0.131).
Originality/value
As shown in FESEM images, the size of the particles was increased for films deposited from 300 ºC to 800ºC; however, at 1000ºC, it decreased significantly. The histogram peaks are zero for all samples and the histograms were almost symmetric around zero. Also, the largest and lowest root mean heights (Sq) belong to films at 300 °C and 500 °C. Furthermore, the more irregular surface was found at 300 °C, and the more regular surface was found at 500 °C. As the temperature was increased to 800 °C, the values of the IAPSD function increased systematically, and then the values of the IAPSD function was decreased in the fourth sample. The surface skewness of samples annealed at 1000 °C was positive which confirms the lack of dominance of cavities on their surface with the highest amount of C-Ni films at 800 °C.
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