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Article
Publication date: 1 September 2001

Amedeo Andreotti, Federico Delfino, Paola Girdinio and Luigi Verolino

An identification procedure for lightning return strokes is proposed. It makes it possible to reconstruct the return stroke height‐dependent attenuation function making use only…

Abstract

An identification procedure for lightning return strokes is proposed. It makes it possible to reconstruct the return stroke height‐dependent attenuation function making use only of the measured vertical component of the electric field radiated by the lightning channel and it can be performed without any information about the channel base current, the measurement of which is generally very difficult and noisy. It is also shown that the method, with suitable modifications, can also be employed for the mathematical evaluation of the lightning channel height, which is a physical quantity a priori unknown. The approach has been validated by means of the numerical simulation of classical TL, MTLL and MTLE engineering models for a wide class of return strokes, with height ranging in the interval 15‐30km.

Details

COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, vol. 20 no. 3
Type: Research Article
ISSN: 0332-1649

Keywords

Article
Publication date: 16 November 2021

Sami Barmada, Alessandro Formisano, Jesus C. Hernandez, Francisco José J. Sánchez Sutil and Carlo Petrarca

The lightning phenomenon is one of the main threats in photovoltaic (PV) applications. Suitable protection systems avoid major damages from direct strikes but also nearby strikes…

Abstract

Purpose

The lightning phenomenon is one of the main threats in photovoltaic (PV) applications. Suitable protection systems avoid major damages from direct strikes but also nearby strikes may induce overvoltage transients in the module itself and in the power conditioning circuitry, which can permanently damage the system. The effects on the PV system sensibly depend on the converter topology and on the adopted power switch. In the present study, a comparative analysis of the transient response due to a nearby lightning strike (LS) is carried out for three PV systems, each equipped with a different converter, namely, boost, buck and buck–boost, based on either silicon carbide metal oxide semiconductor field effect transistors (SiC MOSFET) or insulated gate bipolar transistors controlled power switch devices, allowing in this way an analysis at different switching frequencies. The purpose of this paper is to present the results of the numerical analysis to help the design of suited protection systems.

Design/methodology/approach

Using a recently introduced three-dimensional semi-analytical method to simulate the electromagnetic transients caused in PV modules by nearby LSs, we investigate numerically the effect of a LS on the electronic circuits connecting the module to the alternate current (AC) power systems. This study adopts numerical simulations because experimental analyses are not easy to perform and does not grant a sufficient coverage of all statistically relevant aspects. The approach was validated in a previous paper against available experimental data.

Findings

It is found that the load voltage is not severely interested by the strike effects, thanks to the low pass filters present at the converter output, whereas a relatively high overvoltage develops between the negative pin of the inner circuitry and the “ground” voltage reference. The overcurrent present in the active switches is hardly comparable because of the different topologies and working frequencies; however, the highest overcurrent is observed in the buck converter topology, with SiC MOSFET technology, although it shows the fastest decay.

Originality/value

This research proposes, to the best of the authors’ knowledge, a comprehensive comparison of the indirect lighting strike effects on the converter connected to PV panels. A proper design of the lightning and surge protection system should take into account such aspects to reduce the risk of induced overvoltage and overcurrent transients.

Details

COMPEL - The international journal for computation and mathematics in electrical and electronic engineering , vol. 41 no. 2
Type: Research Article
ISSN: 0332-1649

Keywords

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