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This paper aims to model a three-dimensional twisted geometry of a twisted pair studied in an electrostatic approximation using only two-dimensional (2D) finite elements.

The proposed method is based on the reformulation of the weak formulation of the electrostatics problem to deal with twisted geometries only in 2D.

The method is based on a change of coordinates and enables a faster computational time as well as a high accuracy.

The effectiveness of the adopted approach is demonstrated by studying different configurations related to the IEC 60851-5 standard defined for the measurement of the electrical properties of the insulation of the winding wires used in electrical machines.

This paper aims to solve inhomogeneous dielectric problems by matching boundary conditions at the interfaces among homogeneous subdomains. The capabilities of Hilbert transform computations are deeply investigated in the case of limited numbers of samples, and a refined model is presented by means of investigating accuracies in a case study with three subdomains.

The accuracies, refined by Richardson extrapolation to zero error, are compared to finite element (FEM) and finite difference methods. The boundary matching procedures can be easily applied to the results of a previous Schwarz–Christoffel (SC) conformal mapping stage in SC + BC procedures, to cope with field singularities or with open boundary problems.

The proposed field computations are of general interest both for electrostatic and magnetostatic field analysis and optimization. They can be useful as comparison tools for FEM results or when severe field singularities can impair the accuracies of other methods.

This static field methodology, of course, can be used to analyse transverse electro magnetic (TEM) or quasi-TEM propagation modes. It is possible that, in some case, these may make a contribution to the analysis of axis symmetrical problems.

The most relevant result is the possible introduction of SC + BC computations as a standard tool for solving inhomogeneous dielectric field problems.