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An Evaluation of Via Hole Tenting with Solder Mask Designed to Pass MIL‐P‐55110D Thermal Shock Requirements

J.J. Davignon (Texas Instruments Inc., Austin, Texas, USA)
F. Gray (Texas Instruments Inc., Austin, Texas, USA)

Circuit World

ISSN: 0305-6120

Publication date: 1 April 1992

Abstract

The tenting of via holes has been a controversial issue in the military arena for several years. This issue has gained importance with MIL‐STD‐2000's requirement that all circuitry and vias under components be coated to preclude entrapment of flux. This paper addresses this issue by evaluating the MIL‐Spec thermal shock reliability of solder mask as a hole fill material and as a via tent cover. The relationship of via hole to pad size on tent reliability and solder mask thickness is also investigated. This paper concludes that solder mask as a hole fill material will not pass military thermal shock requirements and that standard dry film solder mask is very sensitive to via hole and pad dimensions. The thinner and more flexible high conformance solder mask is the only material capable of passing MIL‐Spec thermal shock requirements for all via hole to pad relationships.

Citation

Davignon, J.J. and Gray, F. (1992), "An Evaluation of Via Hole Tenting with Solder Mask Designed to Pass MIL‐P‐55110D Thermal Shock Requirements", Circuit World, Vol. 19 No. 1, pp. 56-62. https://doi.org/10.1108/eb046191

Publisher

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MCB UP Ltd

Copyright © 1992, MCB UP Limited