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Designing Electronics for Automated Inspection

D. Thompson (IRT Corporation, San Diego, California, USA)
T. Stroebel (IRT Corporation, San Diego, California, USA)

Circuit World

ISSN: 0305-6120

Article publication date: 1 March 1988



Electronic packaging technologies, such as pin grid arrays, increasingly small pitch surface mount, and double‐sided assemblies are all aimed towards the highest possible product density, with improved performance. The gap between inspection effectiveness and advances made in packaging technologies is becoming larger. As efforts proceed, to learn more about critical factors influencing reliability of solder joints, it is prudent to ensure that printed wiring assembly (PWA) design rules evolve to permit the broadest range of anticipated automated inspection requirements. The range of automated inspection technologies can all be made more effective through careful design of electronics for inspection. Significant opportunities lie in both PWA layout and design, as well as electronic component design, tolerancing, and standardisation. Many inspection issues are shared, but with increased recognition of digital radiography's unique capabilities; this discussion will emphasise X‐ray inspection issues.


Thompson, D. and Stroebel, T. (1988), "Designing Electronics for Automated Inspection", Circuit World, Vol. 14 No. 4, pp. 13-20.




Copyright © 1988, MCB UP Limited

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