X‐Ray Fluorescence for Coating Thickness Measurement
T.D.T. Latter
(Fischer Instrumentation (GB) Ltd, Newbury, Berkshire, England)
97
Abstract
The X‐Ray fluorescence method of coating thickness measurement of ISO 3497, BS 5411 (A), DIN 50987, and ASTM B568–79 is discussed from a practical point of view. A brief illustration of the method's technical principles, advantages, applications, and example instrumentation is given together with some of the precautions to be taken.
Citation
Latter, T.D.T. (1983), "X‐Ray Fluorescence for Coating Thickness Measurement", Circuit World, Vol. 10 No. 1, pp. 20-25. https://doi.org/10.1108/eb045973
Publisher
:MCB UP Ltd
Copyright © 1983, MCB UP Limited