Contamination testers help eliminate cost of rework, repair and field failure

Citation

(2004), "Contamination testers help eliminate cost of rework, repair and field failure", Circuit World, Vol. 30 No. 1. https://doi.org/10.1108/cw.2004.21730aad.003

Contamination testers help eliminate cost of rework, repair and field failure

Contamination testers help eliminate cost of rework, repair and field failure

Keywords: Contamination, Testing

Concoat Systems, has further expanded and enhanced its CM range of contamination testers (Contaminometers). These are used to perform extract cleanliness solvent extracted conductivity (SEC), or resistance of organic solvent extracted (ROSE) testing to measure ionic contamination levels on bare boards, components and loaded assemblies (Plate 2).

Plate 2 Concoat systems has enhanced its CM range of contamination testers

Ionic contamination can dramatically affect long-term reliability in the field. SEC testing can be used to detect such contamination before, during and after manufacture (including cleaning and final assembly). In this way, process stability can be maintained and manufacturing stages where most ionic contamination is being introduced can be identified. This allows manufacturers to rectify ionic contamination problems before they result in an end-of-line – and ultimately field – product failure.

The CM series is primarily targeted at any manufacturer who cannot afford field reliability problems. Although this has traditionally been the domain of high reliability, safety critical electronics firms, it increasingly includes manufacturers of almost any miniaturised electronics product. This is because the latter increasingly exploits the latest fine pitch, fine line circuit designs and component packaging styles (such as chip-on-board, flip chip and μBGA) whose long-term operational reliability is extremely susceptible to ionic contamination.

For more information, visit www.concoat.co.uk