Frontline announces the release of the Genesis 2000 CAM system Version 7.0

Circuit World

ISSN: 0305-6120

Article publication date: 1 June 2000

Keywords

Citation

(2000), "Frontline announces the release of the Genesis 2000 CAM system Version 7.0", Circuit World, Vol. 26 No. 2. https://doi.org/10.1108/cw.2000.21726bad.005

Publisher

:

Emerald Group Publishing Limited

Copyright © 2000, MCB UP Limited


Frontline announces the release of the Genesis 2000 CAM system Version 7.0

Keywords Frontline, CAM

Frontline PCB Solutions, announced the release of version 7.0 of the Genesis 2000 CAM system.

V7.0 of the Genesis is a major version containing both new features, such as the BGA and ET packages, and significant enhancements.

Major new features include:

  1. 1.

    BGA package - a packaging set of DFM actions for specialized Etch Compensation, Tie Bar Generation, Tear Dropping capabilities and a new automatic rotated drawn pads construction routine.

  2. 2.

    ETM phase II:

    • new interfaces: ATG (ANF) and Microcraft;

    • compliance with a wide range of test capabilities and disciplines as double sided/single sided methods, barrel testing, Netlist split to a BON or Flying Probe testers, and DFT - Automated Draw Back to "trade off" test points in case of limited probe access to Net ends due to insufficient annular ring, drill size or SM clearance;

    • improved support of Microvias on pad (Drilled SMT pads);

    • improved fixture analysis;

    • minimal deflection - now also for annular ring testing.

    • on the fly 3D collision avoidance check in "pin to grid" - true 3D spacing analysis for complicated tools geometry (vs. cylindrical envelope).

  3. 3.

    CDR14 on Genesis - CAD reference to Orbotech AOI PC14 and Inspire families.

  4. 4.

    OPFX output to Orbotech LP7008 including plot queue submissions of OPFX files.

Significant improvements were implemented as well in the filling of complex and ragged edged surfaces, surface analyzer, gateway enabling flexible automation, input identification, sub panel optimizer, reference construction speed and logic, analysis speed on large surfaces and drill output improvements.