STATS receives patent for technical enhancement to test handler

Assembly Automation

ISSN: 0144-5154

Article publication date: 1 March 2001

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Keywords

Citation

(2001), "STATS receives patent for technical enhancement to test handler", Assembly Automation, Vol. 21 No. 1. https://doi.org/10.1108/aa.2001.03321aab.007

Publisher

:

Emerald Group Publishing Limited

Copyright © 2001, MCB UP Limited


STATS receives patent for technical enhancement to test handler

STATS receives patent for technical enhancement to test handler

Keywords: Handling, JIT

A faster, more efficient way in handling ICs as part of JIT throughput

ST Assembly Test Services "STATS", a leading independent semiconductor testing and advanced packaging service provider, has been granted a patent from both the USA and Singapore patent offices on an enhancement to the test handler. This technical modification to the test handler's robotic arm improves accuracy in picking up integrated circuits (ICs) and speeds up the set-up time within the test chamber.

"We review and improve our existing processes constantly as part of an ongoing program to increase throughput and the efficiency of our test equipment. Downtime has to be kept to a minimum to achieve high utilisation rate and meet our commitments to customers for timely delivery", said Chee-Keong Tan, STATS VP, Test Operations.

The test handler's robotic arm picks up ICs and places them onto the test site within the test chamber. Traditionally, trial and error is used to adjust the shaft height of the vacuum feed in the robotic arm to pick the ICs from the test chamber. This involves the use of additional tools and a series of manual adjustments as the engineer does not have a clear line of sight of the vacuum feed. ICs that are not properly picked up may cause bent leads that may reduce lead integrity, thus decreasing mechanical yield. It could also cause the machine to jam, affecting the throughput rate and the overall just-in-time (JIT) delivery to customers.

"This patent illustrates our commitment to continually drive improvements to strengthen our support to customers, in both test and turnkey operations", added Tan. "The patent is for the modification done to the handler's existing design to enable accurate adjustments to be made to the shaft height. This reduces the set-up complexity, speeds up the set-up time within the test chamber and overall improves the test process."

For more information on ST Assembly Test Services, please view the company's home page at http://www.stats.com.sg

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