The application of X‐rays in the failure analysis of electronic devices and systems
Abstract
Purpose
The aim is to focus on the application of X‐rays in the failure analysis of electronic devices and systems, with an emphasis on X‐ray radiography and X‐ray spectroscopy.
Design/methodology/approach
The theory behind X‐ray radiography and X‐ray spectroscopy is reviewed, and relevant case studies are used to illustrate the application of these techniques in the failure analysis of electronic devices and systems.
Findings
Examples from recent case studies are given.
Originality/value
The paper provides an introduction to X‐ray methods for engineers working on the failure analysis of electronic devices and systems who may be unfamiliar with these techniques.
Keywords
Citation
Smith, C.A. (2008), "The application of X‐rays in the failure analysis of electronic devices and systems", Circuit World, Vol. 34 No. 3, pp. 31-39. https://doi.org/10.1108/03056120810896254
Publisher
:Emerald Group Publishing Limited
Copyright © 2008, Emerald Group Publishing Limited