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Monitoring plasma jets containing micro particles with chromatic techniques

P.C. Russell (P.C. Russellis based at the Department of Electrical Engineering and Electronics, Centre for Intelligent Monitoring Systems, University of Liverpool, UK.)
B.E. Djakov (B.E. Djakov is based at the Institute of Electronics, Bulgarian Academy of Sciences, Tsarigradskochaussee, Sofia, Bulgaria.)
R. Enikov (R. Enikov is based at the Institute of Electronics, Bulgarian Academy of Sciences, Tsarigradskochaussee, Sofia, Bulgaria.)
D.H. Oliver (D.H. Oliver is based at the Institute of Electronics, Bulgarian Academy of Sciences, Tsarigradskochaussee, Sofia, Bulgaria.)
Y. Wen (Y. Wen is based at the Department of Electrical Engineering and Electronics, Centre for Intelligent Monitoring Systems, University of Liverpool, UK.)
G.R. Jones (G.R. Jones is based at the Department of Electrical Engineering and Electronics, Centre for Intelligent Monitoring Systems, University of Liverpool, UK.)

Sensor Review

ISSN: 0260-2288

Article publication date: 1 March 2003

203

Abstract

A description about the use of the chromatic methodology for monitoring an arc plasma jet utilised for heating micro particles for forming plasma sprayed coatings is given. It is shown that the behaviour of both the plasma and heated micro particles are distinguishable from their different coordinates on an H‐S polar map. Calibration with a standard ribbon lamp would appear feasible for tracking the temperature of the plasma heated micro particles.

Keywords

Citation

Russell, P.C., Djakov, B.E., Enikov, R., Oliver, D.H., Wen, Y. and Jones, G.R. (2003), "Monitoring plasma jets containing micro particles with chromatic techniques", Sensor Review, Vol. 23 No. 1, pp. 60-65. https://doi.org/10.1108/02602280310698030

Publisher

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MCB UP Ltd

Copyright © 2003, Company

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