A binocular machine vision system for ball grid array package inspection

Abstract

Purpose

In this paper, an optical inspection method of the ball grid array package(BGA) is proposed using a binocular machine vision system.

Design/methodology/approach

The height of each solder ball is calculated based on spatial geometrical size and location obtained from the two CCD cameras capturing range images of a LED illuminated BGA chip at certain orientation.

Findings

The structure of this system is simple and the accuracy is 0.02 mm, The experimental results have proved the validity of this system for BGA failure detection.

Practical implications

The developed machine vision system can provide some of the critical factors for BGA quality evaluation, such as the height of solder ball, diameter, pitch and coplanarity.

Originality/value

Compared with other systems, the structure of this system is simple and accurate, which meets the demand of off‐line and on‐line inspection. The limitation of this system is that the margin of field of view (FOV) is fuzzy. Further study could be focused on this problem.

Citation

Qixin, C., Zhuang, F., Nianjiong, X. and Lewis, F.L. (2005), "A binocular machine vision system for ball grid array package inspection", Assembly Automation, Vol. 25 No. 3, pp. 217-222. https://doi.org/10.1108/01445150510610935