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The purpose of this paper is to offer an insight into why men do research on in-equality.

The author utilizes autoethnography, as a form of self-reflection, to help make sense of the own experiences and to connect it with the broader world. It is a narrative based on personal experiences which connects the author's biography with his research endeavours. It also enables to engage in self-analysis and self-awareness of the motives for conducting research on in-equality.

In this narrative, the author shares his journey as an equality scholar, and how his multiple identities as a visible minority, an immigrant to Canada, and a gay person shapes my worldview, attitudes, and beliefs, which in turn influences his own work on equality and diversity. The narrative is based on the intersection of multiple identities, and not just solely based on the author's gender. The attribute feeling deprived on behalf of others, rational self-interest, and social justice as the chief reasons for engaging in in-equality research.

Autoethnography is inherently subjective, based upon the author's own biases and interpretation of events, but the subjectivity can also be an opportunity for intentional self-awareness and reflexivity. Given the multiple identities that the author holds, some of the experiences recounted here may be unique to the author, and some may be shared with others. Thus, it is not the author's intention to represent, in general, why men do in-equality research.

This autoethnography has allowed the author the opportunity to be self-aware of the complexity of the multiple identities. This self-awareness also allows the author to be more respectful, authentic, and inclusive of others. The author hopes that these reflections will resonate with some of you, and perhaps inspire one to engage in similar work, for reasons that are unique to one and all.

This paper aims to present a new micro‐impact tester developed for characterizing the impact properties of solder joints and micro‐structures at high‐strain rates, for the microelectronic industry, and the results evaluated for different solder ball materials, pad finishes and thermal histories by using this new tester. Knowledge of impact force is essential for quantifying the strength of the interconnection and allows quantitative design against failure. It also allows one‐to‐one comparison with the failure force measured in a standard quasi‐static shear test.

An innovative micro‐impact head has been designed to precisely strike the specimen at high speed and the force and displacements are measured simultaneously and accurately during the impact, from which the failure energy may be calculated.

The paper demonstrates that, peak loads obtained from the impact tests are between 30 and 100 percent higher than those obtained from static shear tests for all combinations of solder alloy and pad finish. The SnPb solder alloy had the maximum energy to failure for all pad finishes. Of all the lead‐free solders, the SnAg solder alloy had the highest energy to failure. Static shearing induces only bulk solder failure for all combinations of solder alloy and pad finish. Impact testing tends to induce bulk solder failure for SnPb solder and a mixture of bulk and intermetallic failure in all the lead‐free solder alloys for all pad finishes. In general, the peak loads obtained for solder mask defined pads are significantly higher than those for non‐SMD (NSMD) pads. The results obtained so far have highlighted the vulnerability of NSMD pads to drop impact.

The work provides a new solution to the microelectronics industry for characterizing the impact properties of materials and micro‐structures and provides an easy‐to‐use tool for research or process quality control.

The new micro‐impact tester developed is able to perform solder ball shear testing at high speeds, of up to 1,000 mm/s, and to obtain fracture characteristics similar to those found in drop impact testing using the JEDEC board level testing method JESD22‐B111 – but without the complexity of preparing specialized boards. This is not achievable using standard low‐speed shear testers.

This paper aims to evaluate the influence of previous exposure to moisture on delamination and formation of CAF (conductive anodic filament) in printed circuit boards used for lead‐free soldering.

The moisture absorption and desorption characteristics of printed circuit boards were evaluated according to the IPC/JEDEC J‐STD‐020C standard for handling of moisture sensitive components. The CAF test was performed according to IPC‐TM‐650, Test Method 2.6.25.

Printed circuit boards used for lead‐free soldering must be treated as moisture sensitive components. Severe delamination occurred on test boards that had been exposed to JEDEC level 1 conditions prior to soldering, while no delamination was observed on boards exposed to level 3. Furthermore, previous moisture and thermal exposure had a strong influence on CAF formation. The insulation resistance dropped three decades in less than 15 h in the worst case.

There are considerable stresses on printed circuit boards in lead‐free soldering processes. The influence from materials and processes is very large on the CAF formation. Therefore, a useful strategy is to evaluate the CAF properties for each supplier and material.

The paper pin‐points previous moisture exposure as a very important factor for delamination and CAF formation and confirms that printed circuit boards must be treated as moisture sensitive components.

The purpose of this paper is to report the effect of multiple reflow cycles on ball impact test (BIT) responses and fractographies obtained at an impact velocity of 500 mm/s on Sn‐4Ag‐0.5Cu solder joints.

Solder balls were mounted on copper substrate pads with immersion tin surface finish, supplied by two vendors. For these particular test vehicles and test conditions, fracture near the interface between the interfacial Cu₆Sn₅ intermetallic compound (IMC) and copper pad was identified as the only failure mode induced by BIT.

Measurement results indicate that BIT characteristics in general degrade as the number of reflow cycles increases. Furthermore, scanning electron microscopy observations show that the thickness and grain size of interfacial Cu₆Sn₅ increase with increasing number of reflow cycles. This correlation confirms the familiar notion that a thicker Cu₆Sn₅ degrades the interfacial strength.

There are few reports that can attribute failure directly to the IMC(s) at the interface. This paper, however, successfully correlates the weakening solder joints with the thickening and shape changes of IMC(s) in a direct way.

The purpose of this paper is to present a novel high speed impact testing method for evaluating the effects of low temperatures on eutectic and lead‐free solder joints. Interfacial cracking failure of Sn‐based and Pb‐free solders at subzero temperatures is of significant concern for electronic assemblies that operate in harsh environments.

This paper presents a newly designed low temperature control system coupled with an Instron micro‐impact testing machine, which offers a package level test for solder bumps, and that is used at subzero temperature ranges as low as −40°C. This study examined the failure characteristics of 63Sn‐37Pb (Sn37Pb) and 96.5Sn‐3Ag‐0.5Cu (SAC305) solder joints at temperatures ranging from room temperature (R.T.) to −40°C, and at impact speeds of 1 m/s.

Three types of failure mode were identified: M1 interfacial fracture with no residual solder remaining on the pad (interfacial cracking); M2 interfacial fracture with residual solder persisting on the pad (mixed mode failure); and M3 solder ball fracture (bulk solder cracking). The experimental results indicated that the energy to peak load for both types of solders decreased significantly, by approximately 35 percent to 38 percent when the test temperature was reduced from R.T. to −40°C. In addition, the peak load of the Sn37Pb solder joint increased noticeably with a decreasing test temperature. However, the peak load of the SAC305 specimen remained virtually unchanged with a reduction in the temperature. The Sn37Pb solder joints failed in an M3 failure mode under all the considered testing temperatures. The SAC305 solder joints displayed both M1 and M2 failure modes at R.T.; however, they failed almost exclusively in M1 mode at the lowest test temperature of −40°C.

This paper presents a novel technique for evaluating high‐speed impact strength and energy absorbance of Sn‐based and Pb‐free solders at the chip level within a low temperature control system. To overcome the drawbacks experienced in other studies, this study focused specifically on cryo‐impact testing systems and the performed experimental steps to improve the accuracy of post‐test analysis.

The purpose of the present study was to review the thermo-mechanical challenges of reflowed lead-free solder joints in surface mount components (SMCs). The topics of the review include challenges in modelling of the reflow soldering process, optimization and the future challenges in the reflow soldering process. Besides, the numerical approach of lead-free solder reliability is also discussed.

Lead-free reflow soldering is one of the most significant processes in the development of surface mount technology, especially toward the miniaturization of the advanced SMCs package. The challenges lead to more complex thermal responses when the PCB assembly passes through the reflow oven. The virtual modelling tools facilitate the modelling and simulation of the lead-free reflow process, which provide more data and clear visualization on the particular process.

With the growing trend of computer power and software capability, the multidisciplinary simulation, such as the temperature and thermal stress of lead-free SMCs, under the influenced of a specific process atmosphere can be provided. A simulation modelling technique for the thermal response and flow field prediction of a reflow process is cost-effective and has greatly helped the engineer to eliminate guesswork. Besides, simulated-based optimization methods of the reflow process have gained popularity because of them being economical and have reduced time-consumption, and these provide more information compared to the experimental hardware. The advantages and disadvantages of the simulation modelling in the reflow soldering process are also briefly discussed.

This literature review provides the engineers and researchers with a profound understanding of the thermo-mechanical challenges of reflowed lead-free solder joints in SMCs and the challenges of simulation modelling in the reflow process.

The unique challenges in solder joint reliability, and direction of future research in reflow process were identified to clarify the solutions to solve lead-free reliability issues in the electronics manufacturing industry.

Pb‐free soldering challenged printed circuit board (PCB) assembly with high temperature. The purpose of this paper is to explain the failure mechanism of printed circuit board (PCB) assembly with solder bubbles of vias to avoid the problems of via‐drilling defects and solder joint failure.

The failure of PCB vias with solder bubbles was investigated through cross sections and SEM microstructure inspection, TMA measurement, moisture absorption analysis and DSC measurement. The moisture absorption and CTE of FR4 laminate matched with manufacturing requirement to avoid the effects of solder bubbles. The effects of via drilling with a dull drill bit were compared to that with a new drill bit.

The moisture absorbed inside holes of via plating layers could be exposed to induce solder bubbles during Pb‐free soldering assembly and dull drill bits should be prevented during the drilling process to avoid the no‐bearing drilling effects.

The failure of PCB vias is not only involved in the voiding in solder joints but manufacturing processes of PCB. The paper designs an approach to analyse the properties of PCB materials and the drilling effects of vias to find out the mechanism resulting in solder bubbles of vias. The problem of drill bits should be considered to prevent the moisture absorbed in drilling vias with defects.

The purpose of this paper was to study the combined effect of hygro and thermo-mechanical behavior on a plastic encapsulated micro-electro-mechanical systems (MEMS) package during the reflow process after exposed to a humid environment for a prolonged time. Plastic encapsulated electronic packages absorb moisture when they are subjected to humid ambient conditions.

Thus, a comprehensive stress model is established for a three-axis accelerometer MEMS package, with detailed considerations of fundamentals of mechanics such as heat transfer, moisture diffusion and hygro-thermo-mechanical stress. In this study, the mold compound is considered to be the most critical plastic material in MEMS package. Other plastic components of thin film materials can be disregarded due to their small sizes such as die attach and Bismaleimide Triazine (BT) core, even though they are also susceptible to moisture. Thus, only the moisture-induced properties of mold compound were obtained from the proposed experiments. From the desorption measurement after preconditioning at 85°C/85 per cent relative humidity (RH), the saturated moisture content and diffusivity were obtained by curve fitting the data to Fick’s equation. In addition, a new experimental setup was devised using the digital image correlation system together with a precision weight scale to obtain the coefficient of hygroscopic swelling (CHS) at different temperatures.

The experimental results show that the diffusion coefficient of mold compound material follows Arrhenius equation well. Also, it is shown that the CHS of mold compound increases as temperature increases. Experimentally obtained moisture properties were then used to analyze the combined behavior (thermo-hygro-mechanical) of fully saturated MEMS package during the reflow process using a finite element analysis (FEA) with the classical analogy method. Finally, the warpage and stresses inside the MEMS package were analyzed to compare the effects of hygroscopic, thermal and hygro-thermo-mechancal behaviors.

In this study, unlike the other researches, the moisture effects are investigated specifically for MEMS package which is relatively smaller in scale than conventional electronic packages. Also, as a conjugated situation, MEMS package experiences both humid and temperature during the moisture resistance test. Thus, major objective of this study is to verify stress state inside MEMS package during the reflow process which follows the preconditioning at 85°C/85 per cent RH. To quantify the stresses in the package, accurate information of material properties is experimentally obtained and used to improve modeling accuracy.

Anisotropic conductive film (ACF) is now an attractive technology for direct mounting of chips onto the substrate as an alternative to lead‐free solders. However, despite its various advantages over other technologies, it also has many unresolved reliability issues. For instance, the performance of ACF assembly in high temperature applications is questionable. The purpose of this paper is to study the effect of bonding temperatures on the curing of ACFs, and their mechanical and electrical performance after high temperature ageing.

In the work presented in this paper, the curing degree of an ACF at different bonding temperatures was measured using a differential scanning calorimeter. The adhesion strength and the contact resistance of ACF bonded chip‐on‐flex assembly were measured before and after thermal ageing and the results were correlated with the curing degree of ACF. The ACF was an epoxy‐based adhesive in which Au‐Ni coated polymer particles were randomly dispersed.

The results showed that higher bonding temperatures had resulted in better ACF curing and stronger adhesion. After ageing, the adhesion strength increased for the samples bonded at lower temperatures and decreased for the samples bonded at higher temperatures. ACF assemblies with higher degrees of curing showed smaller increases in contact resistance after ageing. Conduction gaps at the bump‐particle and/or particle‐pad interfaces were found with the help of scanning electron microscopy and are thought to be the root cause of the increase in contact resistance.

The present study focuses on the effect of bonding temperatures on the curing of ACFs, and their adhesion strength and electrical performances after high temperature ageing. The results of this study may help the development of ACFs with higher heat resistance, so that ACFs can be considered as an alternative to lead‐free solders.

Anisotropic conductive adhesive film (ACF) is used for very fine pitch applications in the microelectronics industry, such as flip chip (FC) technology. During the bonding process, bumps on the chip and pads on the substrate are first aligned and then heat and pressure are applied so as to apply thermal energy to the ACF for curing and to cause permanent plastic deformation of the conductive particles. Consequently, a permanent electrical and mechanical contact is formed between the bumps and the pads. The purpose of this study is to investigate the effect of the size and location of any voids in the ACF during subsequent solder reflow processes necessary for SMT component attachment. The paper also investigates the use of a protective aluminium cover during such reflow cycles, which reduces the temperature inside the ACF, and therefore, the stresses inside the ACF, especially when voids exist.

In this study, the ACF is a temperature dependent material having various void sizes, entrapped within the ACF. A finite element method is used to analyse the stresses within a FC on flex assembly.

The results indicate that the smaller the void, the larger the stress concentration. Also, the von Mises stress was found to be larger in the upper portion of the ACF, near the chip, than in the lower portion of the ACF nearer to the flexible substrate. This implies that the four corners of a void are seen to be the most likely site for crack initiation and propagation and therefore, for failure to occur. Moreover, the temperature profile of the reflow cycle and the locations of the voids have also been shown to affect the stress level within the ACF.

The value of this paper is to show how the presence of voids may affect the reliability of a FC assembly.