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The purpose of this paper is to determine: how the thermal cycling aging affects the ratcheting behavior of anisotropic conductive adhesive film (ACF); how the loading conditions and loading history affect the ratcheting strain and strain rate of ACF with different thermal cycling aging histories.

The ACF of CP6920F was cured at 190°C in an electro-thermal vacuum drying apparatus for 30 s. The cured specimens were put into the thermal cycling chamber (−40-150°C) for aging to 25, 50, 100, 200 and 500 cycles. A series of uniaxial ratcheting tests of aged ACF after different thermal cycles was carried out under stress control at 80°C.

The ACF subjected to larger number of thermal aging cycles exhibits less ratcheting strain under the same loading conditions. The ACF with the same thermal cycling aging history shows more ratcheting strain and a higher ratcheting strain rate when loaded under a larger mean stress or stress amplitude or a lower loading rate. The ratcheting behavior of aged ACF is found to be more sensitive to the lower loading rate. The higher mean stress (or stress amplitude) enhances the deformation resistance and consequently restrains the ratcheting strain of subsequent cycling with a lower mean stress (or stress amplitude). The prior lower loading rate accelerates the plastic deformation more significantly than the higher one.

The influencing trends of thermal cycling aging, loading condition and loading history on ratcheting behavior of ACF are obtained, which is important for the design and safety assessment of ACF joints.

This review paper aims to provide a better understanding of formulation and processing of anisotropic conductive adhesive film (ACF) material and to summarize the significant research and development work for the mechanical properties of ACF material and joints, which helps to the development and application of ACF joints with better reliability in microelectronic packaging systems.

The ACF material was cured at high temperature of 190°C, and the cured ACF was tested by conducting the tensile experiments with uniaxial and cyclic loads. The ACF joint was obtained with process of pre-bonding and final bonding. The impact tests and shear tests of ACF joints were completed with different aging conditions such as high temperature, thermal cycling and hygrothermal aging.

The cured ACF exhibited unique time-, temperature- and loading rate-dependent behaviors and a strong memory of loading history. Prior stress cycling with higher mean stress or stress amplitude restrained the ratcheting strain in subsequent cycling with lower mean stress or stress amplitude. The impact strength and adhesive strength of ACF joints increased with increase of bonding temperature, but they decreased with increase of environment temperature. The adhesive strength and life of ACF joints decreased with hygrothermal aging, whereas increased firstly and then decreased with thermal cycling.

This study is to review the recent investigations on the mechanical properties of ACF material and joints in microelectronic packaging applications.

The purpose of this paper is to examine the long-term reliability of an anisotropic conductive adhesive (ACA) attached polyethylene terephthalate (PET) flex-on-board (FOB) assembly for industrial application used in harsh environments. In addition, the possibility of reducing reliability testing time was studied.

A−40/+125°C thermal cycling test with 5- and 14-minute soak times was used to study the reliability. To study the functionality of the FOB assembly during testing, a real-time resistance measurement was used together with a 90° peel strength test. Failure analysis was performed on samples using scanning electron microscopy and cross sectioning.

No failures or noticeable increase in the measured resistance values were seen during testing. The peel strength, however, decreased significantly with both soak times used. The highest drop in the mechanical strength occurred at the start of the temperature cycling tests. The time spent at the high temperature extreme seemed to have a greater impact on the peel strength than the number of temperature cycles. The failure mode of peel tested samples changed due to temperature cycling from interfacial delamination to cohesive failure. The temperature cycling was also observed to induce voiding inside the adhesive.

The paper illustrates the applicability of ACA attached PET flex in high reliability industrial applications. Additionally, testing methods for high reliability adhesive interconnections are discussed. Especially, the effect of temperature cycling soak time on peel test results and reliability testing time is studied.

The purpose of this paper is to investigate the microstructural development of SnAgCu solder joints under different loading conditions (isothermal storage, thermal cycling and vibration).

The observed microstructural changes have been studied with respect to grain growth and grain refinement, crack formation and crack growth. The growth kinetics of the intermetallic phases encountered as particles in the bulk as well as a reaction layer on the copper pad, were studied in the temperature range of 125‐175°C.

Dynamic recrystallisation of the tin matrix leads to a change in the diffusion controlled growth mechanism, which causes an increase of the particle growth rate compared to isothermal storage. Thus, these grain boundaries are separated forcibly by crack growth during thermal cycling. This stress causes intergranular cracks while vibration stress induces transgranular cracks.

The paper adds insight into microstructural changes of lead‐free solder joints during long‐term ageing, thermal cycling and vibration fatigue.

This study aims to investigate the thermal fracture mechanism of moisture-preconditioned SAC305 ball grid array (BGA) solder joints subjected to multiple reflow and thermal cycling.

The BGA package samples are subjected to JEDEC Level 1 accelerated moisture treatment (85 °C/85%RH/168 h) with five times reflow at 270 °C. This is followed by multiple thermal cycling from 0 °C to 100 °C for 40 min per cycle, per IPC-7351B standards. For fracture investigation, the cross-sections of the samples are examined and analysed using the dye-and-pry technique and backscattered scanning electron microscopy. The packages' microstructures are characterized using an energy-dispersive X-ray spectroscopy approach. Also, the package assembly is investigated using the Darveaux numerical simulation method.

The study found that critical strain density is exhibited at the component pad/solder interface of the solder joint located at the most distant point from the axes of symmetry of the package assembly. The fracture mechanism is a crack fracture formed at the solder's exterior edges and grows across the joint's transverse section. It was established that Au content in the formed intermetallic compound greatly impacts fracture growth in the solder joint interface, with a composition above 5 Wt.% Au regarded as an unsafe level for reliability. The elongation of the crack is aided by the brittle nature of the Au-Sn interface through which the crack propagates. It is inferred that refining the solder matrix elemental compound can strengthen and improve the reliability of solder joints.

Inspection lead time and additional manufacturing expenses spent on investigating reliability issues in BGA solder joints can be reduced using the study's findings on understanding the solder joint fracture mechanism.

Limited studies exist on the thermal fracture mechanism of moisture-preconditioned BGA solder joints exposed to both multiple reflow and thermal cycling. This study applied both numerical and experimental techniques to examine the reliability issue.

The paper aims to evaluate the influence of thermo-chemical cycles of oral fluids on the surface attributes (roughness and microhardness) of lithium disilicate glass-ceramic (LDC) crown restorations manufactured with CAD/CAM technology.

There have been 24 LDC crowns manufactured using the CAD/CAM process for their respective preparation dies ply methyl methacrylate (PMMA) of mandibular left second premolar tooth (n = 8 each group). The standard procedure was used to glaze 16 crown samples (Groups 2 and 3).Samples of Group 3 were aged with thermal (563°C and 5563°C) and pH (2–14) cycles. All 24 samples were tested with a Profilometer and a Vicker hardness tester was used for their surface roughness and hardness measurement, respectively.

In statistical examination on SPSS Statistics 20 (IBM) software, of surface roughness values (Ra) and Vicker hardness values from different groups, Tukey HSD test was executed in one-way ANOVA (a = 0.05). The means Ra for groups were accordingly Group 3 > Group1 > Group 2 (p < 0.001). Similarly, micro-hardness was in order of Group 2 > Group 1 > Group 3 (p < 0.001).

The research work does not have any limitations.

Surrounding temperature and pH significantly impact the surface characteristics of lithium disilicate crown restoration. The study also reveals the inverse relationship between surface roughness and surface hardness parameters. The observed results and facts revealed well in agreement with the past research studies.

The purpose of this paper is to investigate the effects of reflow time, reflow peak temperature, thermal shock and thermal aging on the intermetallic compound (IMC) thickness for Sn3.0Ag0.5Cu (SAC305) soldered joints.

A four‐factor factorial design with three replications is selected in the experiment. The input variables are the peak temperature, the duration of time above solder liquidus temperature (TAL), solder alloy and thermal shock. The peak temperature has three levels, 12, 22 and 32°C above solder liquidus temperatures (or 230, 240 and 250°C for SAC305 and 195, 205, and 215°C for SnPb). The TAL has two levels, 30 and 90 s. The thermally shocked test vehicles are subjected to air‐to‐air thermal shock conditioning from −40 to 125°C with 30 min dwell times (or 1 h/cycle) for 500 cycles. Samples both from the initial time zero and after thermal shock are cross‐sectioned. The IMC thickness is measured using scanning electron microscopy. Statistical analyses are conducted to compare the difference in IMC thickness growth between SAC305 solder joints and SnPb solder joints, and the difference in IMC thickness growth between after thermal shock and after thermal aging.

The IMC thickness increases with higher reflow peak temperature and longer time above liquidus. The IMC layer of SAC305 soldered joints is statistically significantly thicker than that of SnPb soldered joints when reflowed at comparable peak temperatures above liquidus and the same time above liquidus. Thermal conditioning leads to a smoother and thicker IMC layer. Thermal shock contributes to IMC growth merely through high‐temperature conditioning. The IMC thickness increases in SAC305 soldered joints after thermal shock or thermal aging are generally in agreement with prediction models such as that proposed by Hwang.

It is still unknown which thickness of IMC layer could result in damage to the solder.

The IMC thickness of all samples is below 3 μm for both SnPb and SAC305 solder joints reflowed at the peak temperature ranging from 12 to 32°C above liquidus temperature and at times above liquidus ranging from 30 to 90 s. The IMC thickness is below 4 μm after subjecting to air‐to‐air thermal shock from −40 to 125°C with 30 min dwell time for 500 cycles or thermal aging at 125°C for 250 h.

The paper reports experimental results of IMC thickness at different thermal conditions. The application is useful for understanding the thickness growth of the IMC layer at various thermal conditions.

This paper outlines methods and results of wetting, leaching and adhesion analyses on copper thick film conductors over alumina and multilayer glasses after different processing conditions. The intention is to provide a better background for evaluating and optimising materials and processing conditions in copper thick films and working out quick, reliable and quantitative methods for better characterisation of copper conductors in production. For these reasons the following methods were used: (a) wetting and leaching analyses with a scanning wetting balance, working in nitrogen, (b) pull tests with solder contacts on copper thick film conductors after soldering, ageing and thermal cycling, and (c) some additional surface analyses (REM, EDX, Auger) for a better understanding of copper pastes and their material interactions, when processed under different conditions. The results are summarised under three general aspects: surface structure and wetting of copper thick films, wetting and leaching of various copper thick films after different processing conditions, and finally the influence of different wetting properties of such surfaces on the solder adhesion strength after soldering, ageing and thermal cycling. The results give good insight into the various interactions of copper thick films with their substrate materials and confirm the ability of the described wetting and leaching analyses for these purposes.

Surface mount technology (SMT) is widely used and plays an important role in electronic equipment. The purpose of this paper is to reveal the effects of interface cracks on the fatigue life of SMT solder joint under service load and to provide some valuable reference information for improving service reliability of SMT packages.

A 3D geometric model of SMT package is established. The mechanical properties of SMT solder joint under thermal cycling load and random vibration load were solved by 3D finite element analysis. The fatigue life of SMT solder joint under different loads can be calculated by using the modified Coffin–Manson model and high-cycle fatigue model.

The results revealed that cracks at different locations and propagation directions have different effect on the fatigue life of the SMT solder joint. From the location of the cracks, Crack 1 has the most significant impact on the thermal fatigue life of the solder joint. Under the same thermal cycling conditions, its life has decreased by 46.98%, followed by Crack 2, Crack 4 and Crack 3. On the other hand, under the same random vibration load, Crack 4 has the most significant impact on the solder joint fatigue life, reducing its life by 81.39%, followed by Crack 1, Crack 3 and Crack 2. From the crack propagation direction, with the increase of crack depth, the thermal fatigue life of the SMT solder joint decreases sharply at first and then continues to decline almost linearly. The random vibration fatigue life of the solder joint decreases continuously with the increase of crack depth. From the crack depth of 0.01 mm to 0.05 mm, the random vibration fatigue life decreases by 86.75%. When the crack width increases, the thermal and random vibration fatigue life of the solder joint decreases almost linearly.

This paper investigates the effects of interface cracks on the fatigue life and provides useful information on the reliability of SMT packages.

This paper aims to develop a fuzzy logic-based algorithm to predict the intermetallic compound (IMC) size and mechanical properties of soldering material, Sn96.5-Ag3.0-Cu0.5 (SAC305) alloy, at different levels of temperature. The reliability of solder joint in materials selection is critical in terms of temperature, mechanical properties and environmental aspects. Owing to a wide range of soldering materials available, the selection space finds a fuzzy characteristic.

The developed algorithm takes thermal aging temperature for SAC305 alloy as input and converts it into fuzzy domain. These fuzzified values are then subjected to a fuzzy rule base, where a set of rules determines the IMC size and mechanical properties, such as yield strength (YS) and ultimate tensile strength (UTS) of SAC305 alloy. The algorithm is successfully simulated for various input thermal aging temperatures. To analyze and validate the developed algorithm, an SAC305 lead (Pb)-free solder alloy is developed and thermally aged at 40, 60 and 100°C temperature.

The experimental results indicate an average IMCs size of 5.967 (in Pixels), 19.850 N/mm² YS and 22.740 N/mm² UTS for SAC305 alloy when thermally aged at an elevated temperature of 140°C. In comparison, the simulation results predicted 5.895 (in Pixels) average IMCs size, 19.875 N/mm² YS and 22.480 N/mm² UTS for SAC305 alloy at 140°C thermally aged temperature.

From the experimental and simulated results, it is evident that the fuzzy-based developed algorithm can be used effectively to predict the IMCs size and mechanical properties of SAC305 at various aging temperatures, for the first time.