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The purpose of this paper is to develop a new composite solder to improve the reliability of composite solder joints. Nano-particles modified multi-walled carbon nanotubes (Ni-MWCNTs) can indeed improve the microstructure of composite solder joints and improve the reliability of solder joints. Although many people have conducted in-depth research on the composite solder of Ni-MWCNTs. However, no one has studied the performance of Ni-MWCNTs composite solder under different aging conditions. In this article, Ni-MWCNTs was added to Sn-Ag-Cu (SAC) solder, and the physical properties of composite solder, the microstructure and mechanical properties were evaluated.

In this study, the effect of different aging conditions on the intermetallic compound (IMC) layer growth and shear strength of Ni-modified MWCNTs reinforced SAC composite solder was studied. Compared with SAC307 solder alloy, the influence of Ni-MWCNTs with different contents (0, 0.1 and 0.2 Wt.%) on composite solder was examined. To study the aging characteristics of composite solder joints, the solder joints were aged at 80°C, 120°C and 150°C.

The experimental results show that the content of Ni-MWCNTs affects the morphology and growth of the IMC layer at the interface. The microhardness of the solder increases and the wetting angle decreases. After aging at moderate (120°C) and high temperature (150°C), the morphology of the Cu6Sn5 IMC layer changed from scallop to lamellar and the grain size became coarser. The following two different phase compositions were observed in the solder joints with Ni-MWCNTs reinforcement: Cu3Sn and (Cu, Ni)6Sn5. The fracture surface of the solder joints all appeared ductile dents, and the size of the pits increased significantly with the increase of the aging temperature. Through growth kinetic analysis, Ni-modified MWCNTs in composite solder joints can effectively inhibit the diffusion of atoms in solder joints. In short, when the addition amount of Ni-MWCNTs is 0.1 Wt.%, the solder joints exhibit the best wettability and the highest shear strength.

In this study, the effects of aging conditions on the growth and shear strength of the IMC layer of Ni modified MWCNTs reinforced SAC307 composite solder were studied. The effects of Ni MWCNTs with different contents (0, 0.1 and 0.2 Wt.%) on the composite solder were examined.

An overview has been presented on the topic of alternative surface finishes for package I/Os and circuit board features. Aspects of processability and solder joint reliability were described for the following coatings: baseline hot‐dipped, plated, and plated‐and‐fused 100Sn and Sn‐Pb coatings; Ni/Au; Pd, Ni/Pd, and Ni/Pd/Au finishes; and the recently marketed immersion Ag coatings. The Ni/Au coatings appear to provide the all‐around best options in terms of solderability protection and wire bondability. Nickel/Pd finishes offer a slightly reduced level of performance in these areas which is most likely due to variable Pd surface conditions. It is necessary to minimize dissolved Au or Pd contents in the solder material to prevent solder joint embrittlement. Ancillary aspects that include thickness measurement techniques; the importance of finish compatibility with conformal coatings and conductive adhesives; and the need for alternative finishes for the processing of non‐Pb bearing solders are discussed.

The purpose of this paper is to investigate the effects of Sn-Ag-x leveling layers on the mechanical properties of SnBi solder joints. Four Sn-Ag-x (Sn-3.0Ag-0.5Cu, Sn-0.3Ag-0.7Cu, Sn-0.3Ag-0.7Cu-0.5 Bi-0.05Ni and Sn-3.0Ag-3.0 Bi-3.0In) leveling layers were coated on Cu pads to prepare SnBi/Sn-Ag-x/Cu solder joints. The microstructure, hardness, shear strength and fracture morphology of solder joints before and after aging were studied.

The interfacial brittleness of the SnBi low-temperature solder joint is a key problem affecting its reliability. The purpose of this study is to improve the mechanical properties of the SnBi solder joint.

Owing to the addition of the leveling layers, the grain size of the ß-Sn phase in the SnBi/Sn-Ag-x/Cu solder joint is significantly larger than that in the SnBi/Cu eutectic solder joint. Meanwhile, the hardness of the solder bulk in the SnBi/Cu solder joint shows a decrease trend because of the addition of the leveling layers. The SnBi/Cu solder joint shows obvious strength drop and interfacial brittle fracture after aging. Through the addition of the Sn-Ag-x layers, the brittle failure caused by aging is effectively suppressed. In addition, the Sn-Ag-x leveling layers improve the shear strength of the SnBi/Cu solder joint after aging. Among them, the SnBi/SACBN/Cu solder joint shows the highest shear strength.

This work suppresses the interfacial brittleness of the SnBi/Cu solder joint after isothermal aging by adding Sn-Ag-x leveling layers on the Cu pads. It provides a way to improve the mechanical performances of the SnBi solder joint.

Composite solders were prepared by mechanically dispersing 15v% of Cu or Ag particles into the eutectic Sn‐3.5Ag solder. The average sizes for the nominally spherical Cu and Ag particles were 6 and 4 microns, respectively. Two different processing methods were used to prepare the composite solders: blending the powdered particles with solder paste, and adding particles to the molten solder at 2808C. The composite solders were characterised by studying the morphology, size and distribution of the reinforcing phase. Particular interest and emphasis are given towards the modifications of the reinforcements during the reflow process. Microstructural features and chemical analysis of the composite solders were studied using optical and scanning electron microscopy (SEM), and energy dispersive x‐ray (EDX) analysis. The effect of reflow and isothermal ageing on the microstructure as well as the morphological changes in the interfacial IM layer of the composite solders were extensively analysed. A mechanism for IM layer growth is proposed for solid state isothermal ageing.

The interfacial structure is vitally important for achieving a good joint reliability during service. The purpose of this paper is to systematically explore the effects of Zn addition into the Sn-3.5Ag eutectic solder on the formation of intermetallic compound (IMC) layer at the interface between Sn-3.5Ag-xZn (x = 0, 0.9 and 3) solders and Cu pad.

To obtain useful information on the formation of interfacial structure and to determine an effective way to avoid the formation of brittle joints, a series of Sn-Ag lead-free solders with different Zn contents were prepared and soldered. To investigate the IMC layers between Sn-3.5Ag-xZn (x = 0, 0.9 and 3) lead-free solders and the Cu pads, three specimens of the Sn-3.5Ag-xZn/Cu were soldered at 250°C for one min.

It is found that the addition of Zn in the Sn-3.5Ag eutectic solder can prompt the formation of Cu₅Zn₈ IMCs, and restrain the formation of the Cu₆Sn₅ IMCs. Moreover, the addition of Zn in the Sn-3.5Ag eutectic solder will reduce the solubility of Cu in the liquid solder, which accelerates the growth of the formed IMCs. Consequently, the thickness of IMC layer increases with increasing the content of Zn.

This paper usefully demonstrates how the addition of Zn favoured the formation of the Cu₅Zn₈ phase and restrained the formation of the Cu₆Sn₅ phase. Moreover, the addition of Zn in the Sn-Ag eutectic solder would reduce the solubility of Cu in the liquid solder, which accelerates the growth of the formed IMCs. Consequently, the thickness of the IMC layer increased with increasing concentration of Zn.

This paper aims to investigate the metallurgical reactions between two commercial AgPt thick films used as a solder land on a low temperature co‐fired ceramic (LTCC) module and solder materials (SnAgCu, SnInAgCu, and SnPbAg) in typical reflow conditions and to clarify the effect of excessive intermetallic compound (IMC) formation on the reliability of LTCC/printed wiring boards (PWB) assemblies.

Metallurgical reactions between liquid solders and AgPt metallizations of LTCC modules were investigated by increasing the number of reflow cycles with different peak temperatures. The microstructures of AgPt metallization/solder interfaces were analyzed using SEM/EDS investigation. In addition, a test LTCC module/PWB assembly with an excess IMC layer within the joints was fabricated and exposed to a temperature cycling test in a −40 to 125°C temperature range. The characteristic lifetime of the test assembly was determined using DC resistance measurements. The failure mechanism of the test assembly was verified using scanning acoustic microscopy and SEM investigation.

The results showed that the higher peak reflow temperature of common lead‐free solders had a significant effect on the consumption of the original AgPt metallization of LTCC modules. The results also suggested that the excess porosity of the metallization accelerated the degradation of the metallization layer. Finally, the impact of these adverse metallurgical effects on the actual failure mechanism in an LTCC/PWB assembly was demonstrated.

This paper proves how essential it is to know the actual LTCC metallization/solder interactions that occur during reflow soldering and to recognize their effect on solder joint reliability in LTCC module/PWB assemblies. Moreover, the adverse effect of using lead‐free solders on the degradation of Ag‐based metallizations and, consequently, on board level reliability is demonstrated. Finally, practical guidelines for selecting materials for second‐level solder interconnections of LTCC module are given.

This paper presents an application of the physics‐of‐failure design philosophy to flip‐chip bonds in a microelectronic package. The physics‐of‐failure philosophy utilises knowledge of the life‐cycle load profile, package architecture and material properties to identify potential failure mechanisms and to prevent operational failures through robust design and manufacturing practices. The potential failure mechanisms and failure sites are identified in this paper for flip‐chip bonds, and an approach is presented to prevent the identified potential failure mechanisms by design. Finally, quality conformance issues are discussed to ensure a robust manufacturing process and qualification issues are addressed to evaluate the reliability of the designed flip‐chip bond.

The reactions between Sn–Ag–Cu lead‐free solders of various compositions and Au/Ni surface finish in advanced electronic packages were studied. Three solder compositions, Sn–3.5Ag, Sn4Ag–0.5Cu, and Sn–3.5Ag‐0.75Cu were used, and their performance was compared. It was found that the Sn–4Ag–0.5Cu solder gave the worst results in terms of shear strength. The poor performance of the Sn–4Ag–0.5Cu solder can be explained based on its microstructure. The types of intermetallic compounds formed at the interface were different for different solder compositions. When there was no Cu the reaction product was Ni₃Sn₄. For the Sn–3.5Ag–0.75Cu solder, the reaction product was (Cu_1‐p‐qAu_pNi_q)₆Sn₅ immediately after reflow, and two intermetallic compounds (Cu_1‐p‐qAu_pNi_q)₆Sn₅ and (Ni_1‐yCu_y)₃Sn₄ formed after aging at 180°C for 250 and 500 h. For the Sn–4Ag–0.5Cu solder, both Ni₃Sn₄ and (Cu_1‐p‐qAu_pNi_q)₆Sn₅ were present near the interface right after reflow, and there was a layer of solder between these two intermetallic compounds.

This paper aims to present a machine learning framework for using big data analytics to predict the reliability of solder joints. The purpose of this study is to accurately predict the reliability of solder joints by using big data analytics.

A machine learning framework for using big data analytics is proposed to predict the reliability of solder joints accurately.

A machine learning framework for predicting the life of solder joints accurately has been developed in this study. To validate its accuracy and efficiency, it is applied to predict the long-term reliability of lead-free Sn96.5Ag3.0Cu0.5 (SAC305) for three commonly used surface finishes such OSP, ENIG and IAg. The obtained results show that the predicted failure based on the machine learning method is much more accurate than the Weibull method. In addition, solder ball/bump joint failure modes are identified based on various solder joint failures reported in the literature.

The ability to predict thermal fatigue life accurately is extremely valuable to the industry because it saves time and cost for product development and optimization.

The purpose of this paper is to study the effect of intermetallic compound (IMC) layer thickness on the shear strength of surface-mount component 1206 chip resistor solder joints.

To evaluate the shear strength and IMC thickness of the 1206 chip resistor solder joints, the test vehicles were conventionally reflowed for 480 seconds at a peak temperature of 240°C at different isothermal ageing times of 100, 200 and 300 hours. A cross-sectional study was conducted on the reflowed and aged 1206 chip resistor solder joints. The shear strength of the solder joints aged at 100, 200 and 300 hours was measured using a shear tester (Dage-4000PXY bond tester).

It was found that the growth of IMC layer thickness increases as the ageing time increases at a constant temperature of 175°C, which resulted in a reduction of solder joint strength due to its brittle nature. It was also found that the shear strength of the reflowed 1206 chip resistor solder joint was higher than the aged joints. Moreover, it was revealed that the shear strength of the 1206 resistor solder joints aged at 100, 200 and 300 hours was influenced by the ageing reaction times. The results also indicate that an increase in ageing time and temperature does not have much influence on the formation and growth of Kirkendall voids.

A proper correlation between shear strength and fracture mode is required.

The IMC thickness can be used to predict the shear strength of the component/printed circuit board pad solder joint.

The shear strength of the 1206 chip resistor solder joint is a function of ageing time and temperature (°C). Therefore, it is vital to consider the shear strength of the surface-mount chip component in high-temperature electronics.