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This study aims to investigate the effect of bismuth addition (up to 30 Wt%) on the microstructure and electrical conductivity of a commercial lead-free alloy (SAC405) near the solder/substrate soldered joint. The system under study is referred in this work as (SAC405 + xBi)/Cu, as Cu is the selected substrate in which the solder was casted. The electrical resistivity of this system was investigated, considering Bi addition effect on the local microstructure and chemical composition gradients within that zone.

Solder joints between Cu substrate and SAC405 alloy with different levels of Bi were produced. The electrical conductivity along the obtained solder/substrate interface was measured by four-point probe method. The microstructure and chemical compositions were evaluated by scanning electron microscopy/energy dispersive spectroscopy analysis.

Two different electrical resistivity zones were identified within the solder interface copper substrate/solder alloy. At the first zone (from intermetallic compound [IMC] until approximately 100 μm) the increase of the electrical resistivity is gradual from the substrate to the solder side. This is because of the copper substrate diffusion, which established a chemical composition gradient near the IMC layer. At the second zone, electrical resistivity becomes much higher and is mainly dependent on the Bi content of the solder alloy. In both identified zones, electrical resistivity is affected by its microstructure, which is dependent on Cu and Bi content and solidification characteristics.

A detailed characterization of the solder/substrate zone, in terms of electrical conductivity, was done with the definition of two variation zones. With this knowledge, a better definition of processing parameters and in-service soldered electronic devices behavior can be achieved.

The purpose of this paper is to find an optimum between the quantity of solder paste and the desired properties of the soldered joint. A reduction of solder paste quantity is recognized as an opportunity to save money. On the other hand, the quantity of solder paste significantly influences the final properties of the soldered joint. The purpose is also to design recommendations for manufacturers of electronic assemblies.

The processing of the paper was initiated by a literature review. The expert analysis was the next step. The result of analysis was a fishbone diagram. Subsequently, the experiment was designed. Seven types and three volume of solder pastes and two aperture shapes of the stencil were used. The measured parameters were mechanical strength, electrical resistance, voids area and intermetallic compound (IMC) thicknesses. The results of the experiment were evaluated and recommendations for practice were defined.

The carried out research has confirmed the influence of solder paste quantity on the shear strength, electrical resistance, voids area and IMC thickness of solder joint. The article presents the results achieved for solders Sn42Bi58, Sn42Bi57.6Ag0.4, SnAg3.0Cu0.5, SnCu0.7Ag1.0NiGe, SnAg3.5Bi0.5In8.0 and Sn62.5Pb36.5Ag1.0. Reduction of solder paste quantity down to 74 per cent (i.e. one quarter of quantity) decreases mechanical shear strength less than 10 per cent. Recommendations relating to the optimal reduction of solder paste quantity have been designed for each solder paste.

Contribution of the paper is impact assessment of solder paste quantity on the properties of the soldered joint. It was carried out a large number of experiments and measurements which verify this effect. Such a comprehensive overview of the results is not yet available in the literature. Recommendations for manufacturers of electronic assemblies are also the benefit of article.

The development of UV curing technology has introduced new solder masks which will replace the thermally‐cured masks of the past. In doing so, processing efficiency will be increased in terms of time, energy and space saving. In considering the effective use of the new technology, thought must be given to many factors which influence the optimum performance of UV cured solder masks. The thickness of deposit will most certainly be greatly influenced by the choice of screen fabric, mesh size and squeegee which will subsequently impact upon the rate and extent of cure. One must also prepare the substrate surface adequately to compensate for the minimal wet adhesion and dwell time of a solventless ink prior to cure. Other factors such as flux chemistry, solder temperature, and soldering conditions play an important part in the performance of a solder mask and are discussed in detail. This paper was originally presented at the First Printed Circuit World Convention held at the Cafe Royal, London, in June, 1978.

The purpose of this paper is to introduce a new class of surface finishes as an alternative to current final surface finishes.

This new finish utilises nanotechnology and is based on a new formulation of the “organic metal” (OM).

The final surface finish is an approximately 50 nm thin permanent layer, consisting of a complex between the OM and silver (Ag). Panels finished with OrmeSTAR™ Ultra show excellent solderability in spite of a low‐layer thickness and therefore offer significant advantages over existing surface finishes.

This new finish has proven to be a competitive alternative to current final finishes with excellent properties for soldering applications. The new nanotechnology can also significantly improve the environmental and economical consequences of solderable surface finishing.

Polyester connector strips were joined to polyimide substrates with anisotropic electrically conductive adhesives. Copper conductors as well as Au/Ni‐coated copper conductors were used on flexible circuits. The adhesives were composite materials consisting of heat curing, one‐component epoxy resin and powdered ternary solder alloys: tin‐bismuth‐zinc, tin‐indium‐zinc and tin‐zinc‐aluminium. An adhesive filled with eutectic tin‐bismuth alloy powder was used as reference. The effect of bonding parameters (e.g., temperature, dwell time and pressure) on contact resistance values was evaluated. The contact resistance values were measured for evaluating the reliability of adhesive joints during a 60°C/95%RH test. Furthermore, the joint microstructures were examined with optical and scanning electron microscopy. The results showed that with the copper conductors the initial contact resistance values were lower than with the Au/Ni‐coated copper conductors. The most reliable joints were produced with low melting filler alloys (with respect to bonding temperature) on bare copper metallisation. The most likely reason for failure of the Au/Ni‐coated circuits was strong oxidation of locally exposed nickel in the presence of moisture.

The introduction of surface mount technology has changed the approach which is needed for successful rework of components. This has been brought about by the requirement of simultaneous reflow of all joints to remove the component from the board. To meet this need, manual soldering methods have been adapted, and subsequently complemented, with dedicated hot bar, hot gas and infra‐red systems. Each of these techniques with their respective applicability is considered, prior to a discussion of the parameters which need to be addressed before embarking on successful rework. All aspects of component, board and the joint itself are considered. The procedure for addressing rework is then laid out, providing a standard methodology to obtain rework joints which maintain the quality of the production joints.

Tape automated bonding (TAB) circuits were joined by hot compression bonding to copper or nickel conductors on glass with two anisotropic electrically conductive adhesives. One of the adhesives had a thermoplastic polystyrene‐polyester matrix which contained easily deforming metal‐coated polymer particles, while the other was a thermosetting bisphenol (A) based epoxy resin filled with nickel particles. The resistance values and the mechanical strengths of the joints were measured before and after the ageing treatments. The thermoplastic adhesive had the lowest resistance values with copper conductors and the joints produced with this adhesive showed increasing strength values during the ageing tests. The joints between the Ni conductors had smaller values of electrical conductivity irrespective of the adhesive used. The SEM/EPMA technique revealed that particles of the thermoplastic adhesive tended to agglomerate. This may cause problems when components with very fine lead pitch are joined, either by short circuiting or leaving some contacts without particles.

The purpose of the paper is to focus on the research into components with specific thermal properties and their influences on the reflow soldering process.

After a brief introduction, the paper gives an overview of the necessity of thermal management on printed circuit boards (PCBs) and the possible effects on the manufacturing of electronic devices. In the next sections, different test boards are presented for investigations into different thermal effects during soldering. The last section deals with the influences of molded interconnected devices (MIDs) on the reflow soldering process.

The investigations show that components from the thermal management influence the reflow soldering process more or less. The highest impacts on the soldering process are from components with a thermal connection to the electrical component and its solder joint. All results from the investigations have in common that the thermal influence can only be compensated by increasing the temperature during soldering. However, this significantly increases the risk of overheating the electrical components or the PCB itself.

This paper shows only the influence of some of the effects caused by thermal management on the reflow soldering process. Furthermore, vapour phase soldering is not considered, but actual investigations are carried out on vapour phase soldering ovens as well.

Thermal management becomes more and more important with the increasing functionality of electrical components and electronic devices. This topic has been the subject of a large number of articles. However, this paper deals with influences that thermal management has on the soldering process during the manufacturing of the electronic device.

This paper aims to summarise the effects of ZnO nanoparticles (0.1, 0.3, 0.5, 0.7 and 1.0 Wt.%) on the structure, mechanical, electrical and thermal stability of Sn–3.5Ag–0.5Cu (SAC355) solder alloys for high-performance applications.

The phase identification and morphology of the solders were studied using X-ray diffraction and scanning electron microscopy. Thermal parameters were investigated using differential scanning calorimetry. The elastic parameters such as Young's modulus (E) and internal friction (Q⁻¹) were investigated using the dynamic resonance technique, whereas the Vickers hardness (Hv) and creep indentation (n) were examined using a Vickers microhardness tester.

Microstructural analysis revealed that ZnO nanoparticles (NPs) were distributed uniformly throughout the Sn matrix. Furthermore, addition of 0.1, 0.3 and 0.7 Wt.% of ZnO NPs to the eutectic (SAC355) prevented crystallite size reduction, which increased the strength of the solder alloy. Mechanical parameters such as Young's modulus improved significantly at 0.1, 0.3 and 0.7 Wt.% ZnO NP contents compared to the ZnO-free alloy. This variation can be understood by considering the plastic deformation. The Vickers hardness value (Hv) increased to its maximum as the ZnO NP content increased to 0.5. A stress exponent value (n) of approximately two in most composite solder alloys suggested that grain boundary sliding was the dominant mechanism in this system. The electrical resistance (ρ) increased its maximum value at 0.5 Wt.% ZnO NPs content. The addition of ZnO NPs to plain (SAC355) solder alloys increased the melting temperature (T_m) by a few degrees.

Development of eutectic (SAC355) lead-free solder doped with ZnO NPs use for electronic packaging.

The purpose of this paper is to assess the thermo-mechanical reliability of a solder bump with different underfills, with the evaluation of different underfill materials. As there is more demand in higher input/output, smaller package size and lower cost, a flip chip mounted at the module level of a board is considered. However, bonding large chips (die) to organic module means a larger differential thermal expansion mismatch between the module and the chip. To reduce the thermal stresses and strains at solder joints, a polymer underfill is added to fill the cavity between the chip and the module. This procedure has typically, at least, resulted in an increase of the thermal fatigue life by a factor of ten, as compared to the non-underfilled case. Yet, this particular case is to deal with a flip chip mounted on both sides of a printed circuit board (PCB) module symmetrically (solder bump interconnection with Cu-Pillar). Note that Cu-Pillar bumping is known to possess good electrical properties and better electromigration performance. The drawback is that the Cu-Pillar bump can introduce high stress due to the higher stiffness of Cu compared to the solder material.

As a reliability assessment, thermal cyclic loading condition was considered in this case. Thermal life prediction was conducted by using finite element analysis (FEA) and modified Darveaux’s model, considering microsize of the solder bump. In addition, thermo-mechanical properties of four different underfill materials were characterized, such as Young’s modulus at various temperatures, coefficient of temperature expansion and glass transition temperature. By implementing these properties into FEA, life prediction was accurately achieved and verified with experimental results.

The modified life prediction method was successfully adopted for the case of Cu-Pillar bump interconnection in flip chip on the module package. Using this method, four different underfill materials were evaluated in terms of material property and affection to the fatigue life. Both predicted life and experimental results are obtained.

This study introduces the technique to accurately predict thermal fatigue life for such a small scale of solder interconnection in a newly designed flip chip package. In addition, a guideline of underfill material selection was established by understanding its affection to thermo-mechanical reliability of this particular flip chip package structure.