Search results

This study aims to experimentally assess the effect of thickness and preparation direction on the damping properties of Sn58Bi and Sn3.0Ag0.5Cu solders.

Sn58Bi and Sn3.0Ag0.5Cu solder strips with different thicknesses were prepared from the bulk in longitudinal and horizontal directions, and the ratio of loss modulus and storage modulus of the samples was measured by the dynamic mechanical analysis method as the index of damping properties.

Sn58Bi and Sn3.0Ag0.5Cu solders exhibited viscoelastic relaxation, and their damping properties decreased with decreasing thickness. The damping properties of both solders had no obvious difference in longitudinal and horizontal directions. Sn58Bi has a more obvious high-temperature damping background than Sn3.0Ag0.5Cu solder. In addition, compared with Sn58Bi solder, Sn3.0Ag0.5Cu solder had an obvious internal friction peak, which moved toward high temperature with increasing frequency. The activation energies of Sn58Bi solder with a thickness of 0.5 mm at the longitudinal and horizontal directions were 0.84 and 0.67 eV, respectively, which were 0.39 and 0.53 eV, respectively, for the Sn3.0Ag0.5Cu solder.

The damping properties of Sn58Bi and Sn3.0Ag0.5Cu solder decreased with decreasing thickness, while their damping properties changed insignificantly when they were prepared from different directions. The internal friction peak of Sn3.0Ag0.5Cu solder moved to higher temperatures with increasing frequency.

The purpose of this paper is to compare the growth kinetics of interfacial intermetallic compound (IMC) layer and its effect on the tensile strength of two solder (Sn3.0Ag0.5Cu and Sn0.4Co0.7Cu) joints.

The samples annealed, respectively, at 85, 120 and 150°C up to 1,000 h were tensile tested and their cross‐sections were observed by scanning electron micrography.

The results showed that, for both solder joints, an approximately linear reduction in tensile joint strength with an increase in the IMC layers' thickness occurred. The tensile strength of Cu/Sn3.0Ag0.5Cu solder joints is slightly better than that of Cu/Sn‐0.7Co‐0.4Cu solder joints under analogous aging conditions. In addition, the growth kinetics of the overall interfacial IMC layer in Sn0.4Co0.7Cu solder joints can be simply described by the classical growth kinetic theory for solid‐state diffusion with an activation energy of 2,996.85 J/mol and interdiffusion constant of 4.15×0⁻¹⁷ m²/s which are relatively lower, compared with Sn3.0Ag0.5Cu solder on copper with 14,167.8 J/mol and 65.33×10⁻¹⁷ m²/s, respectively.

The paper is of value in evaluating the growth kinetics of Sn3.0Ag0.5Cu and Sn0.4Co0.7Cu solder joints, and in discussing and contrasting the influence of IMC growth on their tensile strength.

Laser soldering has attracted attention as an alternative soldering process for microsoldering due to its localized and noncontact heating, a rapid rise and fall in temperature, fluxless and easy automation compared to reflow soldering.

In this study, the metallurgical and mechanical properties of the Sn3.0Ag0.5Cu/Ni-P joints after laser and reflow soldering and isothermal aging were compared and analyzed.

In the as-soldered Sn3.0Ag0.5Cu/Ni-P joints, a small granular and loose (Cu,Ni)6Sn5 intermetallic compound (IMC) structure was formed by laser soldering regardless of the laser energy, and a long and needlelike (Cu,Ni)6Sn5 IMC structure was generated by reflow soldering. During aging at 150°C, the growth rate of the IMC layer was faster by laser soldering than by reflow soldering. The shear strength of as-soldered joints for reflow soldering was similar to that of laser soldering with 7.5 mJ, which sharply decreased from 0 to 100 h for both cases and then was maintained at a similar level with increasing aging time.

Laser soldering with certain energy is effective for reducing the thickness of IMCs, and ensuring the mechanical property of the joints was similar to reflow soldering.

The purpose of this work is to study the effect of the reflow peak temperature and time above liquidus on both SnPb and SnAgCu solder joint shear strength.

Nine reflow profiles for Sn3.0Ag0.5Cu and nine reflow profiles for Sn37Pb have been developed with three levels of peak temperature (230°C, 240°C, and 250°C for Sn3.0Ag0.5Cu; and 195°C, 205°C, and 215°C for Sn37Pb) and three levels of time above solder liquidus temperature (30, 60, and 90 s). The shear force data of four different sizes of chip resistors (1206, 0805, 0603, and 0402) are compared across the different profiles. The shear forces for the resistors were measured after assembly. The fracture interfaces were inspected using scanning electron microscopy with energy dispersive spectroscopy in order to determine the failure mode and failure surface morphology.

The results show that the effects of the peak temperature and the time above solder liquidus temperature are not consistent between different component sizes and between Sn37Pb and Sn3.0Ag0.5Cu solder. The shear force of SnPb solder joints is higher than that of Sn3.0Ag0.5Cu solder joints because the wetting of SnPb is better than that of SnAgCu.

This study finds that fracture occurred partially in the termination metallization and partially in the bulk solder joint. To eliminate the effect of the termination metallization, future research is recommended to conduct the same study on solder joints without component attachment.

The shear strength of both SnPb and SnAgCu solder joints is equal to or higher than that of the termination metallization for the components tested.

Fracture was observed to occur partially in the termination metallization (Ag layer) and partially in the bulk solder joint. Therefore, it is essential to inspect the fracture interfaces when comparing solder joint shear strength.

The purpose of this paper is to investigate microstructure and properties of Sn3.0Ag0.5Cu-XAl₂O₃ composite solder which were prepared through powder metallurgy route.

Sn3.0Ag0.5Cu (SAC305)-XAl₂O₃ (X = 0.2, 0.4, 0.6, 0.8 Wt. %) composite solders were prepared through the powder metallurgy route. The morphology of composite solder powders which consists of Al₂O₃ particles and SAC solder powders after ball milling was observed. The retained ratio of Al₂O₃ nanoparticles in composite solder billets and solder joints were also quantitatively measured. Furthermore, the as-prepared composite solder alloys were studied extensively with regard to their microstructures, thermal property, wettability and mechanical properties.

After ball milling, the Al₂O₃ nanoparticles added were observed embedded into the surface of SAC solder powders. Only about 5-10 per cent of the initial Al₂O₃ nanoparticles added were detected in the composite solder joints after reflow. In addition, finer ß-Sn grains were achieved with addition of Al₂O₃ nanoparticles; the Al₂O₃ nanoparticles were found retained in the composite solder matrix. Besides, negligible changes in melting temperature and the considerably reduced undercooling were obtained in composite solder alloys. Wettability was improved by appropriate addition of Al₂O₃ nanoparticles. Microhardness and shear strength of composite solders were both improved after Al₂O₃ nanoparticles addition.

This paper indicated that powder metallurgy route offered a feasible approach to produce nanoparticle reinforced composite solder. In addition, the quantitative analysis of the actual retained ratio of the Al₂O₃ nanoparticles in solder joints provided practical implications for the manufacture of composite solders.

The purpose of this study was to comparatively investigate interfacial intermetallic compounds (IMCs) in the Sn3.0Ag0.5Cu3.0Bi0.05Cr/Cu (SACBC/Cu) and Sn3.0Ag0.5Cu/Cu (SAC/Cu) solder joints, and to determine any differences.

The samples were annealed after isothermal ageing at 150°C for 0, 168 and 500 hours, and their cross-sections were observed by scanning electron microscopy and energy dispersive spectroscopy.

The interfacial IMC morphology in two joints had significant differences. For the Cu/SAC/Cu joints, the granular and short rod-like Ag3Sn particles attached on the surface and boundary of interfacial Cu6Sn5 grains were detected, and they coarsened observably with ageing time at 150°C, and lastly embedded at the grain boundaries. However, for the Cu/SACBC/Cu joints, there were tiny filamentous Ag3Sn growing on the surface of interfacial Cu6Sn5 grains, and the Ag3Sn had a tendency to break into nanoparticles, which would be distributed evenly and cover the IMC layer, profiting from the Bi and Cr precipitates from solder matrix during ageing.

The paper implies that the addition of Bi and Cr could affect the IMCs of joints, thereby delaying interfacial reactions between Sn and Cu atoms and improving the service reliability. The SACBC solder is a potential alloy for electronic packaging production.

The purpose of this study is to investigate the effect of electrical and thermal stresses on the void formation of the Sn3.0Ag0.5Cu (SAC305) lead-free ball grid array (BGA) solder joints and to propose a modified mean-time-to-failure (MTTF) equation when joints are subjected to coupling stress.

The samples of the BGA package were subjected to a migration test at different currents and temperatures. Voltage variation was recorded for analysis. Scanning electron microscope and electron back-scattered diffraction were applied to achieve the micromorphological observations. Additionally, the experimental and simulation results were combined to fit the modified model parameters.

Voids appeared at the corner of the cathode. The resistance of the daisy chain increased. Two stages of resistance variation were confirmed. The crystal lattice orientation rotated and became consistent and ordered. Electrical and thermal stresses had an impact on the void formation. As the current density and temperature increased, the void increased. The lifetime of the solder joint decreased as the electrical and thermal stresses increased. A modified MTTF model was proposed and its parameters were confirmed by theoretical derivation and test data fitting.

This study focuses on the effects of coupling stress on the void formation of the SAC305 BGA solder joint. The microstructure and macroscopic performance were studied to identify the effects of different stresses with the use of a variety of analytical methods. The modified MTTF model was constructed for application to SAC305 BGA solder joints. It was found suitable for larger current densities and larger influences of Joule heating and for the welding ball structure with current crowding.

The purpose of this study is to develop a monolayer surface coating of stearic acid on Sn-Ag-Cu solder powder to limit oxidation.

Stearic acid was adsorbed onto Sn-Ag-Cu solder powder through liquid-phase adsorption. The isotherm of adsorption was measured and then the microstructure of coated powder was characterized by scanning electron microscopy, transmission electron microscopy, X-ray photoelectron spectroscopy and Fourier-transform infrared spectroscopy.

The adsorption isotherm of stearic acid on the powder was “H” type, which revealed the layer-by-layer adsorption on non-porous surface. When the concentration of solution was in the range of 0.001-0.006 mol/L, with an adsorption amount of 0.12 ± 0.1 mg/g, monolayer stearic acid covered the solder powder completely. Uniform and integrated self-assembled monolayer coating was formed through hydrogen bonds between the oxygen ions in surface lattice of Sn3.0Ag0.5Cu solder powder and the —O—H hydroxyl group of stearic acid. The maximum angle of stability of coated powder also reduced by 2.87° compared with that of non-coated powder. The increase rate of oxygen content of coated powder was much slower than that of non-coated powder when they were exposed to humid air.

As a result, oxidation of fine solder powder was effectively limited. Essentially, this method can also be applied to the coating of other types of solder powder and has reference significance to other coating by liquid-phase method.

The transferred carbon nanofibers (CNFs) can be applied in flip chip package as interconnect material, as an alternative to the conventional solder and conductive adhesive (CA) materials.

The structure of CNFs was confirmed by transmission electron microscopy (TEM). The electrical performance of the vertically aligned carbon nanofibers (VACNFs) joint was measured by four points probe method and compared to conventional lead‐free solder Sn3.0Ag0.5Cu, pure indium and silver CA. A shear test was carried out in order to evaluate the mechanical performance of VACNFs joint. After the shear test, the fracture surface was analyzed by scanning electron microscopy and energy dispersive spectroscopy (SEM‐EDS).

The results showed a high success rate in the transfer of VACNFs from growth chip to target chip. The Au‐coated CNF can be wetted well with melted indium during the transfer and bonding process. In‐Au intermetallic compound (IMC) formed on the surface of CNF. The electrical and mechanical performance of VACNFs is comparable to that of the traditional interconnect materials. The fracture surface is located at the interface between VACNFs and chips. The stacked‐cone structure of CNF can be confirmed from a cross‐section of the break CNF by TEM.

Ultra‐short VACNFs were grown and first successfully transferred to the target chip using a process which required little pressure, low temperature and short time.

The purpose of this paper is to investigate the effects of reflow time, reflow peak temperature, thermal shock and thermal aging on the intermetallic compound (IMC) thickness for Sn3.0Ag0.5Cu (SAC305) soldered joints.

A four‐factor factorial design with three replications is selected in the experiment. The input variables are the peak temperature, the duration of time above solder liquidus temperature (TAL), solder alloy and thermal shock. The peak temperature has three levels, 12, 22 and 32°C above solder liquidus temperatures (or 230, 240 and 250°C for SAC305 and 195, 205, and 215°C for SnPb). The TAL has two levels, 30 and 90 s. The thermally shocked test vehicles are subjected to air‐to‐air thermal shock conditioning from −40 to 125°C with 30 min dwell times (or 1 h/cycle) for 500 cycles. Samples both from the initial time zero and after thermal shock are cross‐sectioned. The IMC thickness is measured using scanning electron microscopy. Statistical analyses are conducted to compare the difference in IMC thickness growth between SAC305 solder joints and SnPb solder joints, and the difference in IMC thickness growth between after thermal shock and after thermal aging.

The IMC thickness increases with higher reflow peak temperature and longer time above liquidus. The IMC layer of SAC305 soldered joints is statistically significantly thicker than that of SnPb soldered joints when reflowed at comparable peak temperatures above liquidus and the same time above liquidus. Thermal conditioning leads to a smoother and thicker IMC layer. Thermal shock contributes to IMC growth merely through high‐temperature conditioning. The IMC thickness increases in SAC305 soldered joints after thermal shock or thermal aging are generally in agreement with prediction models such as that proposed by Hwang.

It is still unknown which thickness of IMC layer could result in damage to the solder.

The IMC thickness of all samples is below 3 μm for both SnPb and SAC305 solder joints reflowed at the peak temperature ranging from 12 to 32°C above liquidus temperature and at times above liquidus ranging from 30 to 90 s. The IMC thickness is below 4 μm after subjecting to air‐to‐air thermal shock from −40 to 125°C with 30 min dwell time for 500 cycles or thermal aging at 125°C for 250 h.

The paper reports experimental results of IMC thickness at different thermal conditions. The application is useful for understanding the thickness growth of the IMC layer at various thermal conditions.