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Article
Publication date: 1 April 2000

Jarmo Määttänen, Petteri Palm and Aulis Tuominen

To achieve good reliability and high performance flip chip interconnection, process parameters and materials used in the flip chip process must be optimised. In this paper…

Abstract

To achieve good reliability and high performance flip chip interconnection, process parameters and materials used in the flip chip process must be optimised. In this paper reliability of Sn37Pb solder bumped flip chips on an FR5 board, using different fluxes and underfill materials, are tested in a temperature cycling test. Also the contact pad geometry used on the FR5 board had a great influence on the reliability of the joint. The solder bumps were grown on the well‐known TiW/Au under bump metallurgy (UBM1) with an extra layer of nickel (UBM2) which gives a reliable and high performance solder joint.

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Microelectronics International, vol. 17 no. 1
Type: Research Article
ISSN: 1356-5362

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Article
Publication date: 1 December 2001

Petteri Palm, Jarmo Määttänen, Alain Picault and Yannick De Maquillé

This paper presents the results from the evaluation of different types of flexible substrates for high‐density flip chip application. In this work two different types of…

Abstract

This paper presents the results from the evaluation of different types of flexible substrates for high‐density flip chip application. In this work two different types of base materials were used, epoxiglass (EG) and polyimide (PI). According to previous tests the type of conductive particles in the adhesive seems to be one of the key factors in high‐density interconnections. The adhesive selected for these tests was a composite of epoxy matrix and high content of isolated soft metal‐coated polymer particles. Two different test structures with contact areas of 50 × 50μm and 50 × 90μm were compared. The total amount of contacts in one IC was approximately 200 and the effective pitch size was 80μm. The contact resistances were measured by four‐point method and the continuity by daisy chain structure. The reliability of the flip chip interconnections was tested in thermal cycling and humidity tests.

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Microelectronics International, vol. 18 no. 3
Type: Research Article
ISSN: 1356-5362

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Article
Publication date: 1 December 1999

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Microelectronics International, vol. 16 no. 3
Type: Research Article
ISSN: 1356-5362

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Article
Publication date: 1 August 2001

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Microelectronics International, vol. 18 no. 2
Type: Research Article
ISSN: 1356-5362

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